Neighboring or logical minus word line dependent verify with sense time in programming of non-volatile memory

1. A method for programming a target memory cell of a memory array of a non-volatile memory system, comprising:

performing a read operation of one or more memory cells neighboring a target memory cell, thereby determining a data pattern of the one or more neighboring memory cells;

storing the data pattern of the one or more neighboring memory cells; and

during a program operation of the target memory cell, adjusting a verify voltage level according to the stored data pattern of the one or more neighboring memory cells.

2. The method according to claim 1 , further comprising applying two verify voltage levels during the program operation of the target memory cell such that the programmed threshold voltage distributions of the target memory cell are substantially aligned.

3. The method according to claim 1 , wherein adjusting the verify voltage level further comprises changing a control gate voltage applied to the target memory cell.

4. The method according to claim 1 , wherein adjusting the verify voltage level further comprises changing a period of a time sense signal applied to the target memory cell.

5. The method according to claim 4 , wherein the period of the time sense signal is shortened.

6. The method according to claim 1 , wherein at least one of the one or more neighboring memory cells is located at a previously-programmed word line of the memory array.

7. The method according to claim 1 , further comprising:

if the data pattern of the one or more neighboring memory cells comprises more than two programmable states:

dividing the programmable states into at least two subgroups; and

storing the at least two subgroups as the data pattern of the one or more neighboring memory cells.

8. A memory controller, comprising:

a first port configured to couple to a non-volatile memory array, the memory array comprising at least one target memory cell and at least one other memory cell neighboring the target memory cell; and

the memory controller configured to:

perform a read operation of the at least one neighboring memory cell to determine a data pattern of the at least one neighboring memory cell;

store the data pattern of the at least one neighboring memory cell; and

during a program operation of the target memory cell, adjust a verify voltage level according to the stored data pattern of the at least one neighboring memory cell.

9. The memory controller according to claim 8 , wherein:

during the program operation of the target memory cell, the memory controller is further configured to apply two verify voltage levels such that the programmed threshold voltage distributions of the target memory cell are substantially aligned.

10. The memory controller according to claim 8 , wherein the memory controller is further configured to change a control gate voltage applied to the target memory cell, thereby adjusting the verify voltage level.

11. The memory controller according to claim 8 , wherein the memory controller is further configured to change a period of a time sense signal applied to the target memory cell, thereby adjusting the verify voltage level.

12. The memory controller according to claim 11 , wherein the period of the time sense signal is shortened.

13. The memory controller according to claim 8 , wherein the at least one neighboring memory cell is located at a previously-programmed word line of the memory array.

14. The memory controller according to claim 8 , wherein:

if the data pattern of the at least one neighboring memory cell comprises more than two programmable states, the memory controller is further configured to:

divide the programmable states into at least two subgroups; and

store the at least two subgroups as the data pattern of the at least one neighboring memory cells.

15. A non-volatile memory system, comprising:

a memory array storing data in a target memory cell and at least one other memory cell that neighbors the target memory cell;

a memory controller coupled to the memory array and:

performing a read operation of the at least one neighboring memory cell, thereby determining a data pattern of the at least one neighboring memory cell;

storing the data pattern of the at least one neighboring memory cell; and

during a program operation of the target memory cell, adjusting a verify voltage level according to the stored data pattern of the at least one neighboring memory cell.

16. The non-volatile memory system according to claim 15 , wherein:

during the program operation of the target memory cell, the memory controller applies two verify voltage levels such that the programmed threshold voltage distributions of the target memory cell are substantially aligned.

17. The non-volatile memory system according to claim 15 , wherein the memory controller changes a control gate voltage applied to the target memory cell, thereby adjusting the verify voltage level.

18. The non-volatile memory system according to claim 15 , wherein the memory controller changes a period of a time sense signal applied to the target memory cell, thereby adjusting the verify voltage level.

19. The non-volatile memory system according to claim 18 , wherein the period of the time sense signal is shortened.

20. The non-volatile memory system according to claim 15 , wherein the at least one neighboring memory cell is located at a previously-programmed word line of the memory array.