Multi-gate device and method of fabrication thereof
A semiconductor device includes a fin extending from a substrate. The fin has a source/drain region and a channel region. The channel region includes a first semiconductor layer and a second semiconductor layer disposed over the first semiconductor layer and vertically separated from the first semiconductor layer by a spacing area. A high-k dielectric layer at least partially wraps around the first semiconductor layer and the second semiconductor layer. A metal layer is formed along opposing sidewalls of the high-k dielectric layer. The metal layer includes a first material. The spacing area is free of the first material.
1. A method of forming a semiconductor device, the method comprising:
providing a fin within a first region having a first plurality of channel layers;
forming an interfacial layer and a dielectric layer at least partially wrapping around each channel layer of the first plurality of channel layers; and
forming a metal layer within the first region, wherein the metal layer is for performing a scavenging process;
wherein a distance between adjacent channel layers of the first plurality of channel layers is determined based on a predetermined threshold.
2. The method of claim 1 , wherein the interfacial layer and the dielectric layer provide an interposing feature that fills a gap between the adjacent channel layers of the first plurality of channel layers.
3. The method of claim 2 , wherein the forming the metal layer further includes forming the metal layer along opposing sidewalls of the interposing feature.
4. The method of claim 1 , where the interfacial layer includes an oxide-containing material.
5. The method of claim 1 , wherein the adjacent channel layers have a cross-sectional profile determined based on the predetermined threshold.
6. The method of claim 1 , wherein each of the adjacent channel layers has a rounded profile.
7. The method of claim 1 , wherein the metal layer within the first region is for performing the scavenging process to at least the interfacial layer, and wherein the scavenging process is performed to tune at least one of a flat band voltage and a threshold voltage of the semiconductor device.
8. The method of claim 1 , wherein the scavenging process is performed to reduce the equivalent oxide thickness (EOT) of the semiconductor device.
9. The method of claim 1 , wherein the predetermined threshold includes a predetermined scavenging threshold of the scavenging process.
10. The method of claim 1 , wherein each channel layer of the first plurality of channel layers includes silicon germanium or germanium.
11. A method, comprising:
forming a gap between adjacent semiconductor channel layers within a channel region of a fin element;
forming an interposing feature in the channel region including a dielectric layer at least partially wrapping around each semiconductor channel layer of the adjacent semiconductor channel layers; and
depositing a metal layer proximate to the interposing feature, wherein the metal layer is for performing a scavenging process to the interposing feature.
12. The method of claim 11 , wherein the gap is substantially free of the metal layer.
13. The method of claim 11 , wherein the depositing the metal layer includes depositing a scavenging metal layer at least partially wrapping around the interposing feature.
14. The method of claim 11 , wherein the interposing feature includes:
a first interfacial layer portion at least partially wrapping around a first semiconductor layer of the adjacent semiconductor channel layers; and
a second interfacial layer portion at least partially wrapping around a second semiconductor layer of the adjacent semiconductor channel layers;
wherein the dielectric layer at least partially wraps around the first interfacial layer portion and the second interfacial layer portion.
15. The method of claim 14 , further comprising:
performing an annealing process to the metal layer to perform the scavenging process to the first interfacial layer portion and second interfacial layer portion.
16. The method of claim 11 , wherein a distance between the adjacent semiconductor channel layers is determined based on a predetermined scavenging threshold of the scavenging process to the interposing feature.
17. The method of claim 11 , wherein at least one semiconductor channel layer of the adjacent semiconductor channel layers has a profile determined based on a predetermined scavenging threshold of the scavenging process to the interposing feature.
18. The method of claim 11 , wherein the depositing the metal layer further includes depositing the metal layer along opposing sidewalls of the interposing feature.
19. The method of claim 11 , where the interposing feature includes an oxide-containing material.
20. The method of claim 11 , wherein each of the adjacent semiconductor channel layers has a rounded profile.