IP Library › Granted Patent US 11,037,811
Granted Patent B2
US 11,037,811 · App. 13/547,316 · Granted Jun 15, 2021

Electrostatic chuck and semiconductor/liquid crystal manufacturing equipment

Inventor: Norio Shiraiwa (Nagano, JP)
Assignee: SHINKO ELECTRIC INDUSTRIES CO., LTD.
H01L21/6831H01J37/32715H01J37/32724H01J37/32733H01J37/32779H01J37/32788H01L21/67109H01L21/68771H01L21/68785
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Quick Facts
Patent No.
US 11,037,811
App. No.
13/547,316
Granted
Jun 15, 2021
Kind
B2
Abstract

An electrostatic chuck includes, a chuck function portion including a plurality of chuck regions on which an attractable object is placed respectively, and a concave surface portion provided in an outer region of the chuck regions, and electrodes arranged in an inner part of the chuck function portion corresponding to the chuck regions and an inner part of the chuck function portion corresponding to the concave surface portion, respectively.

Claims (28)

1. An electrostatic chuck, comprising:

a chuck function portion including a plurality of chuck regions on which an attractable object is placed respectively, and a concave surface portion provided in an outer region of the chuck regions;

a focus ring arranged in an outer edge part of the chuck function portion;

first electrodes arranged in an inner part of the chuck function portion corresponding to the chuck regions;

second electrodes arranged in an inner part of the chuck function portion corresponding to the concave surface portion, wherein the focus ring does not overlap the second electrodes in plan view,

wherein the second electrodes are separated from the first electrodes, and a voltage is applied to the first electrodes and the second electrodes independently;

gas holes in which a heat transfer gas is supplied and concave portions formed to communicate with the gas holes, the gas holes and the concave portions provided in respective surfaces of the chuck regions and concave surface portion,

wherein a gas route including the gas holes provided in the surface of the chuck regions, and another gas route including the gas holes provided in the surface of the concave surface portion are provided as separate routes;

wherein a tray for conveying the attractable object is arranged on the electrostatic chuck, the tray includes opening portions in parts corresponding to the chuck regions, and a peripheral part of the tray contacts the concave surface portion of the chuck function portion, wherein an entire portion of the peripheral part of the tray is located inside the concave surface portion in plan view, and an entire portion of the focus ring is located outside the tray in plan view, and

a gas flow rate and a gas pressure of the heat transfer gas are controlled independently.

2. An electrostatic chuck according to claim 1 , further comprising:

a base plate arranged under the chuck function portion including a cooling mechanism.

3. A semiconductor/liquid crystal manufacturing equipment, comprising:

a chamber;

an electrostatic chuck placed to the chamber; and

a tray for conveying an attractable object;

wherein the electrostatic chuck includes

a chuck function portion including a plurality of chuck regions on which an attractable object is placed respectively, and a concave surface portion provided in an outer region of the chuck regions;

a focus ring arranged in an outer edge part of the chuck function portion;

first electrodes arranged in an inner part of the chuck function portion corresponding to the chuck regions;

second electrodes arranged in an inner part of the chuck function portion corresponding to the concave surface portion, wherein the focus ring does not overlap the second electrodes in plan view,

wherein the second electrodes are separated from the first electrodes, and a voltage is applied to the first electrodes and the second electrodes independently;

gas holes in which a heat transfer gas is supplied and concave portions formed to communicate with the gas holes, the gas holes and the concave portions provided in respective surfaces of the chuck regions and concave surface portion,

wherein a gas route including the gas holes provided in the surface of the chuck regions, and another gas route including the gas holes provided in the surface of the concave surface portion are provided as separate routes;

wherein the tray includes opening portions in parts corresponding to the chuck regions, and a peripheral part of the tray contacts the concave surface portion of the chuck function portion, wherein an entire portion of the peripheral part of the tray is located inside the concave surface portion in plan view, and an entire portion of the focus ring is located outside the tray in plan view, and

a gas flow rate and a gas pressure of the heat transfer are controlled independently.

4. A semiconductor/liquid crystal manufacturing equipment according to claim 3 , wherein the electrostatic chuck further includes a base plate arranged under the chuck function portion including a cooling mechanism, and

the semiconductor/liquid crystal manufacturing equipment is a dry etching equipment.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2012
From: SHIRAIWA, NORIO
To: SHINKO ELECTRIC INDUSTRIES CO., LTD.
Reel/Frame 028789/0069 →
Priority Claims (1)
JP JP2011-184285 · Aug 26, 2011 · national
Continuity (1)
Related Publication 20130048217A1 · Feb 28, 2013