IP Library Granted Patent US 11,018,001
Granted Patent B2
US 11,018,001 · App. 16/922,330 · Granted May 25, 2021

Method of growing two-dimensional transition metal dichalcogenide thin film and method of manufacturing device including the same

Inventors: Haeryong Kim (Seongnam-si, KR); Hyeonjin Shin (Suwon-si, KR); Jaeho Lee (Seoul, KR); Sanghyun Jo (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L21/02568H01L21/0262H01L21/02485H01L29/66969H01L29/778H01L29/786H01L21/0242H01L21/02376H01L21/02381H01L21/02422H01L29/24
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,018,001
App. No.
16/922,330
Granted
May 25, 2021
Kind
B2
Abstract

A method of growing a two-dimensional transition metal dichalcogenide (TMD) thin film and a method of manufacturing a device including the two-dimensional TMD thin film are provided. The method of growing the two-dimensional TMD thin film may include a precursor supply operation and an evacuation operation, which are periodically and repeatedly performed in a reaction chamber provided with a substrate for thin film growth. The precursor supply operation may include supplying two or more kinds of precursors of a TMD material to the reaction chamber. The evacuation operation may include evacuating the two or more kinds of precursors and by-products generated therefrom from the reaction chamber.

Claims (20)

1. A method of growing a two-dimensional transition metal dichalcogenide (TMD) thin film, the method comprising a precursor supply operation and an evacuation operation, which are periodically and repeatedly performed in a reaction chamber provided with a substrate for thin film growth, wherein

the precursor supply operation comprises supplying two or more kinds of precursors of a TMD material to the reaction chamber, the evacuation operation comprises evacuating the two or more kinds of precursors and by-products generated therefrom from the reaction chamber, and

wherein a single duration of the evacuation operation is shorter than a single duration of the precursor supply operation such that a vertical growth of the TMD thin film is suppressed and a lateral growth thereof is promoted relatively with respect to the vertical growth to control growth rate anisotropy.

2. The method of claim 1 , wherein the precursor supply operation has a duration ranging from 30 seconds to 180 seconds in each period thereof.

3. The method of claim 1 , wherein the evacuation operation has a duration ranging from 5 seconds to 120 seconds in each period thereof.

4. The method of claim 1 , wherein a reaction temperature for growth of the two-dimensional TMD thin film ranges from 550° C. to 1050° C.

5. The method of claim 1 , wherein the substrate comprises any one of Si, SiO 2 , Al 2 O 3 , graphene, and a TMD material.

6. The method of claim 1 , wherein, in the precursor supply operation, the two or more precursors are simultaneously or separately supplied into the reaction chamber.

7. The method of claim 1 , wherein, in the precursor supply operation, a catalytic gas is further supplied together with the two or more precursors.

8. The method of claim 1 , wherein the two-dimensional TMD thin film is grown using a chemical vapor deposition (CVD) process, a plasma-enhanced chemical vapor deposition (PECVD) process, a metal organic chemical vapor deposition (MOCVD) process, or a combination of at least two of them.

9. The method of claim 1 , wherein the two or more kinds of precursors comprise a precursor material of at least one of metal elements of Groups 4B, 5B, 6B, and 7B and a precursor material of one of chalcogen elements of S, Se, and Te.

10. The method of claim 9 , wherein the two or more precursors further comprise a precursor material of a doping element.

11. The method of claim 1 , wherein a material of the two-dimensional TMD thin film is represented by MX 2 ,

wherein M is one of Mo, W, Nb, V, Ta, Ti, Zr, Hf, Tc, and Re, and X is one of S, Se, and Te.

12. The method of claim 1 , further comprising forming a plurality of TMD materials different from each other in a multi-layered structure.

13. The method of claim 1 , wherein the two-dimensional TMD thin film is formed on a wafer having a size of 6 inches or more.

14. A method of manufacturing a two-dimensional material-containing device, the method comprising:

growing a two-dimensional transition metal dichalcogenide (TMD) thin film on a substrate by using the method according to claim 1 ; and

forming a device portion including the two-dimensional TMD thin film.

15. The method of claim 14 , wherein the two-dimensional material-containing device comprises at least one of a transistor, a diode, an optoelectronic device, a tunneling device, a logic device, and a memory device.

Priority Claims (1)
KR 10-2017-0161855 · Nov 29, 2017 · national
Continuity (2)
Continuation 16012938 · Jun 20, 2018
Related Publication 20200335335A1 · Oct 22, 2020
Cited By (1)
US 12,336,259