IP Library › Granted Patent US 12,131,885
Granted Patent B2
US 12,131,885 · App. 17/554,469 · Granted Oct 29, 2024

Plasma treatment device having matching box

Inventor: Tomohiro Arakawa (Sagamihara, JP)
Assignee: ASM IP Holding B.V.
H01J37/32183H01J37/32165
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Quick Facts
Patent No.
US 12,131,885
App. No.
17/554,469
Granted
Oct 29, 2024
Kind
B2
Abstract

Examples of a plasma treatment device include an RF generator, a matching box including an input terminal connected with the RF generator, a sensor configured to sense high-frequency electricity, an impedance adjustment circuit, and an output terminal, a matching controller connected with the sensor and configured to control the impedance adjustment circuit, a reactor chamber connected with the output terminal, and a harmonic filter circuit connected with a transmission line between the sensor and the reactor chamber.

Claims (22)

1. A plasma treatment device comprising:

an RF generator;

a matching box including an input terminal connected with the RF generator, a sensor configured to sense high-frequency electricity, an impedance adjustment circuit, and an output terminal;

a matching controller connected with the sensor and configured to control the impedance adjustment circuit;

a reactor chamber connected with the output terminal;

a transmission line between the sensor and the reactor chamber;

a first harmonic filter circuit connected between the transmission line and a first ground, wherein the first harmonic filter circuit comprises a first inductor and a first capacitor in series; and

a second harmonic filter circuit connected between the transmission line and a second ground, wherein the second harmonic filter circuit comprises a second inductor and a second capacitor in series, wherein the second harmonic filter circuit is configured to reduce a second harmonic frequency of an output of the RF generator.

2. The plasma treatment device according to claim 1 , wherein the first harmonic filter circuit is provided in the matching box.

3. The plasma treatment device according to claim 1 , wherein the first harmonic filter circuit is connected to a portion of the transmission line connecting the matching box and the reactor chamber.

4. The plasma treatment device according to claim 1 , wherein the first harmonic filter circuit is configured to reduce a first harmonic frequency of an output of the RF generator.

5. The plasma treatment device according to claim 1 , wherein the RF generator outputs two kinds of high-frequency electricity having frequencies different from each other.

6. The plasma treatment device according to claim 5 , wherein the RF generator is configured to outputs first high-frequency electricity of 27 MHz or higher and second high-frequency electricity of 430 KHz or lower.

7. The plasma treatment device according to claim 6 , wherein a power of the first high-frequency electricity is equal to or higher than 3 kW.

8. The plasma treatment device according to claim 6 , wherein the sensor is configured to senses high-frequency electricity having a frequency of the first high-frequency electricity.

9. The plasma treatment device according to claim 5 , wherein the RF generator is configured to outputs first high-frequency electricity of 1 GHz or higher, and second high-frequency electricity having a frequency lower than a frequency of the first high-frequency electricity.

10. The plasma treatment device according to claim 5 , wherein a power of the first high-frequency electricity is equal to or higher than 3 kW.

11. The plasma treatment device according to claim 1 , further comprising a third harmonic filter circuit connected between the transmission line and a third ground, wherein the third harmonic filter circuit comprises a third inductor and a third capacitor in series, wherein the third harmonic filter circuit is configured to reduce a third harmonic frequency of an output of the RF generator.

12. The plasma treatment device according to claim 11 , wherein the first harmonic filter circuit consists essentially of the first inductor and the first capacitor in series, wherein the second harmonic filter circuit consists essentially of the second inductor and the second capacitor in series, and wherein the third harmonic filter circuit consists essentially of the third inductor and the third capacitor in series.

13. The plasma treatment device according to claim 1 , wherein the first harmonic filter circuit consists essentially of the first inductor and the first capacitor in series.

14. The plasma treatment device according to claim 1 , wherein the first harmonic filter circuit consists essentially of the first inductor and the first capacitor in series, and wherein the second harmonic filter circuit consists essentially of the second inductor and the second capacitor in series.

15. The plasma treatment device according to claim 1 , wherein the matching box comprises a ground terminal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2021
From: ARAKAWA, TOMOHIRO
To: ASM IP HOLDING B.V.
Reel/Frame 058425/0727 →
Continuity (2)
Provisional Application 63129542 · Dec 22, 2020
Related Publication 20220199367A1 · Jun 23, 2022
Cited By (1)
US 12,324,085