IP Library › Granted Patent US 11,978,614
Granted Patent B2
US 11,978,614 · App. 16/903,571 · Granted May 7, 2024

Substrate processing apparatus

Inventors: Yusuke Hayasaka (Miyagi, JP); Jun Young Chung (Hwaseong-si, KR); Shuhei Yamabe (Miyagi, JP); Keiichi Yamaguchi (Miyagi, JP); Takehiro Tanikawa (Miyagi, JP)
Assignee: TOKYO ELECTRON LIMITED
H01J37/32522H01J37/32449H01J37/32477H01J37/32651H01J37/32743H01J2237/334
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Quick Facts
Patent No.
US 11,978,614
App. No.
16/903,571
Granted
May 7, 2024
Kind
B2
Abstract

A substrate processing apparatus includes a chamber having a plasma processing space, a sidewall of the chamber having an opening for transferring a substrate into the plasma processing space; and a shutter disposed at an inner side than the sidewall and configured to open or close the opening, the shutter having a flow path for a temperature-controlled fluid.

Claims (28)

1. A substrate processing apparatus, comprising:

a chamber having an internal space, the chamber having an opening for transferring a substrate from and to the internal space; and

a shutter configured to open and close the opening in the internal space, the shutter having a flow path for a temperature-controlled fluid, the flow path having:

an inlet,

a first supply path and a second supply path being branched from the inlet, the first and second supply paths extending upwards from the inlet while going back and forth in a horizontal direction,

a first return path being connected with the first supply path and extending downwards from the first supply path while going back and forth in a horizontal direction,

a first outlet being connected with the first return path,

a second return path being connected with the second supply path and extending downwards from the second supply path while going back and forth in a horizontal direction, and

a second outlet being connected with the second return path.

2. The substrate processing apparatus of claim 1 ,

wherein the first return path extends along the first supply path, the second return path extends along the second supply path.

3. The substrate processing apparatus of claim 1 ,

wherein the shutter comprises:

a body having a first face; and

a cover member covering the first face,

wherein the first face and the cover member define the flow path.

4. The substrate processing apparatus of claim 3 ,

wherein the flow path is defined by a groove formed on at least one of the first face or the cover member.

5. The substrate processing apparatus of claim 1 , further comprising:

a fluid supply configured to supply the temperature-controlled fluid into the flow path;

a heater configured to heat the shutter; and

a control device,

wherein the control device controls the heater to control a temperature of the shutter.

6. The substrate processing apparatus of claim 5 , further comprising:

an annular protection member defining the internal space,

wherein the control device is configured to control the temperature of the shutter to reduce a temperature difference between the annular protection member and the shutter.

7. The substrate processing apparatus of claim 1 ,

wherein the shutter is fabricated by using a 3D printer technology or an additive manufacturing technology.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2020
From: HAYASAKA, YUSUKE; CHUNG, JUN YOUNG; YAMABE, SHUHEI; YAMAGUCHI, KEIICHI; TANIKAWA, TAKEHIRO
To: TOKYO ELECTRON LIMITED
Reel/Frame 052960/0957 →
Priority Claims (2)
JP 2019-113135 · Jun 18, 2019 · national
JP 2020-028711 · Feb 21, 2020 · national
Continuity (1)
Related Publication 20200402775A1 · Dec 24, 2020