Timing based arbitration methods and apparatuses for calibrating impedances of a semiconductor device
Systems and apparatuses are provided for an arbiter circuit for timing based ZQ calibration. An example system includes a resistor and a plurality of chips. Each of the plurality of chips further includes a terminal coupled to the resistor and a calibration circuit. The calibration circuit determines whether the resistor is available based, at least in part, on timing information that is unique to a corresponding chip of the plurality of chip. The timing information of each chip of the plurality of chips has a fixed duration of time common to the plurality of chips.
1. A method comprising:
floating a voltage of an external pad for a first period of time;
pulling down the voltage of the external pad to a first voltage state for a second period of time; and
pulling down or floating the voltage of the external pad for individual ones of a plurality of clock cycles, wherein whether the voltage of the external pad is pulled down or floated for a clock cycle of the plurality of clock cycles is based, at least in part, on timing information unique to a chip of a plurality of chips.
2. The method of claim 1 , further comprising, prior to pulling down the voltage of the external pad to the second voltage state for the second period of time, comparing the voltage of the external pad to a reference voltage to determine whether the voltage of the external pad is at the first voltage state or a second voltage state, wherein when the voltage of the external pad is determined to be the first voltage state, the method further comprises repeating floating the voltage of the external pad for the first period of time.
3. The method of claim 1 , further comprising comparing the voltage of the external pad to a reference voltage to determine whether the voltage of the external pad is at the first voltage state or a second voltage state after each clock cycle of the plurality of clock cycles, wherein when the voltage of the external pad is determined to be the first voltage state, the method further comprises repeating floating the voltage of the external pad for the first period of time.
4. The method of claim 1 , wherein the first period of time is three clock cycles.
5. The method of claim 1 , wherein the second period of time is two clock cycles.
6. The method of claim 1 , wherein the first period of time is based, at least in part, on the timing information unique to the chip of the plurality of chips.
7. The method of claim 1 , wherein the second period of time is based, at least in part, on the timing information unique to the chip of the plurality of chips.
8. A method comprising:
floating a voltage of an external pad to or pulling down the voltage of the external pad to a first voltage state for individual ones of a plurality of clock cycles, wherein whether the voltage of the external pad is pulled down or floated for a clock cycle of the plurality of clock cycles is based, at least in part, on timing information unique to a chip of a plurality of chips;
determining whether the voltage of the external pad is at the first voltage state or a second voltage state after each clock cycle of the plurality of clock cycles; and
responsive to determining the voltage of the external pad is the first voltage state, floating the voltage of the external pad for a period of time.
9. The method of claim 8 , further comprising wherein responsive to determining the voltage of the external pad is the second voltage state, after at last clock cycle of the plurality of clock cycles, pulling down the voltage of the external pad to the first voltage state for a second period of time.
10. The method of claim 9 , further comprising floating the voltage of the external pad for a third period of time following the second period of time.
11. The method of claim 10 , further comprising pulling down the voltage of the external pad to the second voltage state; and
performing a ZQ calibration operation.
12. The method of claim 10 , wherein the third period of time is one clock cycle.
13. The method of claim 9 , wherein the second period of time is two clock cycles.
14. The method of claim 8 , wherein the timing information comprises a binary code.
15. The method of claim 14 , wherein the binary code is mirrored in a time domain.
16. A method comprising:
floating a voltage of an external pad for a plurality of clock cycles;
determining whether the voltage of the external pad is at a high voltage state or a low voltage state at an end of each clock cycle of the plurality of clock cycles;
responsive to the voltage of the external pad being at the low voltage state, repeating floating the voltage of the external pad for the plurality of clock cycles; and
responsive to the voltage of the external pad being at the high voltage state, after the plurality of clock cycles, providing a voltage pulse to the external pad after a delay, wherein the delay is unique to a chip of a plurality of chips.
17. The method of claim 16 , wherein the delay is longer for a chip having a higher priority than the delay for a chip having a lower priority of the plurality of chips.
18. The method of claim 16 , wherein floating the voltage of the external pad for the plurality of clock cycles is performed at a different phase for at least one chip of the plurality of chips.
19. The method of claim 16 , further comprising pulling down the voltage of the external pad to the low voltage state after the plurality of clock cycles for a number of clock cycles equal to the delay.
20. The method of claim 16 , further comprising performing a ZQ calibration operation after providing the voltage pulse.