Dynamic logic built with stacked transistors sharing a common gate
A dynamic logic circuit including a first transistor within a first device stratum of a substrate; and a second transistor within a second device stratum of the substrate that is different from the first device stratum, wherein the first transistor and the second transistor share a common gate electrode. A method including disposing a second semiconductor body of a second transistor on a first semiconductor body of a first transistor in a first device stratum on a substrate, the second semiconductor body defining a second device stratum; and forming a common gate electrode on each of the semiconductor body and the second semiconductor body.
1. A dynamic logic circuit comprising:
a first transistor comprising a first semiconductor body within a first device stratum,
a second transistor comprising a second semiconductor body within a second device stratum, wherein the first transistor and the second transistor share a common gate electrode; and
an inter-strata interconnect directly vertically between a source or drain region of the first semiconductor body and a source or drain region of the second semiconductor body.
2. The dynamic logic circuit of claim 1 , wherein the first transistor comprises a precharge transistor and the second transistor comprises an evaluate transistor.
3. The dynamic logic circuit of claim 2 , wherein the first transistor comprises a P-type MOSFET.
4. The dynamic logic circuit of claim 1 , wherein the first semiconductor body and the second semiconductor body each comprises a fin.
5. The dynamic logic circuit of claim 1 , wherein the common gate electrode wraps around the first semiconductor body and the second semiconductor body.
6. The dynamic logic circuit of claim 1 , wherein the inter-strata interconnect is coupled to a drain of the first transistor and a drain of the second transistor.
7. The dynamic logic circuit of claim 6 , wherein the inter-strata interconnect is coupled to an output line, the circuit further comprising an inverter cell coupled to the output line.
8. The dynamic logic circuit of claim 7 , wherein the inverter cell comprises a P-type MOSFET and an N-type MOSFET that share a common gate electrode.
9. A dynamic logic circuit comprising:
a P-type MOSFET comprising a clock input;
an N-type MOSFET logic circuit comprising one or more N-type MOSFETs comprising one or more logic inputs and an N-type MOSFET comprising the clock input;
an inverter cell coupled to the N-type MOSFET logic circuit, wherein the P-type MOSFET comprises a first semiconductor body in a first device stratum and the N-type MOSFET comprising the clock input comprises a second semiconductor body within a second device stratum, and the P-type MOSFET and the N-type MOSFET comprising the clock input share a common gate electrode; and
an inter-strata interconnect vertically between a source or drain region of the first semiconductor body and a source or drain region of the second semiconductor body.
10. The dynamic logic circuit of claim 9 , wherein a source of the P-type MOSFET is coupled to a power source.
11. The dynamic logic circuit of claim 9 , wherein the inter-stratum interconnect is coupled to the drain of the P-type MOSFET and the drain of the N-type MOSFET comprising the clock input.
12. The dynamic logic circuit of claim 11 , wherein the inter-stratum interconnect is coupled to an output line and the inverter cell is coupled to the output line.
13. The dynamic logic circuit of claim 9 , wherein the inverter cell comprises a P-type MOSFET and an N-type MOSFET that share a common gate electrode.
14. The dynamic logic circuit of claim 13 , wherein the P-type MOSFET and the N-type MOSFET of the inverter cell are in different device strata on the substrate.
15. A dynamic logic circuit comprising:
a first transistor comprising a first semiconductor body within a first device stratum,
a second transistor comprising a second semiconductor body within a second device stratum, wherein the first transistor and the second transistor share a common gate electrode, and wherein the first semiconductor body and the second semiconductor body each comprises a fin; and
an inter-strata interconnect vertically between the first semiconductor body and the second semiconductor body.
16. The dynamic logic circuit of claim 15 , wherein the first transistor comprises a precharge transistor and the second transistor comprises an evaluate transistor.
17. The dynamic logic circuit of claim 15 , wherein the inter-strata interconnect is coupled to a drain of the first transistor and a drain of the second transistor.
18. A dynamic logic circuit comprising:
a first transistor comprising a first semiconductor body within a first device stratum,
a second transistor comprising a second semiconductor body within a second device stratum, wherein the first transistor and the second transistor share a common gate electrode, and wherein the common gate electrode wraps around the first semiconductor body and the second semiconductor body; and
an inter-strata interconnect vertically between the first semiconductor body and the second semiconductor body.
19. The dynamic logic circuit of claim 18 , wherein the first transistor comprises a precharge transistor and the second transistor comprises an evaluate transistor.
20. The dynamic logic circuit of claim 18 , wherein the inter-strata interconnect is coupled to a drain of the first transistor and a drain of the second transistor.