IP Library Granted Patent US 11,239,853
Granted Patent B1
US 11,239,853 · App. 17/082,481 · Granted Feb 1, 2022

Hybrid analog-to-digital converter with multi-domain signal processing

Inventors: Fa Dai (Auburn, AL); Haoyi Zhao (Auburn, AL); John David Irwin (Auburn, AL)
Assignee: Digital Analog Integration, Inc.
H03M1/1009G04F10/005H03M1/145H03M1/164H03M1/50
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Quick Facts
Patent No.
US 11,239,853
App. No.
17/082,481
Granted
Feb 1, 2022
Kind
B1
Abstract

An analog-to-digital converter includes a first converter stage, a second converter stage coupled to the first converter stage to quantize a residue signal of the first converter stage, and an inter-stage converter disposed between the first and second converter stages. The inter-stage converter is configured to convert between a first domain and a second domain. The inter-stage converter is configured to process the residue signal of the first converter stage such that a range of the residue signal matches a full scale of the second converter stage.

Claims (59)

1. An analog-to-digital converter comprising:

a first converter stage;

a second converter stage coupled to the first converter stage to quantize a residue signal of the first converter stage; and

an inter-stage converter disposed between the first and second converter stages, the inter-stage converter being configured to convert between a first domain and a second domain;

wherein the inter-stage converter is configured to process the residue signal of the first converter stage such that a range of the residue signal matches a full scale of the second converter stage, and

wherein:

the first converter stage comprises a continuous switching capacitor DAC (CDAC) and a voltage comparator;

the inter-stage converter comprises a voltage-to-time converter (VTC), the VTC having an input coupled to the voltage comparator;

the second converter stage comprises a ring time-to-digital converter (TDC); and

switching of the CDAC is timed by the ring TDC so that the range of the residue signal of the first converter stage is equal to the full scale of the TDC.

2. The analog-to-digital converter of claim 1 , wherein the residue signal of the first converter stage corresponds with a least significant bit in the first domain.

3. The analog-to-digital converter of claim 1 , wherein the TDC and the VTC operate simultaneously.

4. The analog-to-digital converter of claim 1 , wherein the inter-stage converter comprises a CDAC discharging-based voltage-to-time converter (VTC) with CDAC switching timed by a lap delay of the ring TDC.

5. The analog-to-digital converter of claim 1 , wherein:

the first domain is a voltage domain;

the second domain is a time domain;

the inter-stage converter is configured to convert from the voltage domain to the time domain; and

the residue signal has a residual voltage range equal to the full scale of the second converter stage.

6. A system comprising a set of analog-to-digital converters, each analog-to-digital converter being configured in accordance with claim 1 , wherein:

the set of analog-to-digital converters are disposed in a parallel, time-interleaved arrangement; and

the system further comprises a timing skew calibration circuit configured to determine timing skew via a comparison of a difference between sampling edges with an average value of sampling edge differences.

7. An analog-to-digital converter of claim 1 , further comprising:

a first converter stage;

a second converter stage coupled to the first converter stage to quantize a residue signal of the first converter stage;

an inter-stage converter disposed between the first and second converter stages, the inter-stage converter being configured to convert between a first domain and a second domain; and

a background calibration loop to align the range of the residue signal of the first converter stage with the full scale of the second converter stage;

wherein the inter-stage converter is configured to process the residue signal of the first converter stage such that a range of the residue signal matches a full scale of the second converter stage.

8. An analog-to-digital converter comprising:

a first converter stage configured for voltage domain quantization;

a second converter stage configured for time-to-digital quantization, the second converter stage being coupled to the first converter stage to quantize a residual voltage of the voltage domain quantization; and

an inter-stage converter disposed between the first and second converter stages, the inter-stage converter being configured to convert from a voltage domain to a time domain;

wherein the inter-stage converter is configured to process the residual voltage of the voltage domain quantization such that a range of the residual voltage matches a full scale of the time-to-digital quantization, and

wherein:

the first converter stage comprises a continuous switching capacitor DAC (CDAC) and a voltage comparator;

the inter-stage converter comprises a voltage-to-time converter (VTC), the VTC having an input coupled to the voltage comparator;

the second converter stage comprises a Vernier-ring time-to-digital converter (TDC); and

switching of the CDAC is timed by the Vernier-ring TDC so that the range of the residue signal of the first converter stage is equal to the full scale of the TDC.

9. The analog-to-digital converter of claim 8 , wherein the TDC and the VTC operate simultaneously.

10. The analog-to-digital converter of claim 8 , further comprising a background calibration loop to align the range of the residual voltage of the voltage domain quantization with the full scale of the time-to-digital (TDC) quantization.

11. The analog-to-digital converter of claim 8 , wherein the inter-stage converter comprises a CDAC discharging-based voltage-to-time converter (VTC) with CDAC switching timed by a lap delay of the Vernier-ring TDC.

12. An analog-to-digital converter comprising:

a first converter stage configured for voltage domain quantization;

a second converter stage comprising a Vernier-ring, time-to-digital converter (TDC) for time-to-digital quantization, the second converter stage being coupled to the first converter stage to quantize a residual voltage of the voltage domain quantization; and

an inter-stage converter disposed between the first and second converter stages, the inter-stage converter being configured to convert the residual voltage from a voltage domain to a time domain;

wherein the inter-stage converter is configured to process the residual voltage such that a range of the residual voltage of the voltage domain quantization matches a full scale of the time-to-digital quantization, and

wherein a background calibration loop to align the range of the residue signal of the first converter stage with the full scale of the second converter stage.

13. The analog-to-digital converter of claim 12 , wherein the first converter stage comprises a continuous switching capacitor DAC (CDAC) and a voltage comparator.

14. The analog-to-digital converter of claim 12 , wherein:

the inter-stage converter comprises a voltage-to-time converter (VTC); and

the Vernier-ring TDC and the VTC operate simultaneously.

15. An analog-to-digital converter comprising:

a first converter stage configured for voltage domain quantization;

a second converter stage comprising a Vernier-ring, time-to-digital converter (TDC), the second converter stage being coupled to the first converter stage to quantize a residual voltage of the voltage domain quantization;

an inter-stage converter disposed between the first and second converter stages, the inter-stage converter being configured to convert the residual voltage from a voltage domain to a time domain; and

a background calibration loop to align the range of the residue signal of the first converter stage with the full scale of the second converter stage.

16. The analog-to-digital converter of claim 15 , wherein:

the first converter stage comprises a continuous switching capacitor DAC (CDAC) and a voltage comparator;

the inter-stage converter comprises a voltage-to-time converter (VTC); and

the Vernier-ring TDC and the VTC operate simultaneously.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2021
From: DAI, FA; ZHAO, HAOYI; IRWIN, JOHN DAVID
To: DIGITAL ANALOG INTEGRATION, INC.
Reel/Frame 056673/0110 →
Cited By (6)
US 12,273,122 US 12,283,969 US 12,334,945 US 12,463,655 US 12,603,661 US 12,738,945