Semiconductor device and method of manufacture
A semiconductor device includes a conductive line and a conductive via contacting the conductive line. A first dielectric material contacts a first sidewall surface of the conductive via. A second dielectric material contacts a second sidewall surface of the conductive via. The first dielectric material includes a first material composition, and the second dielectric material includes a second material composition different than the first material composition.
1. A semiconductor device, comprising:
a conductive line;
a conductive via over and contacting the conductive line;
a first dielectric material contacting a first sidewall surface of the conductive via; and
a second dielectric material contacting a second sidewall surface of the conductive via, wherein the first dielectric material comprises a first material composition, and the second dielectric material comprises a second material composition different than the first material composition.
2. The semiconductor device of claim 1 , wherein the second dielectric material is positioned between the second sidewall surface and a first dielectric layer comprising the first dielectric material.
3. The semiconductor device of claim 2 , wherein the first dielectric layer overlies the conductive line.
4. The semiconductor device of claim 2 , comprising:
an etch stop material positioned between the second dielectric material and the first dielectric layer.
5. The semiconductor device of claim 4 , wherein the first dielectric layer contacts a first portion of an upper surface of the conductive line and the etch stop material contacts a second portion of the upper surface of the conductive line.
6. The semiconductor device of claim 5 , comprising:
a second dielectric layer positioned laterally adjacent the conductive line,
wherein the first portion of the upper surface of the conductive line is positioned at a first height, and the second portion of the upper surface of the conductive line is positioned at a second height lower than the first height.
7. The semiconductor device of claim 6 , wherein the first portion of the upper surface of the conductive line is coplanar with an upper surface of the second dielectric layer.
8. The semiconductor device of claim 1 , wherein the first sidewall surface of the conductive via contacts a sidewall surface of the conductive line.
9. A semiconductor device, comprising:
a first dielectric material;
an etch stop material;
a second dielectric material different than the first dielectric material, wherein the etch stop material is between the first dielectric material and the second dielectric material; and
a conductive via, wherein the second dielectric material is between the etch stop material and the conductive via.
10. The semiconductor device of claim 9 , wherein:
a first portion of the etch stop material is in contact with the conductive via, and
a second portion of the etch stop material is separated from the conductive via by the second dielectric material.
11. The semiconductor device of claim 9 , comprising:
a conductive line underlying the conductive via, the second dielectric material, the etch stop material, and the first dielectric material.
12. The semiconductor device of claim 9 , comprising:
a conductive line, wherein a first sidewall of the conductive line is in contact with a first sidewall of the conductive via.
13. The semiconductor device of claim 12 , wherein a second sidewall of the conductive line is in contact with a sidewall of the etch stop material.
14. The semiconductor device of claim 9 , comprising:
a conductive line, wherein a top surface of the conductive line is in contact with the etch stop material and the conductive via.
15. The semiconductor device of claim 9 , comprising:
a conductive line, wherein the conductive line, the etch stop material, and the conductive via are laterally co-planar.
16. A semiconductor device, comprising:
a conductive line,
an etch stop material, and
a conductive via, wherein:
a first sidewall of the conductive line is spaced apart from the conductive via by the etch stop material, and
a second sidewall of the conductive line is not spaced apart from the conductive via by the etch stop material.
17. The semiconductor device of claim 16 , wherein the second sidewall of the conductive line is in contact with a sidewall of the conductive via.
18. The semiconductor device of claim 16 , comprising:
a dielectric material overlying the etch stop material and between a first sidewall of the etch stop material and a sidewall of the conductive via.
19. The semiconductor device of claim 18 , wherein a second sidewall of the etch stop material is in contact with the sidewall of the conductive via.
20. The semiconductor device of claim 16 , comprising:
a first dielectric material, and
a second dielectric material different than the first dielectric material and separated from the first dielectric material by the etch stop material.