Radiation amount determination for an intended surface property level

1. A method comprising:

detecting a surface property level of a fabricated three-dimensional (3D) object;

identifying an intended surface property level for the surface of the 3D object, wherein the surface property comprises at least one of roughness, texture, color, gloss, electrical conductivity, electrical resistivity, and tribological properties;

accessing data identifying correlations between a plurality of surface property levels and flash applied radiation amounts;

determining, based on the identified correlations and using the detected surface property level as an initial surface property level, an amount of radiation to be applied as a flash of radiation by a radiation source onto the surface that modifies the initial property level to obtain the intended surface property level; and

outputting to the radiation source the determined amount of radiation to be applied as a flash onto the surface.

2. The method according to claim 1 ,

wherein the correlations are based upon a particular type of the radiation source.

3. The method according to claim 1 , further comprising:

determining, from the intended surface property level, a pattern to be formed on the surface, wherein the pattern contributes to obtaining the intended surface property level on the surface;

determining the amount of radiation to be applied as the flash of radiation to further cause a material for forming the pattern on the surface to at least partially melt and flow;

controlling a forming component to form the pattern on the surface using the material; and

causing the radiation source to apply the determined amount of radiation as the flash of radiation onto the surface of the 3D object, subsequent to forming the pattern, so as to cause the pattern material to at least partially melt and flow.

4. The method of claim 1 ,

wherein the radiation source is one of a xenon lamp, a quartz tungsten halogen lamp, and a laser.

5. The method of claim 1 , wherein determining the amount of radiation to be applied comprises determining an intensity level, a duration, or both, at which the radiation is to be flash applied, wherein when the duration is determined, the duration is a time period between about 200 microseconds (μs) and about 2 seconds (s) depending upon the radiation source.

6. A non-transitory computer readable medium on which is stored machine readable instructions that when executed by a processor cause the processor to:

identify an intended surface property level for a surface of a fabricated three-dimensional (3D) object, wherein the surface property comprises at least one of roughness, texture, color, gloss, electrical conductivity, electrical resistivity, and tribological properties;

access data identifying correlations between a plurality of surface property levels and flash applied radiation amounts;

determine, based upon the identified correlations and using a detected surface property level of the surface as an initial surface property level, an amount of radiation to be applied by a radiation source as a flash of radiation onto the surface that modifies the initial property level to obtain the intended surface property level; and

output to the radiation source the determined amount of radiation to be applied as flash of radiation.

7. The non-transitory computer readable medium according to claim 6 , wherein the instructions further cause the processor to:

determine an intensity level, a duration, or both at which the radiation is to be applied as a flash of radiation onto the surface based upon the identified correlations in the accessed data.

8. The non-transitory computer readable medium according to claim 6 , wherein the instructions further cause the processor to:

determine, from the intended surface property level, a pattern to be formed on the surface, wherein the pattern contributes to obtaining the intended surface property level on the surface;

determine the amount of radiation to be applied as the flash of radiation to further cause a material for forming the pattern on the surface to at least partially melt and flow;

control a forming component to form the pattern of material on the surface; and

cause the radiation source to apply the determined amount of radiation as the flash of radiation onto the surface of the 3D object, subsequent to forming the pattern, so as to cause the pattern material to at least partially melt and flow.

9. The non-transitory computer readable medium according to claim 6 , wherein the instructions further cause the processor to:

determine an intensity level, a duration, or both, at which the radiation is to be applied as flash of radiation, wherein when the duration is determined, the duration is a time period between about 200 microseconds (μs) and about 2 seconds (s) depending upon the radiation source.

10. A system comprising:

a radiation source that applies radiation;

a processor;

a sensor that collects data associated with a surface of a fabricated three-dimensional (3D) object and communicates the data to the processor; and

a memory that stores machine readable instructions that cause the processor to:

identify an intended surface property level for the surface of the 3D object, wherein the surface property comprises at least one of roughness, texture, color, gloss, electrical conductivity, electrical resistivity, and tribological properties;

using the data collected by the sensor, determine a detected surface property level of the surface;

access data identifying correlations between a plurality of surface property levels and flash applied radiation amounts;

determine, based upon the identified correlations and using the detected surface property level as an initial surface property level, an amount of radiation to be applied as a flash of radiation onto the surface that modifies the initial surface property level to obtain the intended surface property level; and

cause the radiation source to apply the determined amount of radiation as the flash of radiation onto the surface of the 3D object.

11. The system of claim 10 , wherein, to determine the amount of radiation to be applied, the memory that stores machine readable instructions causes the processor to: determine an intensity level, a duration, or both, at which the radiation is to be flash applied, wherein when the duration is determined, the duration is a time period between about 200 microseconds (μs) and about 2 seconds (s) depending upon the radiation source.

12. The system claim 10 , wherein the memory that stores machine readable instructions causes the processor to: cause the radiation source to apply the determined amount of radiation, wherein the radiation source is one of a xenon lamp, a quartz tungsten halogen lamp, and a laser.

13. The system of claim 10 , wherein the correlations are based upon a particular type of the radiation source.

14. The system of claim 10 , wherein the memory that stores machine readable instructions causes the processor to:

using the data collected by the sensor, identify a color of the surface in addition to the detected surface property level of the surface; and

access data identifying correlations between the plurality surface property levels, flash applied radiation amounts, and colors;

wherein determining the amount of radiation to be applied as the flash of radiation onto the surface is further based upon the correlations identified between the plurality of surface property levels, flash applied radiation amounts, and colors.

15. The system of claim 10 , wherein the memory that stores machine readable instructions causes the processor to:

determine, from the intended surface property level, a pattern to be formed on the surface, wherein the pattern contributes to obtaining the intended surface property level on the surface;

determine the amount of radiation to be applied as the flash of radiation to further cause a material for forming the pattern on the surface to at least partially melt and flow;

control a forming component to form the pattern on the surface using the material; and

cause the radiation source to apply the determined amount of radiation as the flash of radiation onto the surface of the 3D object, subsequent to forming the pattern, so as to cause the pattern material to at least partially melt and flow.

16. The system of claim 10 , wherein the intended surface property level has a surface roughness value that is greater than a surface roughness value of the detected surface property level.

17. The system of claim 10 , wherein the intended surface property level has a surface roughness value that is less than a surface roughness value of the detected surface property level.

18. The system of claim 10 , wherein the intended surface property level is a texture that is different from a texture of the detected surface property level.