Method for detecting environmental parameter in semiconductor fabrication facility

1. A semiconductor fabrication facility, comprising:

a first group of processing tools;

a first sampling station connected to the first group of processing tools;

a detection vehicle detachably connected to the first sampling station and comprising a metrology module, wherein when the detection vehicle is connected to the first sampling station, a gas sample is delivered from one of the first group of processing tools to the metrology module of the detection vehicle via the first sampling station for performing a measurement of a parameter in related to the gas sample by the metrology module; and

a control system configured to issue a warning when the parameter in related to the gas sample from the one of the first group of processing tools is out of a range of acceptable values associated with the one of the first group of processing tools.

2. The semiconductor fabrication facility of claim 1 , further comprising

a second group of processing tools; and

a second sampling station connected to the second group of processing tools;

wherein the detection vehicle detachably connected to the second sampling station, and the control system is configured to issue a warning when the parameter in related to the gas sample from one of the second group of processing tools is out of a range of acceptable values associated with the second group of processing tools.

3. The semiconductor fabrication facility of claim 1 , wherein the control system is configured to stop an operation of the one of the first group of processing tools in response to the warning.

4. The semiconductor fabrication facility of claim 1 , wherein the one of the first group of processing tools comprises:

a load port configured for positioning a wafer carrier;

a reaction chamber configured for processing a semiconductor wafer; and

an interface chamber located between the load port and the reaction chamber, wherein a sampling tube is connected between the interface chamber and the first sampling station for a delivery of the gas sample from the one of the first group of processing tools to the first sampling station.

5. The semiconductor fabrication facility of claim 1 , wherein the detection vehicle comprises a vent, and an ambient gas sample is taken from an ambience of the semiconductor fabrication facility to the metrology module through the vent for performing a measurement of a parameter in related to the ambience by the metrology module.

6. The semiconductor fabrication facility of claim 1 , wherein the metrology module is configured to measure a parameter associated with the gas sample comprising total organic carbon (TOC), graphite fluorine intercalation compounds (CxF), and humidity.

7. The semiconductor fabrication facility of claim 1 , the first sampling station comprises:

a rotatory valve comprising a first conduit having a connection port which is detachably connected to the detection vehicle; and

a plurality of sampling tubes connecting the first group of processing tools to the rotatory valve, wherein the rotatory valve is configured such that the first conduit is fluidly connected to one of the sampling tubes but isolated from the other sampling tubes for delivering the gas sample from the one of the first group of processing tools to the detection vehicle at one time.

8. The semiconductor fabrication facility of claim 1 , wherein the first sampling station comprises a flow meter positioned on a flowing path of the gas sample in the first sampling station for detecting a flowing rate of the gas sample.

9. A detection vehicle for measurement of a condition of semiconductor fabrication facility, the detection vehicle comprising:

a gas line fluidly connected to a processing tool for processing a semiconductor wafer;

a metrology module fluidly connected to the gas line and configured to measure at least one parameter of a gas sample taken from the processing tool; and

a vehicle driving module configured to move the detection vehicle in the semiconductor fabrication facility to connect the detection vehicle with another processing tool.

10. The detection vehicle of claim 9 , further comprising a vent, wherein the metrology module fluidly connected to the vent and is configured to perform a measurement of a parameter in related to the ambience taken from the vent.

11. The detection vehicle of claim 9 , wherein the metrology module is configured to measure a parameter associated with the gas sample comprising total organic carbon (TOC), graphite fluorine intercalation compounds (CxF), and humidity.

12. The detection vehicle of claim 9 , further comprising a communication module configured to issue a signal to control a delivery of the gas sample from the processing tool to the metrology module via the gas line.

13. A method of monitoring a semiconductor fabrication facility, comprising:

actuating a detection vehicle to move to a first sampling station, wherein the first sampling station is fluidly connected to a first group of processing tools;

connecting a gas line of the detection vehicle to the first sampling station;

collecting a first gas sample, through the first sampling station, from one of the first group of processing tools; and

issuing a warning when a parameter in related to the first gas sample from the one of the first group of processing tools is out of a range of acceptable values associated with the one of the first group of processing tools.

14. The method of claim 13 , further comprising:

disengaging the gas line of the detection vehicle from the first sampling station;

actuating the detection vehicle to move to a second sampling station, wherein the second sampling station is fluidly connected to a second group of processing tools;

connecting the gas line of the detection vehicle to the second sampling station;

collecting a second gas sample, through the second sampling station, from one of the second group of processing tools; and

issuing a warning when a parameter in related to the second gas sample from the one of the second group of processing tools is outside the range of acceptable values associated with the one of the second group of processing tools.

15. The method of claim 13 , further comprising stopping an operation of the one of the first group of processing tools in response to the warning.

16. The method of claim 13 , further comprising:

collecting an ambient gas sample from a clean room by the detection vehicle; and

issuing a warning when a parameter in related to the ambient gas sample detected by the metrology device in the detection vehicle is out of a range of acceptable values.

17. The method of claim 13 , wherein the first sampling station is fluidly connected to an interface chamber of the one of the first group of processing tools, wherein the interface chamber comprises an enclosure and located between a load port, for supporting a wafer carrier, and a processing chamber, for performing a process over a semiconductor wafer.

18. The method of claim 13 , wherein the parameter comprises total organic carbon (TOC), graphite fluorine intercalation compounds (CxF), and humidity.

19. The method of claim 13 , wherein the collecting the first gas sample, through the first sampling station, from the one of the first group of processing tools comprising:

guiding a flow of gas from the first group of processing tools to the first sampling station to pass a plurality of sampling tubes; and

connecting one of the sampling tubes that connected to the one of the first group of processing tools with a connection port while isolating the other sampling tubes from the connection port, wherein the detection vehicle collects the first gas sample from the sampling station via the connection port.

20. The method of claim 13 , further comprising:

measuring a flow rate of the first gas sample in a flowing path of the first gas sample; and

issuing a warning when the flow rate of the first gas sample is less than a predetermined value.