Probe for pic die with related test assembly and method

1. A probe structured for electrical and photonics testing of a photonic integrated circuit (PIC) die, the probe comprising:

a membrane having a first surface configured to face the PIC die, an opposing second surface, and including conductive traces, the membrane being configured for mechanical and electrical coupling to a probe interface board (PIB) including electrical contact pads on the first surface arranged to engage corresponding electrical contact pads on the PIB to establish electrical communication when engaged such that the PIB electrical contact pads on the PIB support the membrane;

a set of probe tips positioned on the membrane, the set of probe tips being configured to send electrical test signals to the PIC die or receive electrical test signals from the PIC die;

a probe body having at least portions thereof mechanically coupled to the second surface of the membrane; and

a photonic test assembly disposed on the membrane and electrically coupled to the conductive traces of the membrane, the photonic test assembly positioned for substantial alignment with a photonic I/O element of the PIC die, wherein the photonic test assembly includes at least one of:

a photonic emitter housed within the probe body and with which the photonic test assembly is configured to transmit a photonic input signal to the photonic I/O element; and

a photonic receiver housed within the probe body and with which the photonic test assembly is configured to detect a photonic output signal from the photonic I/O element.

2. The probe of claim 1 , wherein the membrane includes at least one opening extending between the first surface and the second surface and positioned vertically beneath the photonic test assembly.

3. The probe of claim 1 , wherein one of the photonic emitter or photonic receiver is substantially vertically aligned with an optical grating coupler included within the photonic I/O element.

4. The probe of claim 1 , wherein the at least one of the photonic emitter and the photonic receiver is coupled to the conductive traces of the membrane and positioned for substantial alignment with a respective photonic I/O element of the PIC die.

5. The probe of claim 1 , wherein a horizontal separation between the set of probe tips and the photonic test assembly is substantially equal to a horizontal separation distance between the set of electrical contacts of the PIC die and the photonic I/O element of the PIC die.

6. The probe of claim 1 , further comprising at least one solder pad electrically coupling the membrane to the photonic test assembly.

7. The probe of claim 1 , wherein the photonic test assembly photonic emitter includes one of a laser diode or a reference transmitter assembly.

8. The probe of claim 1 , wherein the photonic test assembly photonic receiver includes one of a photodiode or a reference receiver assembly.

9. A test assembly for a photonic integrated circuit (PIC) die, the probe assembly comprising:

a probe including:

a membrane having a first surface and an opposing second surface, the membrane including conductive traces,

a set of probe tips positioned on the first surface of the membrane and electrically coupled to an electrical contact pad through the conductive traces of the membrane, the set of probe tips being configured to send and receive electrical test signals through a set of electrical contacts on the PIC die,

a probe body, at least portions of which are mechanically coupled to the second surface of the membrane,

a photonic emitter disposed on the second surface of the membrane, housed within the probe body, and electrically coupled to the electrical contact pad through the conductive traces of the membrane, the photonic emitter positioned for substantial alignment with a photonic I/O element of the PIC die, wherein the photonic emitter is configured to transmit a photonic input signal into the photonic I/O element of the PIC die, and

a photonic receiver disposed on the second surface of the membrane, housed within the probe body, and electrically coupled to the electrical contact pads through the conductive traces of the membrane, the photonic receiver being positioned for substantial alignment with the photonic I/O element of the PIC die, wherein the photonic receiver is configured to detect a photonic output signal from the photonic I/O element of the PIC die; and

a probe interface board (PIB) electrically coupled to the membrane through a set of electrical contact pads, wherein the PIB selectively applies a test signal to the probe to deliver power to each of the set of probe tips, the photonic emitter, and the photonic receiver, wherein the electrical contact pads of the PIB are arranged to engage corresponding electrical contact pads formed on the first surface of the membrane such that the electrical contact pads of the PIB are arranged to support the membrane in addition to establishing electrical connections thereto.

10. The test assembly of claim 9 , wherein a horizontal separation on the probe between the set of probe tips and one of the photonic emitter or the photonic receiver is substantially equal to a horizontal separation distance between the set of electrical contacts of the PIC die and the photonic I/O element of the PIC die.

11. The test assembly of claim 9 , wherein the membrane of the probe includes at least one opening extending between the first surface and the second surface and positioned vertically beneath at least one of the photonic emitter or the photonic receiver.

12. The test assembly of claim 9 , wherein the photonic emitter or the photonic receiver is substantially vertically aligned with an optical grating coupler included within the photonic I/O element.

13. The test assembly of claim 9 , wherein the membrane includes a substantially transparent or a substantially translucent material.

14. The test assembly of claim 9 , wherein the photonic emitter comprises one of a laser diode or a reference transmitter assembly, and wherein the photonic receiver comprises one of a photodiode or a reference receiver assembly.

15. A method for testing a photonic integrated circuit (PIC) die, the method comprising:

coupling a probe to the PIC die, wherein the probe includes:

a membrane having a first surface arranged to face the PIC die and an opposing second surface, the membrane including conductive traces,

a set of electrical contact pads on the first surface of the membrane for electrically coupling the membrane to a corresponding set of electrical contact pads on the probe interface board (PIB) the electrical contacts of the PIB thereby mechanically supporting the membrane when the electrical contact pads of the membrane engage the electrical contact pads of the PIB,

a set of probe tips positioned on the first surface of the membrane and electrically coupled to the electrical contact pad through the conductive traces of the membrane, the set of probe tips being configured to send and receive electrical test signals through a set of electrical contacts on the PIC die,

a probe body, at least portions of which are mechanically coupled to the second surface of the membrane,

a photonic emitter disposed on the second surface of the membrane, housed within the probe body, and electrically coupled to the electrical contact pad through the conductive traces of the membrane, the photonic emitter positioned for substantial alignment with a photonic I/O element of the PIC die, wherein the photonic emitter is configured to transmit a photonic input signal into the photonic I/O element of the PIC die, and

a photonic receiver disposed on the second surface of the membrane, housed within the probe body, and electrically coupled to the electrical contact pads through the conductive traces of the membrane, the photonic receiver being positioned for substantial alignment with the photonic I/O element of the PIC die, wherein the photonic receiver is configured to detect a photonic output signal from the photonic I/O element of the PIC die;

applying a voltage to the set of electrical contact pads of the probe to transmit a test signal to the set of probe tips, and cause the photonic emitter to transmit the photonic input signal to the photonic I/O element of the PIC die; and

detecting the photonic output signal from the photonic I/O element of the PIC die with the photonic receiver.

16. The method of claim 15 , wherein coupling the probe to the PIC die substantially aligns the photonic emitter and the photonic receiver of the probe with the photonic I/O element of the PIC die.

17. The method of claim 15 , wherein the photonic input signal transmitted from the photonic emitter passes through at least one opening extending between the first surface and the second surface of the membrane, the at least one opening being substantially vertically aligned with the photonic emitter.

18. The method of claim 15 , wherein the photonic output signal detected by the photonic receiver passes through at least one opening extending between the first surface and the second surface of the membrane, the at least one opening being substantially vertically aligned with the photonic receiver.

19. The method of claim 15 , further comprising wherein transmitting the photonic input signal includes transmitting the photonic input signal to an optical grating coupler of the photonic I/O element of the PIC die.