IP Library › Granted Patent US 11,248,293
Granted Patent B2
US 11,248,293 · App. 16/557,285 · Granted Feb 15, 2022

Film-forming apparatus and film-forming method

Inventors: Hirotaka Kuwada (Nirasaki, JP); Yu Nunoshige (Nirasaki, JP); Yasushi Fujii (Nirasaki, JP)
Assignee: TOKYO ELECTRON LIMITED
C23C16/45565C23C16/4405C23C16/4586C23C16/45527C23C16/45544C23C16/45563H01L21/0228H01L21/02186
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Quick Facts
Patent No.
US 11,248,293
App. No.
16/557,285
Granted
Feb 15, 2022
Kind
B2
Abstract

An apparatus includes: a vacuum container having a vacuum atmosphere for a film forming process on each substrate; a stage for heating the substrate mounted thereon; a shower head including a facing portion that faces the stage and ejection ports opened in the facing portion, which supplies a film-forming gas to the substrate through the ports so as to form a film on the substrate; a cleaning gas supply part for supplying a cleaning gas into the container to clean the interior of the container in a state where no substrate is accommodated in the container while the film forming process is applied on the each of the plurality of substrates; and a non-porous coating film for covering a base material constituting the shower head at least in the facing portion to form a surface of the shower head when the film-forming gas is supplied to each substrate.

Claims (13)

1. A film-forming apparatus comprising:

a vacuum container having a vacuum atmosphere formed therein configured for a film forming process on each of a plurality of substrates;

a stage provided within the vacuum container and configured to heat the substrate mounted on the stage;

a shower head including a facing portion formed to face the stage and a plurality of gas ejection ports opened in the facing portion, the shower head configured to supply a film-forming gas to the substrate heated through the plurality of gas ejection ports so as to form a film on the substrate;

a cleaning gas supply part configured to supply a cleaning gas into the vacuum container to clean an interior of the vacuum container in a state where no substrate is accommodated in the vacuum container while the film forming process is applied on each of the plurality of substrates; and

a non-porous coating film configured to cover a base material constituting the shower head at least in the facing portion and form a surface of the shower head, such that a fluctuation in a heat reflectance in the shower head when the film-forming gas is supplied to each of the plurality of substrates is alleviated,

wherein the stage is further configured to emit an infrared ray when heating the substrate, and

wherein a reflectance of the coating film with respect to the infrared ray having an wavelength ranging from 3 μm to 7 μm is a first reflectance, and a reflectance of the base material exposed to the cleaning gas with respect to the infrared ray having the wavelength is a second reflectance, a ratio of the first reflectance to the second reflectance is 0.8 to 1.2.

2. The film-forming apparatus of claim 1 , wherein the base material is a metal including aluminum, and the coating film is an alumite film.

3. The film-forming apparatus of claim 2 , wherein the base material is A5052 according to JIS (Japanese Industrial Standard).

4. The film-forming apparatus of claim 1 , wherein the base material is heated to a temperature of 400 degrees C. or higher when the film-forming gas is supplied.

5. The film-forming apparatus of claim 1 , wherein the cleaning gas is a chlorine trifluoride gas.

6. The film-forming apparatus of claim 1 , wherein a reflectance of an infrared ray having a wavelength of 3 μm to 7 μm in the coating film is 80% to 92%.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 5, 2019
From: KUWADA, HIROTAKA; NUNOSHIGE, YU; FUJII, YASUSHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 050270/0136 →
Priority Claims (1)
JP JP2018-163155 · Aug 31, 2018 · national
Continuity (1)
Related Publication 20200071831A1 · Mar 5, 2020