Focus-less inspection apparatus and method
An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
1. An apparatus comprising:
a structured-light source configured to sequentially radiate a plurality of structured lights having a predetermined phase range;
at least one lens configured to adjust optical paths of the plurality of structured lights such that each light beam of the plurality of structured lights corresponding to each phase of the phase range is divided into and incident on each point of a region on an object, rather than being focused at one point of the region on the object;
an image sensor configured to capture a plurality of reflected lights generated by the plurality of structured lights reflected from the region;
a memory that stores reference information on an inclination of the region; and
a processor configured to:
acquire light quantity values of the plurality of reflected lights from the image sensor; and
derive an angle of the region with respect to a reference plane based on the light quantity values and the reference information.
2. The apparatus of claim 1 , wherein the reference information indicates a relation between the angle of the region and the light quantity values of the plurality of reflected lights.
3. The apparatus of claim 1 , wherein the phase range is not an integer multiple of a period of the plurality of structured lights.
4. The apparatus of claim 1 , wherein the plurality of structured lights are generated by phase-shifting one structured light by a predetermined phase interval.
5. The apparatus of claim 1 , wherein the plurality of structured lights have the same predetermined phase range.
6. A method, comprising:
sequentially radiating, by a structured-light source, a plurality of structured lights having a predetermined phase range;
adjusting, by at least one lens, optical paths of the plurality of structured lights such that each light beam of the plurality of structured lights corresponding to each phase of the phase range is divided into and incident on each point of a region on an object, rather than being focused at one point of the region on the object;
capturing, by an image sensor, a plurality of reflected lights generated by the plurality of structured lights reflected from the region;
acquiring, by a processor, light quantity values of the plurality of reflected lights from the image sensor; and
deriving, by the processor, an angle of the region with respect to a reference plane based on the light quantity values and reference information on an inclination of the region stored in a memory.
7. The method of claim 6 , wherein the reference information indicates a relation between the angle of the region and the light quantity values of the plurality of reflected lights.
8. The method of claim 6 , wherein the phase range is not an integer multiple of a period of the plurality of structured lights.
9. The method of claim 6 , wherein the plurality of structured lights are generated by phase-shifting one structured light by a predetermined phase interval.
10. The method of claim 6 , wherein the plurality of structured lights have the same predetermined phase range.