Imaging reflectometer

1. A method for measuring reflectivity of a sample using an imaging reflectometer that includes a large field lens and a spot reflectometer, the method comprising:

sequentially generating a plurality of input beams at a first switching rate, each of the plurality of input beams generated by a different light source, at least some of the plurality of input beams having different nominal wavelengths than others of the plurality of input beams;

directing each of the plurality of input beams through an illumination pupil having a first numerical aperture (NA), the illumination pupil arranged along a first optical path;

providing at least a portion of each of the plurality of input beams as substantially telecentric illumination over a sample being imaged using the large field lens;

receiving reflected portions of the substantially telecentric illumination reflected from the sample at the large field lens and directing the reflected portions through an imaging pupil, the imaging pupil having a second NA that is lower than the first NA of the illumination pupil;

receiving the reflected portions and generating corresponding image information at an imaging sensor module, wherein the image information is generated at a frame rate that is the same as or faster than the first switching rate; and

performing spot reflectometry measurements on one or more areas of the sample, wherein a measurement field of the spot reflectometer is smaller than a measurement field of the large field lens.

2. The method of claim 1 wherein the measurement field of the large field lens is larger than the sample being imaged.

3. The method of claim 1 wherein the measurement field of the large field lens is smaller than the sample being imaged.

4. The method of claim 1 wherein performing the spot reflectometry measurements includes moving a robotic arm on which the spot reflectometer is mounted.

5. The method of claim 4 wherein the robotic arm is an R-theta robotic arm.

6. The method of claim 1 further comprising positioning the sample under the large field lens using an x-y scanning stage.

7. The method of claim 1 further comprising positioning the sample under the spot reflectometer using an x-y scanning stage.

8. The method of claim 1 further comprising splitting each of the plurality of input beams and directing a first portion of each of the plurality of input beams along a second optical path toward a reference sensor and allowing a second portion of each of the plurality of input beams to continue along the first optical path to provide at least the portion of the plurality of input beams as substantially telecentric illumination over the sample being imaged.

9. The method of claim 1 wherein the substantially telecentric illumination has a telecentricity error of less than 0.1 degree over a wavelength range of about 350 nm to about 1100 nm.

10. The method of claim 1 wherein sequentially generating the plurality of input beams comprises:

providing a first source power to generate a first input beam of the plurality of input beams; and

providing a second source power that is different from the first source power to generate a second input beam of the plurality of input beams, wherein the first source power and the second source power are dependent on the nominal wavelengths of the first input beam and the second input beam respectively.

11. The method of claim 1 wherein each of the plurality of input beams is generated by a different light source, and the different light sources include different light emitting diodes (LEDs) or different laser diodes (LDs).

12. The method of claim 1 wherein the measurement field of the large field lens is smaller than the sample being imaged, and the method further comprises moving the sample relative to a field of the substantially telecentric illumination.

13. A method for measuring reflectivity of a sample using an imaging reflectometer that includes a large field lens and a spot reflectometer, the method comprising:

sequentially generating a plurality of input beams at a first switching rate, each of the plurality of input beams generated by a different light source, at least some of the plurality of input beams having different nominal wavelengths than others of the plurality of input beams;

directing each of the plurality of input beams through an illumination pupil having a first numerical aperture (NA), the illumination pupil arranged along a first optical path;

splitting each of the plurality of input beams and directing a first portion of each of the plurality of input beams along a second optical path toward a reference sensor and allowing a second portion of each of the plurality of input beams to continue along the first optical path;

providing the second portion of each of the plurality of input beams as substantially telecentric illumination over a sample being imaged using the large field lens, the substantially telecentric illumination having a telecentricity error of less than 0.1 degree over a wavelength range of about 350 nm to about 1100 nm;

receiving reflected portions of the substantially telecentric illumination reflected from the sample at the large field lens and directing the reflected portions through an imaging pupil, the imaging pupil having a second NA that is lower than the first NA of the illumination pupil;

receiving the reflected portions and generating corresponding image information at an imaging sensor module, wherein the image information is generated at a frame rate that is the same as or faster than the first switching rate; and

performing spot reflectometry measurements on one or more areas of the sample, wherein a measurement field of the spot reflectometer is smaller than a measurement field of the large field lens.

14. The method of claim 13 wherein the measurement field of the large field lens is larger than the sample being imaged.

15. The method of claim 13 wherein the measurement field of the large field lens is smaller than the sample being imaged.

16. The method of claim 13 wherein performing the spot reflectometry measurements includes moving a robotic arm on which the spot reflectometer is mounted.

17. The method of claim 13 further comprising positioning the sample under the large field lens using an x-y scanning stage.

18. The method of claim 13 further comprising positioning the sample under the spot reflectometer using an x-y scanning stage.

19. The method of claim 13 wherein sequentially generating the plurality of input beams comprises:

providing a first source power to generate a first input beam of the plurality of input beams; and

providing a second source power that is different from the first source power to generate a second input beam of the plurality of input beams, wherein the first source power and the second source power are dependent on the nominal wavelengths of the first input beam and the second input beam respectively.

20. The method of claim 13 wherein each of the plurality of input beams is generated by a different light source, and the different light sources include different light emitting diodes (LEDs) or different laser diodes (LDs).