Via structure for semiconductor dies
A semiconductor die may be coupled to a printed circuit board using a solder ball. The semiconductor die comprises a redistribution layer formed above a semiconductor chip, a polymer layer formed on the redistribution layer, and an Under Bump Metallurgy (UBM) layer formed on the polymer layer. The polymer layer comprises a plurality of vias, which electrically couple the UBM layer to the redistribution layer. The entire UBM layer may be deposited with a continuously flat upper surface for coupling to the solder ball. The plurality of vias may be positioned such that they are centered on a point that is not central to the UBM layer.
1. A semiconductor die for coupling to a printed circuit board using a solder ball; the semiconductor die comprising:
a redistribution layer formed above a semiconductor chip;
a polymer layer formed on the redistribution layer, wherein the polymer layer comprises a plurality of vias;
an Under Bump Metallurgy (UBM) layer formed on the polymer layer, wherein the plurality of vias are configured to electrically couple the solder ball to the redistribution layer via the UBM layer, and wherein the plurality of vias are positioned such that they are centered on a point not central to the UBM layer to reduce stress on the solder ball.
2. The semiconductor die as in claim 1 , further comprising the solder ball.