Fail-safe IC production testing
An integrated circuit (IC) includes a non-volatile memory and boot circuitry. The boot circuitry is configured to boot the IC, including reading from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully, and initiating a responsive action if the one or more values indicate that the production testing was not completed successfully.
1. An integrated circuit (IC), comprising:
a non-volatile memory; and
boot circuitry, configured to boot the IC, including reading from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully, and initiating a responsive action if the one or more values indicate that the production testing was not completed successfully.
2. The IC according to claim 1 , wherein the one or more values consist of a single pass/fail bit.
3. The IC according to claim 1 , wherein the one or more values have been written to the non-volatile memory by an external Automatic Test Equipment (ATE).
4. The IC according to claim 1 , further comprising control circuitry configured to receive from an external Automatic Test Equipment (ATE) information indicative of whether the production testing was completed successfully, and to write the one or more values to the non-volatile memory based on the information.
5. The IC according to claim 1 , wherein the one or more values comprise one or more of (i) an irrecoverable test pass indication, (ii) an irrecoverable test fail indication, (iii) a recoverable test fail indication, and (iv) a recoverable test pass indication.
6. The IC according to claim 1 , wherein the one or more values are mutually orthogonal.
7. The IC according to claim 1 , wherein the non-volatile memory is a one-time-programmable (OTP) memory.
8. The IC according to claim 1 , wherein the non-volatile memory is a multiple-time-programmable non-volatile memory (MTP NVM).
9. A method, comprising booting an Integrated Circuit (IC) that includes a non-volatile memory, including:
reading from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully; and
initiating a responsive action if the one or more values indicate that the production testing was not completed successfully.
10. The method according to claim 9 , wherein the one or more values consist of a single pass/fail bit.
11. The method according to claim 9 , wherein the one or more values have been written to the non-volatile memory by an external Automatic Test Equipment (ATE).
12. The method according to claim 9 , further comprising receiving in the IC, from an external Automatic Test Equipment (ATE), information indicative of whether the production testing was completed successfully, and writing the one or more values to the non-volatile memory based on the information.
13. The method according to claim 9 , wherein the one or more values comprise one or more of (i) an irrecoverable test pass indication, (ii) an irrecoverable test fail indication, (iii) a recoverable test fail indication, and (iv) a recoverable test pass indication.
14. The method according to claim 9 , wherein the one or more values are mutually orthogonal.
15. The method according to claim 9 , wherein the non-volatile memory is a one-time-programmable (OTP) memory.
16. The method according to claim 9 , wherein the non-volatile memory is a multiple-time-programmable non-volatile memory (MTP NVM).