IP Library Granted Patent US 12,027,367
Granted Patent B2
US 12,027,367 · App. 17/452,125 · Granted Jul 2, 2024

Substrate treatment apparatus and manufacturing method of semiconductor device

Inventors: Masayuki Kitamura (Yokkaichi, JP); Takayuki Beppu (Yokkaichi, JP); Tomotaka Ariga (Yokkaichi, JP)
Assignee: Kioxia Corporation
H01L21/0262C23C16/14C23C16/4408C23C16/4412C23C16/45534H01L21/28556H01L21/30604H01L21/67253
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Quick Facts
Patent No.
US 12,027,367
App. No.
17/452,125
Granted
Jul 2, 2024
Kind
B2
Abstract

In a manufacturing method of a semiconductor device according to one embodiment, a first gas containing a first metal element is introduced into a chamber having a substrate housed therein. Next, the first gas is discharged from the chamber using a purge gas. Subsequently, a second gas reducing the first gas is introduced into the chamber. Next, the second gas is discharged from the chamber using the purge gas. Further, a third gas different from the first gas, the second gas, and the purge gas is introduced into the chamber at least either at a time of discharging the first gas or at a time of discharging the second gas.

Claims (7)

1. A substrate treatment apparatus comprising:

a chamber having a substrate housed therein;

a head configured to repeatedly introduce a first gas containing a first metal element, a second gas reducing the first gas, and a purge gas into the chamber; and

a light source configured to irradiate a specific light to the substrate at a time of introducing the purge gas,

wherein the chamber is divided into a first chamber configured to introduce the first gas therein, a second chamber adjacent to the first chamber and configured to introduce the purge gas therein, a third chamber adjacent to the second chamber and configured to introduce the second gas therein, and a fourth chamber adjacent to the third chamber and the first chamber and configured to introduce the purge gas therein.

2. The apparatus of claim 1 , further comprising a stage configured to move the substrate at least from the first chamber to the fourth chamber.

3. The apparatus of claim 2 , wherein the light source is placed on a boundary portion between the fourth chamber and the first chamber.

Assignments (1)
CHANGE OF NAME Recorded Feb 10, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 059004/0001 →
Priority Claims (1)
JP 2019-047313 · Mar 14, 2019 · national
Continuity (2)
Division 16567269 · Sep 11, 2019
Related Publication 20220044925A1 · Feb 10, 2022