Method of measuring a parameter of a lithographic process, metrology apparatus
The disclosure relates to measuring a parameter of a lithographic process and a metrology apparatus. In one arrangement, radiation from a radiation source is modified and used to illuminate a target formed on a substrate using the lithographic process. Radiation scattered from a target is detected and analyzing to determine the parameter. The modification of the radiation comprises modifying a wavelength spectrum of the radiation to have a local minimum between a global maximum and a local maximum, wherein the power spectral density of the radiation at the local minimum is less than 20% of the power spectral density of the radiation at the global maximum and the power spectral density of the radiation at the local maximum is at least 50% of the power spectral density of the radiation at the global maximum.
1. A method of measuring a parameter of a lithographic process, comprising:
modifying radiation from a radiation source;
illuminating a target formed on a substrate with the modified radiation using the lithographic process;
detecting radiation scattered from the target; and
analyzing the detected radiation to determine the parameter,
wherein the modification of the radiation comprises modifying a wavelength spectrum of the radiation to have a local minimum between a global maximum and a local maximum,
wherein the power spectral density of the radiation at the local minimum is less than 20% of the power spectral density of the radiation at the global maximum, and
wherein the power spectral density of the radiation at the local maximum is at least 50% of the power spectral density of the radiation at the global maximum.
2. The method of claim 1 , wherein:
a sensitivity curve defines a variation of a sensitivity of the process of determining the parameter as a function of the wavelength of radiation scattered from the target; and
the modified wavelength spectrum more closely matches the sensitivity curve relative to if the wavelength spectrum was not modified, such that an overall sensitivity of the process of determining the parameter by analyzing the detected radiation is improved.
3. The method of claim 2 , wherein positions of the local maximum and the global maximum, or at least two other local maxima of the modified wavelength spectrum, are matched to positions of local minima or local maxima in the sensitivity curve plotted against wavenumber to within 25% of an average separation between local maxima, or of an average separation between local minima, in the sensitivity curve plotted against wavenumber.
4. The method of claim 2 , wherein the wavelength spectrum is modified so that two or more pairs of adjacent local maxima are evenly spaced when the wavelength spectrum is plotted against wavenumber.
5. The method of claim 4 , wherein a separation between the evenly spaced local maxima is tuned to match a separation between local maxima or between local minima in the sensitivity curve plotted against wavenumber, to within 25% of an average separation between local maxima, or of an average separation between local minima, in the sensitivity curve plotted against wavenumber.
6. The method of claim 5 , wherein a phase of a periodic variation in the modified wavelength spectrum plotted against wavenumber corresponding to the evenly spaced local maxima is tuned to be in phase with the sensitivity curve plotted against wavenumber to within 25% of the average separation between local maxima, or of the average separation between local minima, in the sensitivity curve plotted against wavenumber.
7. The method of claim 2 , wherein:
the parameter of the lithographic process is measured multiple times using either or both of different targets and different substrates, and
the spectrum is modified differently in order to be matched to a different respective sensitivity curve for each of at least a subset of the measurements of the parameter of the lithographic process.
8. The method of claim 1 , wherein the wavelength spectrum is modified using a tunable multi-band filter based on interferometry.
9. The method of claim 8 , wherein the tunable multi-band filter comprises a Fabry-Pérot interferometer.
10. The method of claim 1 , wherein the wavelength spectrum is modified using an acousto-optic tunable filter.
11. The method of claim 1 , wherein:
different wavelength components of radiation to be modified are directed to different respective locations; and
the radiation is modulated differently in at least a subset of the different respective locations to perform the modification of the wavelength spectrum.
12. The method of claim 1 , wherein:
different wavelength components of radiation to be modified are directed to different respective regions of a spatial light modulator; and
the spatial light modulator modulates radiation differently in at least a subset of the different respective regions to perform the modification of the wavelength spectrum.
13. The method of claim 1 , wherein the modification of the radiation further comprises modifying the wavelength spectrum to vary as a function of angle of incidence of the radiation onto the target.
14. A metrology apparatus for measuring a parameter of a lithographic process, comprising:
an optical system configured to direct radiation from a radiation source onto a target formed on a substrate; and
a beam modification device configured to modify radiation received from the radiation source and provide the modified radiation to the optical system,
wherein the beam modification device is configured to modify a wavelength spectrum of the radiation from the radiation source to have a local minimum between a global maximum and a local maximum,
wherein the power spectral density of the radiation at the local minimum is less than 20% of the power spectral density of the radiation at the global maximum, and
wherein the power spectral density of the radiation at the local maximum is at least 50% of the power spectral density of the radiation at the global maximum.
15. The apparatus of claim 14 , wherein the beam modification device is further configured to modify the wavelength spectrum to vary as a function of angle of incidence of the radiation onto the target.
16. The apparatus claim 14 , wherein the beam modification device comprises one or more of the following: a tunable multi-band filter; a Fabry-Pérot interferometer; or an acousto-optic tunable filter.
17. The apparatus of claim 14 , wherein the beam modification device comprises:
an optical element; and
a spatial light modulator,
wherein the optical element is configured to direct different wavelength components of radiation to be modified onto different respective regions of the spatial light modulator; and
wherein the spatial light modulator is configured to modulate the radiation differently in at least a subset of the different respective regions to thereby modify the wavelength spectrum.
18. The apparatus of claim 17 , wherein the spatial light modulator is further configured to modulate radiation differently in portions of the spatial light modulator contributing to different respective angles of incidence of radiation onto the target.
19. The apparatus of claim 18 , wherein:
the optical element is configured to spread different wavelength components across the spatial light modulator exclusively parallel to a first axis, such that each elongate region of the spatial light modulator orthogonal to the first axis receives a different wavelength component;
the optical system is configured such that radiation received by the spatial light modulator at different positions along a second axis of the spatial light modulator contributes to different respective angles of incidence onto the target; and
the modulation of radiation differently in portions of the spatial light modulator contributing to different respective angles of incidence of radiation onto the target comprises modulating radiation non-uniformly as a function of position along the second axis.
20. The apparatus of claim 19 , wherein the first axis is orthogonal to the second axis.