Processing system, processing method, measurement apparatus, substrate processing apparatus and article manufacturing method
The present invention provides a processing system that includes a first apparatus and a second apparatus, and processes a substrate, wherein the first apparatus includes a first measurement unit configured to detect a first structure and a second structure different from the first structure provided on the substrate, and measure a relative position between the first structure and the second structure, and the second apparatus includes an obtainment unit configured to obtain the relative position measured by the first measurement unit, a second measurement unit configured to detect the second structure and measure a position of the second structure, and a control unit configured to obtain a position of the first structure based on the relative position obtained by the obtainment unit and the position of the second structure measured by the second measurement unit.
1. A processing system that comprises a first apparatus and a second apparatus, and processes a substrate, wherein
the first apparatus comprises
a first measurement unit configured to detect a first structure and a second structure different from the first structure provided on the substrate, and measure a relative position between the first structure and the second structure, and
the second apparatus comprises
an obtainment unit configured to obtain the relative position measured by the first measurement unit,
a second measurement unit configured to detect the second structure and measure a position of the second structure, and
a control unit configured to obtain a position of the first structure based on the relative position obtained by the obtainment unit and the position of the second structure measured by the second measurement unit.
2. The system according to claim 1 , wherein
the control unit performs control for aligning the substrate to a target position and processing the substrate in accordance with the position of the first structure.
3. The system according to claim 1 , wherein
the first structure and the second structure are provided in different layers on the substrate.
4. The system according to claim 1 , wherein
the first structure includes an alignment mark provided in a target layer to be aligned on the substrate, and
the second structure includes an alignment mark provided in a layer different from the target layer on the substrate.
5. The system according to claim 1 , wherein
the first structure includes an overlay inspection mark provided on the substrate, and
the second structure includes an alignment mark provided on the substrate.
6. The system according to claim 1 , wherein
the second measurement unit captures the second structure and obtains an image including information regarding the position of the second structure,
the first structure includes an alignment mark provided in a target layer to be aligned on the substrate, and
the second structure includes a device pattern provided in a layer different from the target layer on the substrate.
7. The system according to claim 6 , wherein
the first measurement unit obtains an image by capturing the first structure and a plurality of the second structures existing around the first structure and provided in the different layer and,
the first apparatus further comprises a selection unit configured to select the second structure to be measured by the second measurement unit from the plurality of the second structures based on contrasts in portions corresponding to the plurality of the second structures, respectively, included in the image obtained by the first measurement unit,
the obtainment unit obtains position information indicating a position of the second structure selected by the selection unit and the image obtained by the first measurement unit, and
the second measurement unit captures the second structure selected by the selection unit in accordance with the position information obtained by the obtainment unit, and obtains a position of the second structure selected by the selection unit based on an image including information regarding the position of the second structure and the image obtained by the first measurement unit.
8. The system according to claim 7 , wherein
the selection unit compares the contrasts in the portions corresponding to the plurality of the second structures, respectively, included in the image obtained by the first measurement unit, and selects the second structure corresponding to the portion having the highest contrast as the second structure to be measured by the second measurement unit.
9. The system according to claim 7 , wherein
the first apparatus further comprises a generation unit configured to generate a correction image by removing an influence of an aberration of the first measurement unit from the image obtained by the first measurement unit,
the obtainment unit obtains, as the image obtained by the first measurement unit, the correction image generated by the generation unit, and
the second measurement unit captures the second structure selected by the selection unit in accordance with the position information obtained by the obtainment unit, and obtains a position of the second structure selected by the selection unit based on an image, which is obtained by removing an influence of an aberration of the second measurement unit from an image including information regarding the position of the second structure, and the correction image.
10. The system according to claim 7 , wherein
the first apparatus further comprises a generation unit configured to generate a correction image by, with respect to the image obtained by the first measurement unit, removing an influence of an aberration of the first measurement unit and adding an influence of an aberration of the second measurement unit, and
the obtainment unit obtains, as the image obtained by the first measurement unit, the correction image generated by the generation unit.
11. The system according to claim 1 , wherein
the first measurement unit detects the first structure and the second structure under the same detection condition same as a detection condition under which the second measurement unit detects the second structure.
12. The system according to claim 1 , wherein
the first measurement unit includes
a first measurement device configured to detect the first structure and measure a position of the first structure, and
a second measurement device configured to detect the second structure and measure a position of the second structure.
13. The system according to claim 12 , wherein
the first measurement device detects the first structure using one of infrared light, an X-ray, and an ultrasonic wave.
14. The system according to claim 1 , wherein
the second structure includes a unique texture of the substrate.
15. The system according to claim 14 , wherein
the unique texture includes one of a polishing mark, a grain boundary, an edge, and a notch.
16. An article manufacturing method comprising:
forming a pattern on a substrate using a processing system defined in claim 1 ;
processing the substrate on which the pattern is formed in the forming; and
manufacturing an article from the processed substrate.
17. A processing method of processing a substrate using a first apparatus that includes a first measurement unit and a second apparatus that includes a second measurement unit, wherein
in the first apparatus,
by the first measurement unit, a first structure and a second structure different from the first structure provided on the substrate are detected, and a relative position between the first structure and the second structure is measured, and
in the second apparatus,
the relative position measured by the first apparatus is obtained,
by the second measurement unit, the second structure is detected, and a position of the second structure is measured, and
a position of the first structure is obtained based on the relative position and the position of the second structure measured by the second apparatus.
18. A measurement apparatus comprising:
a first measurement unit configured to obtain an image by capturing a first structure and a second structure different from the first structure provided on a substrate, and detect the first structure and the second structure, thereby measuring a relative position between the first structure and the second structure; and
an output unit configured to output a relative position between the first structure and the second structure, the relative position being measured by the first measurement unit, to a substrate processing apparatus that processes the substrate,
wherein
the substrate processing apparatus comprises
an obtainment unit configured to obtain the relative position output from the output unit,
a second measurement unit configured to detect the second structure and measure a position of the second structure, and
a control unit configured to obtain a position of the first structure based on the relative position obtained by the obtainment unit and the position of the second structure measured by the second measurement unit.
19. The apparatus according to claim 18 , wherein
letting L be a relative distance between the first structure and the second structure and S be a size of the second structure,
L/S>3 is satisfied.
20. The apparatus according to claim 18 , further comprising
an interface used by a user to designate the first structure and the second structure to be detected by the first measurement unit.
21. The apparatus according to claim 18 , further comprising a selection unit configured to select, based on contrasts in portions corresponding to a plurality of the second structures, respectively, included in the image obtained by the first measurement unit, the second structure to be measured by the second measurement unit from the plurality of the second structures,
wherein the output unit outputs the a relative position between the first structure and the second structure selected by the selection unit to the substrate processing apparatus, and
the second measurement unit detects the second structure selected by the selection unit and measure the position of the second structure.
22. A substrate processing apparatus for processing a substrate, the apparatus comprising:
an obtainment unit configured to obtain a relative position between a first structure and a second structure different from the first structure provided on the substrate, the relative position being measured by an external measurement apparatus;
a measurement unit configured to measure a position of the second structure; and
a control unit configured to obtain a position of the first structure based on the relative position obtained by the obtainment unit and the position of the second structure measured by the measurement unit.
23. The apparatus according to claim 22 , wherein
the obtainment unit obtains information of the second structure to be measured by the measurement unit among a plurality of the second structures, and
the measurement unit measures a position of the second structure selected based on the information of the second structure obtained by the obtainment unit.