Method and apparatus for cleaning process monitoring
A cleaning process monitoring system, comprising: a cleaning container comprising an inlet for receiving a cleaning solution and an outlet for draining a waste solution; a particle detector coupled to the outlet and configured to measure a plurality of particle parameters associated with the waste solution so as to provide a real-time monitoring of the cleaning process; a pump coupled to the cleaning container and configured to provide suction force to draw solution through the cleaning system; a controller coupled to the pump and the particle detector and configured to receive the plurality of particle parameters from the particle detector and to provide control to the cleaning system; and a host computer coupled to the controller and configured to provide at least one control parameter to the controller.
1. A method for cleaning process monitoring, comprising:
performing a chemical-mechanical planarization (CMP) process on a surface of a first substrate, wherein the CMP process utilizes a chemical slurry and mechanical polishing to remove materials from the surface of the first substrate;
pre-cleaning the surface using deionized water;
after the pre-cleaning, cleaning the surface of the first substrate in a cleaning container with a cleaning solution, wherein the cleaning solution is received in an inlet and drained through an outlet;
detecting a plurality of particle parameters in the cleaning solution in the outlet;
comparing the plurality of particle parameters to a pre-defined end point value; and
reconfiguring the cleaning process based on a result from the comparing.
2. The method of claim 1 , wherein the comparing is performed by a controller.
3. The method of claim 2 , wherein the controller is further configured to:
receive the plurality of particle parameters from the particle detector;
configure a flow rate of the waste solution out of the outlet and a flow rate of the cleaning solution into the inlet; and
transmit the plurality of particle parameters to a host computer for display.
4. The method of claim 1 , wherein the detecting is performed by at least one particle detector.
5. The method of claim 4 , wherein the at least one particle detector comprises at least one of the following detectors: optical detector, aerosol detector, liquid detector, solid detector, and laser detector.
6. The method of claim 1 , wherein the plurality of particle parameters comprise particle size and particle concentration as a function of cleaning time.
7. The method of claim 1 , wherein the pre-defined end point value equals to 10000 particles per milliliter in the waste solution.
8. The method of claim 4 , wherein the pre-defined end point value is configured based on size of particles.
9. The method of claim 1 , wherein the reconfiguring comprises one of the following:
terminating the cleaning process when the plurality of particle parameters are determined equal to or less than the pre-defined end point value, and continuing the cleaning process when the plurality of particle parameters are determined greater than the pre-defined end point value.
10. A method for cleaning process monitoring, comprising:
performing a chemical-mechanical planarization (CMP) process on a surface of a first substrate, wherein the CMP process utilizes a chemical slurry and mechanical polishing to remove materials from the surface of the first substrate;
pre-cleaning the surface using deionized water;
after the pre-cleaning, megasonically cleaning the surface of the first substrate in a liquid medium within a cleaning container, wherein the liquid medium is received in an inlet and drained through an outlet;
detecting a plurality of particle parameters in the liquid medium in the outlet;
comparing the plurality of particle parameters to a pre-defined end point value; and
reconfiguring the cleaning process based on a result from the comparing.
11. The method of claim 10 , wherein the comparing is performed by a controller.
12. The method of claim 10 , wherein the detecting is performed by at least one particle detector.
13. The method of claim 12 , wherein the at least one particle detector comprises at least one of the following detectors: optical detector, aerosol detector, liquid detector, solid detector, and laser detector.
14. The method of claim 10 , wherein the plurality of particle parameters comprise particle size and particle concentration as a function of cleaning time.
15. The method of claim 10 , wherein the pre-defined end point value equals to 10000 particles per milliliter in the waste solution.
16. The method of claim 10 , wherein the pre-defined end point value is configured based on size of particles.
17. The method of claim 1 , wherein the reconfiguring comprises one of the following:
terminating the cleaning process when the plurality of particle parameters are determined equal to or less than the pre-defined end point value, and continuing the cleaning process when the plurality of particle parameters are determined greater than the pre-defined end point value.
18. A method for a cleaning process monitoring, comprising:
performing a chemical-mechanical planarization (CMP) process on a surface of a first substrate, wherein the CMP process utilizes a chemical slurry and mechanical polishing to remove materials from the surface of the first substrate;
pre-cleaning the surface using deionized water;
after the pre-cleaning, brush scrubbing the surface of the first substrate in a cleaning container with a cleaning solution, wherein the cleaning solution is received in an inlet and drained through an outlet;
detecting a plurality of particle parameters in the cleaning solution in the outlet;
comparing the plurality of particle parameters to a pre-defined end point value; and
terminating the cleaning process when the plurality of particle parameters are determined equal to or less than the pre-defined end point value, and continuing the cleaning process when the plurality of particle parameters are determined greater than the pre-defined end point value.
19. The method of claim 18 wherein the detecting is performed by at least one particle detector.
20. The method of claim 19 , wherein the at least one particle detector comprises at least one of the following detectors: optical detector, aerosol detector, liquid detector, solid detector, and laser detector.
21. The method of claim 18 , wherein the plurality of particle parameters comprise particle size and particle concentration as a function of cleaning time.
22. The method of claim 18 , wherein the pre-defined end point value equals to 10000 particles per milliliter in the waste solution, the 10000 particles meeting a pre-defined size criteria.