RF current measurement in semiconductor processing tool
A method of plasma-assisted semiconductor processing in multiple stations in a process chamber is provided. The method comprises: a) providing substrates at each of the multiple stations; b) distributing RF power to multiple stations to thereby generate a plasma in the station, wherein the RF power is distributed according to a RF power parameter that is adjusted to reduce station to station variations; c) tuning a frequency of the RF power, wherein tuning the frequency includes: i) measuring a current of the plasma; ii) determining, according to the current measured in (i), a change to the frequency of the RF power, and iii) adjusting the frequency of the RF power; and d) performing a semiconductor processing operation on the substrate at each station.
1. A method of plasma-assisted semiconductor processing in multiple stations in a process chamber, the method comprising:
a) providing substrates at each of the multiple stations;
b) distributing RF power to multiple stations to thereby generate a plasma in the stations, wherein the RF power is distributed according to a RF power parameter that is adjusted to reduce station to station variations;
c) tuning a frequency of the RF power, wherein tuning the frequency includes:
i) measuring a current of the plasma, comprising:
a) measuring a voltage across an inductive element in a current sensor, the inductive element being electrically parallel to a capacitive element in the current sensor, the inductive element being electrically inline relative to plasma current flow towards the process chamber for generating and maintaining the plasma; and
b) converting the measured voltage across the inductive element to the current of the plasma based in part by applying a linear proportionality factor dependent on a RF power frequency of the plasma,
ii) determining, according to the current measured in (i), a change to the frequency of the RF power, and
iii) adjusting the frequency of the RF power; and
d) performing a semiconductor processing operation on the substrate at each station.
2. The method of claim 1 , wherein the semiconductor processing operation is one of: depositing, etching, stripping, or cleaning a thin film.
3. The method of claim 1 , wherein the measured voltage (V) across the inductive element (L) at the RF power frequency of the plasma (f) is converted to the current (I) of the plasma based in part on I=V/2πfL, wherein the linear proportionality factor is represented by ½πfL.
4. The method of claim 3 , wherein the capacitive element and inductive element are integrated on a printed circuit board.
5. The method of claim 1 , wherein the capacitive element has a capacitive value of less than or equal to about 0.017 pF.
6. The method of claim 1 , wherein the inductive element has an inductance value of less than or equal to about 610 nH.
7. The method of claim 4 , wherein the capacitive element has a capacitance value C=εA/d, where ε is a dielectric constant, A is an area of the capacitive element, and d is a distance between electrodes of the capacitive element.
8. The method of claim 1 , wherein the linear proportionality factor is determined in part by an impedance Z of the inductive element at the RF power frequency of the plasma.
9. The method of claim 1 , wherein the linear proportionality factor is determined in part by determining a resonant frequency ores of the current sensor.
10. The method of claim 9 , wherein the linear proportionality factor is determined in part by determining an impedance Z of the current sensor over a frequency range that includes a resonant frequency ores.
11. The method of claim 10 , wherein the linear proportionality factor is determined in part by determining an inductance value L of the inductive element and a capacitance value C of the capacitive element.
12. The method of claim 11 , wherein the RF power frequency is a frequency of about 13.56 MHz.
13. The method of claim 12 , wherein the RF power frequency is modified to an adjusted RF power frequency, and further wherein i) is repeated with the current sensor at the adjusted RF power frequency using a second linear proportionality factor.
14. A method of plasma-assisted semiconductor processing in a process chamber, the method comprising:
a) measuring a voltage across an inductive element in a current sensor, the inductive element being electrically parallel to a capacitive element in the current sensor, the inductive element being electrically inline relative to plasma current flow towards the process chamber for generating and maintaining the plasma; and
b) converting the measured voltage across the inductive element to the current of the plasma based in part by applying a linear proportionality factor dependent on a RF power frequency of the plasma for performing a semiconductor processing operation on a substrate at a station in the process chamber.
15. The method of claim 14 , wherein the measured voltage (V) across the inductive element (L) at the RF power frequency of the plasma (f) is converted to the current (I) of the plasma based in part on I=V/2πfL, wherein the linear proportionality factor is represented by ½πfL.
16. The method of claim 14 , wherein:
the linear proportionality factor is determined in part by an impedance Z of the inductive element at the RF power frequency of the plasma;
the linear proportionality factor is determined in part by determining a resonant frequency ores of the current sensor;
the linear proportionality factor is determined in part by determining an impedance Z of the current sensor over a frequency range that includes a resonant frequency ores; or
the linear proportionality factor is determined in part by determining an inductance value L of the inductive element and a capacitance value C of the capacitive element.
17. The method of claim 14 , further comprising modifying the RF power frequency to an adjusted RF power frequency, and measuring the current of the plasma with the current sensor at the adjusted RF power frequency using a second linear proportionality factor.
18. The method of claim 14 , further comprising:
a) providing substrates at each of multiple stations in the process chamber;
b) distributing RF power to multiple stations to thereby generate a plasma in the stations, wherein the RF power is distributed according to a RF power parameter that is adjusted to reduce station to station variations;
c) tuning a frequency of the RF power, wherein tuning the frequency includes:
i) measuring a current of the plasma;
ii) determining, according to the current measured in (i), a change to the frequency of the RF power; and
iii) adjusting the frequency of the RF power; and
d) performing a semiconductor processing operation on the substrate at each station.
19. The method of claim 14 , wherein the semiconductor processing operation is one of: depositing, etching, stripping, or cleaning a thin film.