Physical unclonable function (PUF) security key generation
Systems and methods of generating a security key for an integrated circuit device include generating a plurality of key bits with a physically unclonable function (PUF) generator. Unstable bits of the plurality of key bits are identified, and a security key is generated based on the plurality of key bits, wherein the security key excludes the identified unstable bits.
1. A method, comprising:
providing a plurality of memory cells;
receiving a challenge address;
generating a first occurrence of a security key under a first test condition in response to receiving the challenge address, the security key including a plurality of key bits;
generating a second occurrence of the security key under the first test condition;
comparing the key bits of the first and second occurrences of the security key to identify an unstable bit; and
excluding the unstable key bit from the security key.
2. The method of claim 1 , further comprising:
generating a third occurrence of the security key under a second test condition;
generating a fourth occurrence of the security key under the second test condition; and
comparing the key bits of the third and fourth occurrences of the security key.
3. The method of claim 1 , further comprising storing the unstable key bit in a memory.
4. The method of claim 3 , wherein the memory does not store stable key bits.
5. The method of claim 3 , wherein the memory is located on an integrated circuit device that includes the plurality of memory cells.
6. The method of claim 3 , wherein the memory is located external to an integrated circuit device that includes the plurality of memory cells.
7. The method of claim 1 , wherein the generating the security key includes writing a predetermined data bit to each of the memory cells, and comparing read speeds of the two of the plurality of memory cells to each other.
8. The method of claim 1 , further comprising:
generating a plurality of security keys that includes the security key;
determining a plurality of challenge addresses corresponding to the plurality of security keys; and
storing the plurality of security keys and associated challenge addresses in a database.
9. A device, comprising a PUF generator configured to:
compare access speeds of a plurality of memory cells to each other;
generate a plurality of key bits based on the comparisons;
identify at least one unstable bit of the plurality of key bits;
generate a security key based on the plurality of key bits, wherein the security key excludes the at least one unstable bit; and
store the unstable bit in a memory.
10. The device of claim 9 , wherein:
the plurality of memory cells includes a first memory cell and a second memory cell;
the PUF generator is configured to compare an access speed of the first memory cell to an access speed of the second memory cell, and generate a key bit based on the comparison.
11. The device of claim 9 , further comprising a controller configured to generate a security key in response to receiving a challenge, wherein generating the security key includes accessing the memory and excluding the unstable bits from the security key.
12. The device of claim 9 , wherein the memory cells are SRAM memory cells.
13. The device of claim 11 , wherein the security key further includes an error correction code.
14. The device of claim 13 , wherein the challenge includes a security key address and an error correction code bit.
15. The device of claim 9 , wherein the memory comprises a nonvolatile memory.
16. A system for generating an integrated circuit device security key, comprising:
a PUF generator configured to output a plurality of key bits, including a first occurrence of a first key bit and a second occurrence of the first key bit; and
a processor configured to compare the first and second occurrences of the first key bit to identify an unstable key bit and store the identified unstable key bit in a memory, wherein the memory does not store stable key bits.
17. The system of claim 16 , wherein the memory is a second memory, and wherein a first memory stores the first occurrence of a first key bit.
18. The system of claim 17 , wherein the second memory is external to the integrated circuit device.
19. The system of claim 16 , wherein the PUF generator includes a plurality of memory cells, and wherein the PUF generator is configured to compare access speeds of two of the plurality of memory cells to each other.
20. The system of claim 19 , wherein the memory cells are SRAM memory cells.