IP Library › Granted Patent US 10,971,305
Granted Patent B2
US 10,971,305 · App. 16/666,177 · Granted Apr 6, 2021

Method for manufacturing ceramic electronic component and ceramic electronic component

Inventors: Masaki Tsutsumi (Nagaokakyo, JP); Tatsuo Kunishi (Nagaokakyo, JP)
Assignee: Murata Manufacturing Co., Ltd.
H01G4/232C25D5/54H01G4/1227H01G4/30
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Quick Facts
Patent No.
US 10,971,305
App. No.
16/666,177
Granted
Apr 6, 2021
Kind
B2
Abstract

A method for manufacturing a ceramic electronic component in which a plated electrode can be formed in a region of the surface of a ceramic base body formed of a titanium-containing metal oxide. The method includes preparing a ceramic base body containing a titanium-containing metal oxide, forming a low-resistance section by modifying the metal oxide through irradiation of part of a surface layer portion of the ceramic base body with a pulse laser with a peak power density of 1×10 6 W/cm 2 to 1×10 9 W/cm 2 and a frequency of 500 kHz or less, and forming an electrode on the low-resistance section by electroplating. The laser irradiation generates an O defect in a titanium-containing metal oxide, such as BaTiO 3 to form an n-type semiconductor. Since this semiconductor section has a lower resistance value than the metal oxide, plating metal can be selectively deposited by electroplating.

Claims (70)

1. A method for manufacturing a ceramic electronic component, the method comprising:

preparing a ceramic base body containing a titanium-containing metal oxide;

forming a low-resistance section by modifying the metal oxide through irradiation of part of a surface layer portion of the ceramic base body with a pulse laser; and

forming an electrode on the low-resistance section by electroplating,

wherein the irradiation with the pulse laser is performed with a peak power density of 1×10 6 W/cm 2 to 1×10 9 W/cm 2 and a frequency of 500 kHz or less.

2. The method for manufacturing a ceramic electronic component according to claim 1 , wherein the metal oxide is formed into an n-type semiconductor in the low-resistance section.

3. The method for manufacturing a ceramic electronic component according to claim 1 , wherein

the irradiation with the pulse laser is performed with a peak power density of 1×10 6 W/cm 2 to 1×10 8 W/cm 2 and a frequency of 10 kHz to 100 kHz.

4. The method for manufacturing a ceramic electronic component according to claim 1 , wherein the ceramic base body contains BaTiO 3 .

5. The method for manufacturing a ceramic electronic component according to claim 1 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

6. The method for manufacturing a ceramic electronic component according to claim 2 , wherein

the irradiation with the pulse laser is performed with a peak power density of 1×10 6 W/cm 2 to 1×10 8 W/cm 2 and a frequency of 10 kHz to 100 kHz.

7. The method for manufacturing a ceramic electronic component according to claim 2 , wherein the ceramic base body contains BaTiO 3 .

8. The method for manufacturing a ceramic electronic component according to claim 3 , wherein the ceramic base body contains BaTiO 3 .

9. The method for manufacturing a ceramic electronic component according to claim 6 , wherein the ceramic base body contains BaTiO 3 .

10. The method for manufacturing a ceramic electronic component according to claim 2 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

11. The method for manufacturing a ceramic electronic component according to claim 3 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

12. The method for manufacturing a ceramic electronic component according to claim 4 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

13. The method for manufacturing a ceramic electronic component according to claim 6 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

14. The method for manufacturing a ceramic electronic component according to claim 7 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

15. The method for manufacturing a ceramic electronic component according to claim 8 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

16. The method for manufacturing a ceramic electronic component according to claim 9 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

17. A ceramic electronic component comprising:

a ceramic base body containing a titanium-containing metal oxide;

a low-resistance section formed in part of a surface layer portion of the ceramic base body and obtained by modifying the metal oxide; and

an electrode formed on the low-resistance section and made of a plating metal,

wherein the metal oxide is formed into an n-type semiconductor in the low-resistance section.

18. The ceramic electronic component according to claim 17 , wherein the ceramic base body contains BaTiO 3 .

19. The ceramic electronic component according to according to claim 17 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode made of a plating metal is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

20. The ceramic electronic component according to according to claim 18 , wherein

the ceramic electronic component is a multilayer ceramic capacitor;

a plurality of end portions of inner electrodes is exposed on each of both end surfaces of the ceramic electronic component;

the low-resistance section is formed in at least one side surface adjacent to the both end surfaces of the ceramic electronic component in such a manner that the low-resistance section is formed in each of portions of the side surface that adjoin the respective end surfaces; and

the electrode made of a plating metal is continuously formed on each end surface and each low-resistance section of the ceramic electronic component.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2019
From: TSUTSUMI, MASAKI; KUNISHI, TATSUO
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 050846/0807 →
Priority Claims (1)
JP JP2017-107346 · May 31, 2017 · national
Continuity (2)
Continuation PCTJP2018003751 · Feb 5, 2018
Related Publication 20200066449A1 · Feb 27, 2020
Cited By (1)
US 12,374,493