IP Library › Granted Patent US 12,119,803
Granted Patent B2
US 12,119,803 · App. 18/449,098 · Granted Oct 15, 2024

Bulk acoustic wave resonators having convex surfaces, and methods of forming the same

Inventor: Ting-Ta Yen (San Jose, CA)
Assignee: TEXAS INSTRUMENTS INCORPORATED
H03H9/0211H03H3/02H03H9/02015H03H9/02157H03H2003/021H03H2003/025H03H9/02047H03H9/172
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Quick Facts
Patent No.
US 12,119,803
App. No.
18/449,098
Granted
Oct 15, 2024
Kind
B2
Abstract

In one example, a method of forming a bulk acoustic wave (BAW) resonator comprises: forming an electrode on at least one of a semiconductor substrate, a sacrificial layer, or an acoustic reflector; and forming a piezoelectric layer on the electrode, the piezoelectric layer having a convex surface.

Claims (27)

1. A method, comprising:

forming an electrode of a bulk acoustic wave (BAW) resonator on at least one of a semiconductor substrate, a sacrificial layer, or an acoustic reflector; and

forming a piezoelectric layer of the BAW resonator on the electrode, in which the electrode covers entirely a surface of the piezoelectric layer, and the piezoelectric layer has a convex portion with a non-uniform thickness.

2. The method of claim 1 , wherein the surface of the piezoelectric layer is a planar surface, and the convex portion has a convex surface opposing the planar surface.

3. The method of claim 1 , wherein forming the piezoelectric layer on the electrode includes:

forming a piezoelectric material on the electrode; and

setting a shape of the piezoelectric material to form the piezoelectric layer having the convex portion.

4. The method of claim 3 , wherein the shape is a first shape, and setting the first shape of the piezoelectric material includes:

setting a second shape of a photoresist material on the piezoelectric material; and

etching the photoresist material having the second shape and the piezoelectric material to set the first shape of the piezoelectric material.

5. The method of claim 4 , wherein the second shape is based on a rate of etching of the piezoelectric material and the photoresist material.

6. The method of claim 4 , wherein setting a second shape of a photoresist material includes performing a gray-scale lithography operation on the photoresist material.

7. The method of claim 4 , wherein setting a second shape of a photoresist material includes performing a shaped lithography operation on the photoresist material.

8. The method of claim 4 , wherein setting a second shape of a photoresist material includes performing a sloped lithography operation on the photoresist material.

9. The method of claim 4 , wherein the convex portion is a first convex portion, and setting a second shape of a photoresist material includes forming a second convex portion on the photoresist material.

10. The method of claim 9 , wherein the first and second convex portions have convex surfaces of different curvatures.

11. The method of claim 1 , wherein the piezoelectric layer includes aluminum nitride.

12. The method of claim 1 , wherein the piezoelectric layer includes zinc oxide.

13. The method of claim 1 , wherein the electrode is a first electrode, and the method further comprises forming a second electrode of the BAW on the piezoelectric layer.

14. The method of claim 1 , further comprising:

mounting the semiconductor substrate or the acoustic reflector having the piezoelectric layer and the electrode thereon on an integrated circuit.

15. The method of claim 14 , further comprising: forming an interconnect between the electrode and the integrated circuit.

16. The method of claim 15 , wherein the interconnect includes a bond wire.

17. The method of claim 13 , wherein the surface is a first surface, and the second electrode covers entirely a second surface of the piezoelectric layer opposite the first surface.

18. The method of claim 1 , wherein the convex portion has a first thickness at a center and a second thickness on two sides of the center, the second thickness being smaller than the first thickness.

19. The method of claim 1 , wherein the convex portion has a plano-convex shape.

20. The method of claim 1 , wherein the BAW resonator is part of an integrated circuit.

Continuity (3)
Division 16902008 · Jun 15, 2020
Continuation 15639552 · Jun 30, 2017
Related Publication 20230396229A1 · Dec 7, 2023
Cited By (1)
US 12,658,875