Semiconductor device, manufacturing method thereof, and display device including the semiconductor device
To improve field-effect mobility and reliability of a transistor including an oxide semiconductor film. Provided is a semiconductor device including an oxide semiconductor film. The semiconductor device includes a first insulating film, the oxide semiconductor film over the first insulating film, a second insulating film and a third insulating film over the oxide semiconductor film, and a gate electrode over the second insulating film. The oxide semiconductor film includes a first oxide semiconductor film, a second oxide semiconductor film over the first oxide semiconductor film, and a third oxide semiconductor film over the second oxide semiconductor film. The first to third oxide semiconductor films contain the same element. The second oxide semiconductor film includes a region where the crystallinity is lower than the crystallinity of one or both of the first oxide semiconductor film and the third oxide semiconductor film.
1. A semiconductor device comprising:
an oxide semiconductor film;
a gate insulating film over the oxide semiconductor film; and
a gate electrode over the gate insulating film,
wherein the oxide semiconductor film comprises:
a first oxide semiconductor film;
a second oxide semiconductor film over the first oxide semiconductor film; and
a third oxide semiconductor film over the second oxide semiconductor film,
wherein the second oxide semiconductor film comprises a region where crystallinity is lower than crystallinity of one or both of the first oxide semiconductor film and the third oxide semiconductor film,
wherein each of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film comprises In, M, and Zn, and
wherein the M represents Al, Ga, Y, or Sn.
2. The semiconductor device according to claim 1 ,
wherein an atomic ratio between In, M, and Zn is that M is greater than or equal to 1.5 and less than or equal to 2.5 and Zn is greater than or equal to 2 and less than or equal to 4 when In is 4.
3. The semiconductor device according to claim 1 ,
wherein an atomic ratio between In, M, and Zn is that M is greater than or equal to 0.5 and less than or equal to 1.5 and Zn is greater than or equal to 5 and less than or equal to 7 when In is 5.
4. The semiconductor device according to claim 1 ,
wherein the second oxide semiconductor film is a composite oxide semiconductor that comprises a first region and a second region,
wherein the first region comprises In a M b Zn c O d ,
wherein M represents Al, Ga, Y, or Sn,
wherein a, b, c, and d each represent a given number,
wherein the second region comprises In x Zn y O z , and
wherein x, y, and z each represent a given number.
5. The semiconductor device according to claim 1 ,
wherein the second oxide semiconductor film comprises a region thicker than one or both of the first oxide semiconductor film and the third oxide semiconductor film.
6. A semiconductor device comprising:
an oxide semiconductor film;
a gate insulating film over the oxide semiconductor film; and
a gate electrode over the gate insulating film,
wherein the oxide semiconductor film comprises:
a first oxide semiconductor film;
a second oxide semiconductor film over the first oxide semiconductor film; and
a third oxide semiconductor film over the second oxide semiconductor film,
wherein the second oxide semiconductor film comprises a region where crystallinity is lower than crystallinity of one or both of the first oxide semiconductor film and the third oxide semiconductor film,
wherein each of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film comprises In, M, and Zn,
wherein the M represents Al, Ga, Y, or Sn,
wherein one or both of the first oxide semiconductor film and the third oxide semiconductor film comprise a crystal part, and
wherein the crystal part has c-axis alignment.
7. The semiconductor device according to claim 6 ,
wherein an atomic ratio between In, M, and Zn is that M is greater than or equal to 1.5 and less than or equal to 2.5 and Zn is greater than or equal to 2 and less than or equal to 4 when In is 4.
8. The semiconductor device according to claim 6 ,
wherein an atomic ratio between In, M, and Zn is that M is greater than or equal to 0.5 and less than or equal to 1.5 and Zn is greater than or equal to 5 and less than or equal to 7 when In is 5.
9. The semiconductor device according to claim 6 ,
wherein the second oxide semiconductor film is a composite oxide semiconductor that comprises a first region and a second region,
wherein the first region comprises In a M b Zn c O d ,
wherein M represents Al, Ga, Y, or Sn,
wherein a, b, c, and d each represent a given number,
wherein the second region comprises In x Zn y O z , and
wherein x, y, and z each represent a given number.
10. The semiconductor device according to claim 6 ,
wherein the second oxide semiconductor film comprises a region thicker than one or both of the first oxide semiconductor film and the third oxide semiconductor film.