IP Library › Granted Patent US 11,450,544
Granted Patent B2
US 11,450,544 · App. 16/845,914 · Granted Sep 20, 2022

Substrate processing apparatus, substrate processing system, and substrate processing method

Inventors: Itsuki Kobata (Tokyo, JP); Keita Yagi (Tokyo, JP); Katsuhide Watanabe (Tokyo, JP); Yoichi Shiokawa (Tokyo, JP); Toru Maruyama (Tokyo, JP); Nobuyuki Takahashi (Tokyo, JP)
Assignee: EBARA CORPORATION
H01L21/67742B24B37/04B24B37/20H01L21/30612H01L21/30625H01L21/31055H01L21/31111H01L21/3212H01L21/32115H01L21/32134H01L21/6708H01L21/67092H01L21/67248H01L21/67253H01L21/6838H01L22/26H01L22/12
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Quick Facts
Patent No.
US 11,450,544
App. No.
16/845,914
Granted
Sep 20, 2022
Kind
B2
Abstract

An object of the present invention is to improve a substrate processing apparatus using the CARE method. The present invention provides a substrate processing apparatus for polishing a processing target region of a substrate by bringing the substrate and a catalyst into contact with each other in the presence of processing liquid. The substrate processing apparatus includes a substrate holding unit configured to hold the substrate, a catalyst holding unit configured to hold the catalyst, and a driving unit configured to move the substrate holding unit and the catalyst holding unit relative to each other with the processing target region of the substrate and the catalyst kept in contact with each other. The catalyst is smaller than the substrate.

Claims (32)

1. A method for etching a substrate, at least a part of a target region of the substrate including a metal, the method comprising:

placing the substrate in such a manner that the substrate is placed with the target region face up;

placing a catalyst comprising a transition metal or a precious metal such that the catalyst faces to the substrate;

moving the catalyst and the target region of the substrate relative to each other with the catalyst and the target region of the substrate kept in contact with each other;

supplying a processing liquid to a region between the target region of the substrate and the catalyst; and

applying a voltage to between the catalyst and the metal of the target region,

wherein

the catalyst is held by an elastic member,

the elastic member includes a structure having an enclosed pressure chamber formed by a top surface of an elastic film, and

controlling contact pressure applied to the target region of the substrate from the catalyst by controlling fluid supplied into the pressure chamber.

2. The method according to claim 1 , further comprising: forming the catalyst at an outer surface of the elastic film by any one of a physical vapor deposition, a chemical vapor deposition, and plating.

3. The method according to claim 1 , wherein

the catalyst is detachably attached to the outer surface of the elastic member.

4. The method according to claim 1 , wherein

the target region of the substrate includes at least one of Cu, W, Ta, Ti, TaN, TiN, and Co.

5. The method according to claim 1 , wherein

the processing liquid includes at least one of an oxygen solution, ozone water, acid, an alkali solution, H 2 O 2 water, and a hydrofluoric acid solution.

6. The method according to claim 1 , further comprising:

conditioning the catalyst during an interval time period between an etching process performed on one substrate and another etching process performed on another substrate.

7. The method according to claim 6 , further comprising:

immersing the catalyst into a conditioning liquid during the interval time period.

8. The method according to claim 7 , further comprising:

applying a voltage to between the catalyst and an electrode with the catalyst and the electrode immersed in the conditioning liquid.

9. The method according to claim 1 , wherein the metal of the at least a part of the target region of the substrate comprises at least of tungsten (W), copper (Cu), tantalum (Ta), Titanium (Ti), and Cobalt (Co).

10. A method for etching a substrate, at least a part of a target region of the substrate including a metal, the method comprising:

placing the substrate in such a manner that the substrate is placed with the target region face up;

placing a catalyst comprising a transition metal or a precious metal such that the catalyst faces to the substrate;

moving the catalyst and the target region of the substrate relative to each other with the catalyst and the target region of the substrate kept in contact with each other;

supplying a processing liquid to a region between the target region of the substrate and the catalyst;

placing a counter electrode at a distant from the metal of the target region;

electrochemically connecting the counter electrode and the target region through the processing liquid; and

applying a voltage to between the catalyst and the counter electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2020
From: SHIOKAWA, YOICHI; KOBATA, ITSUKI; YAGI, KEITA; WATANABE, KATSUHIDE; MARUYAMA, TORU; TAKAHASHI, NOBUYUKI
To: EBARA CORPORATION
Reel/Frame 052368/0458 →
Priority Claims (1)
JP 2014-086869 · Apr 18, 2014 · national
Continuity (2)
Division 15305088
Related Publication 20200243364A1 · Jul 30, 2020
Cited By (2)
US 12,498,552 US 12,560,480