Method for manufacturing sputtering target, method for forming oxide film, and transistor
A method for manufacturing a sputtering target with which an oxide semiconductor film with a small amount of defects can be formed is provided. Alternatively, an oxide semiconductor film with a small amount of defects is formed. A method for manufacturing a sputtering target is provided, which includes the steps of: forming a polycrystalline In-M-Zn oxide (M represents a metal chosen among aluminum, titanium, gallium, yttrium, zirconium, lanthanum, cesium, neodymium, and hafnium) powder by mixing, sintering, and grinding indium oxide, an oxide of the metal, and zinc oxide; forming a mixture by mixing the polycrystalline In-M-Zn oxide powder and a zinc oxide powder; forming a compact by compacting the mixture; and sintering the compact.
1. A semiconductor device comprising:
a gate electrode;
a gate insulating film over the gate electrode;
a first oxide film over the gate insulating film, the first oxide film comprising In, Ga and Zn;
a second oxide film over the first oxide film, the second oxide film comprising In, Ga and Zn; and
a source electrode and a drain electrode over the second oxide film,
wherein the first oxide film comprises a microcrystal,
wherein the second oxide film comprises a c-axis aligned crystal part, and
wherein an atomic ratio of metal elements of the second oxide film satisfies Zn>Ga and Ga>In.
2. The semiconductor device according to claim 1 , wherein the c-axes of the c-axis aligned crystal part are aligned in a direction parallel to a normal vector of a surface where the second oxide film is formed or a top surface of the second oxide film.
3. The semiconductor device according to claim 1 ,
wherein a direction of an a-axis of a first region of the second oxide film is different from a direction of an a-axis of a second region of the second oxide film, and
wherein a direction of a b-axis of the first region of the second oxide film is different from a direction of a b-axis of the second region of the second oxide film.
4. The semiconductor device according to claim 1 , wherein an electron diffraction pattern of the second oxide film shows a plurality of bright spots.
5. The semiconductor device according to claim 1 ,
wherein the second oxide film comprises crystals aligned in a c-axis direction in the c-axis aligned crystal part, and
wherein a size of the crystals of the second oxide film is greater than or equal to 1 nm and less than or equal to 100 nm.