Substrate processing apparatus equipped with substrate scanner
A substrate processing apparatus includes a process station for processing a substrate; a cassette station integrated with the process station; a substrate carriage equipped for transferring the substrate between said process station and the cassette station through a passage located at an interface between the process station and said cassette station; and a substrate scanner equipped at said interface between the process station and the cassette station for capturing surface image data during transportation of the substrate that passes through the passage.
1. A substrate processing apparatus, comprising:
a process station for processing a substrate;
a cassette station integrated with said process station;
a compartment wall disposed at an interface between said cassette station and said process station, wherein said compartment wall is provided with a passage, which allows a robot arm in said cassette station to transfer said substrate between said process station and said cassette station;
a substrate carriage equipped for transferring said substrate between said process station and said cassette station through said passage located at said interface between said process station and said cassette station; and
a substrate scanner disposed in the compartment wall at said interface between said process station and said cassette station for capturing surface image data during transportation of said substrate that passes through said passage.
2. The substrate processing apparatus according to claim 1 , wherein said substrate scanner comprises an image sensor device disposed above a top surface of said substrate.
3. The substrate processing apparatus according to claim 2 , wherein said substrate scanner is a line scanner that captures line-shaped surface image of said substrate at a pre-selected line rate of about 4.5K line/second.
4. The substrate processing apparatus according to claim 2 , wherein said substrate scanner has a pixel size of about 47 μm.
5. The substrate processing apparatus according to claim 3 further comprising a light emitting device disposed between said image sensor device and said top surface of said substrate.
6. The substrate processing apparatus according to claim 5 , wherein said light emitting device produces a scan line impinging onto said top surface of said substrate, and wherein a reflected light comprising said surface image data is detected by said image sensor device.
7. The substrate processing apparatus according to claim 6 , wherein said light emitting device comprises a filter that blocks blue light and UV light from a light source of said light emitting device.
8. The substrate processing apparatus according to claim 7 , wherein said light source is light-emitting diode (LED) light source and has illuminance of about 50,000 lux.
9. The substrate processing apparatus according to claim 6 , wherein a longitudinal length of said scan line is equal to or greater than a diameter of said substrate.
10. The substrate processing apparatus according to claim 6 , wherein said light emitting device comprises a stripe-shaped transparent window that allows said scan line and said reflected light to pass therethrough.
11. The substrate processing apparatus according to claim 1 , wherein said top surface of said substrate is completely scanned by said substrate scanner in two seconds.
12. The substrate processing apparatus according to claim 1 further comprising a transfer plate equipped in said process station, wherein said substrate is mounted on said transfer plate before being transported by said substrate carriage.
13. The substrate processing apparatus according to claim 12 , wherein said transfer plate is a cooling plate for cooling said substrate.
14. The substrate processing apparatus according to claim 12 , wherein said substrate carriage picks up said substrate from said transfer plate and passes through said passage at said interface between said process station and said cassette station in a constant moving speed when scanned by said substrate scanner.
15. The substrate processing apparatus according to claim 1 , wherein said process station comprises a resist coating unit and a developing process unit.
16. The substrate processing apparatus according to claim 1 , wherein said process station comprises a chemical mechanical polishing (CMP) station.
17. The substrate processing apparatus according to claim 1 , wherein said process station comprises an etching station.
18. A substrate processing apparatus, comprising:
a process station for processing a substrate;
a cassette station integrated with said process station;
a compartment wall disposed at an interface between said cassette station and said process station, wherein said compartment wall is provided with a passage, which allows a robot arm in said cassette station to transfer said substrate between said process station and said cassette station;
a substrate carriage equipped for transferring said substrate between said process station and said cassette station through said passage located at said interface between said process station and said cassette station; and
two substrate scanners disposed in the compartment wall at said interface between said process station and said cassette station for capturing surface image data during transportation of said substrate that passes through said passage, wherein said two substrate scanners scan a top surface and a rear surface of said substrate, respectively.