Granted Patent
S1
US 1,142,246 · App. 35/525,905 · Granted Aug 18, 2026
Probe pin for integrated circuits testing
Inventors:
Dong Weon Hwang (Seongnam-si, KR); Jae Baek Hwang (Seongnam-si, KR); Logan Jae Hwang (Beverly Hills, CA)
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Claims (1)
The ornamental design for a probe pin for integrated circuits testing as shown and described.
Priority Claims (1)
KR 30-2024-0002466
· Jan 18, 2024
· national
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