IP Library Granted Patent US 12,190,989
Granted Patent B2
US 12,190,989 · App. 18/334,261 · Granted Jan 7, 2025

Data output buffer and semiconductor apparatus including the same

Inventors: Kyu Dong Hwang (Icheon-si, KR); Bo Ram Kim (Icheon-si, KR); Dae Han Kwon (Icheon-si, KR)
Assignee: SK hynix Inc.
G11C7/1039G11C7/1057G11C7/1096H03K19/0005H03K19/01742
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Quick Facts
Patent No.
US 12,190,989
App. No.
18/334,261
Granted
Jan 7, 2025
Kind
B2
Abstract

A data output buffer includes a first driver configured to drive a data input/output (I/O) pad according to an input signal and allow data drivability to be controlled according to an impedance calibration code and a second driver configured to perform a de-emphasis operation on the data I/O pad and allow de-emphasis drivability to be controlled according to the impedance calibration code.

Claims (42)

1. A data output buffer comprising:

a first driver configured to directly receive an impedance calibration code, drive a data input/output (I/O) pad according to an input signal and allow data drivability to be controlled according to the impedance calibration code;

a second driver configured to directly receive emphasis signals, perform a de-emphasis operation on the data I/O pad and allow de-emphasis drivability to be controlled according to a selection code and the emphasis signals; and

a selection circuit configured to output one of a fixing code and the impedance calibration code as the selection code according to a selection signal,

wherein the first driver and the second driver are coupled to the data I/O pad directly.

2. The data output buffer of claim 1 , wherein the first driver includes:

a pull-up driver configured to drive the data I/O pad according to a first data signal of the input signal and allow the data drivability to be controlled according to a first impedance calibration code of the impedance calibration code; and

a pull-down driver configured to drive the data I/O pad according to a second data signal of the input signal and allow the data drivability to be controlled according to a second impedance calibration code of the impedance calibration code.

3. The data output buffer of claim 1 , wherein the second driver includes:

a pull-up driver configured to perform the de-emphasis operation according to a first emphasis signal of the emphasis signals and allow the de-emphasis drivability to be controlled according to all code bits of a first selection code of the selection code; and

a pull-down driver configured to perform the de-emphasis operation according to a second emphasis signal of the emphasis signals and allow the de-emphasis drivability to be controlled according to all code bits of a second selection code of the selection code.

4. The data output buffer of claim 1 , wherein the second driver includes:

a plurality of pull-up driving circuits configured to commonly receive a first emphasis signal the emphasis signals and receive all code bits of a first selection code of the selection code bit by bit, respectively; and

a plurality of pull-down driving circuits configured to commonly receive a second emphasis signal of the emphasis signals and receive all code bits of a second selection code of the selection code bit by bit, respectively.

5. The data output buffer of claim 1 , wherein the second driver includes:

a pull-up driver configured to perform the de-emphasis operation according to a first emphasis signal of the emphasis signals and allow the de-emphasis drivability to be controlled according to partial code bits of a first selection code of the selection code; and

a pull-down driver configured to perform the de-emphasis operation according to a second emphasis signal of the emphasis signals and allow the de-emphasis drivability to be controlled according to partial code bits of a second selection code of the selection code.

6. The data output buffer of claim 1 , wherein the second driver includes:

a plurality of pull-up driving circuits configured to commonly receive a first emphasis signal of the emphasis signals and receive partial code bits of a first selection code of the selection code bit by bit, respectively; and

a plurality of pull-down driving circuits configured to commonly receive a second emphasis signal of the emphasis signals and receive partial code bits of a second selection code of the selection code bit by bit, respectively.

7. The data output buffer of claim 2 , wherein the second driver includes:

a pull-up driver configured to perform the de-emphasis operation by raising a voltage level of the data I/O pad when the pull-down driver of the first driver drives the data I/O pad as a low level; and

a pull-down driver configured to perform the de-emphasis operation by lowering the voltage level of the data I/O pad when the pull-up driver of the first driver drives the data I/O pad as a high level.

8. A semiconductor apparatus comprising:

a memory region configured to output read data through a data input/output (I/O) pad according to a read command and configured to store write data that is input through the data I/O pad according to a write command;

an impedance calibration circuit configured to adjust a value of an impedance calibration code based on an impedance of an external resistor;

a first driver configured to directly receive the impedance calibration code. drive the data input/output (I/O) pad according to an input signal and allow data drivability to be controlled according to the impedance calibration code;

a second driver configured to directly receive emphasis signals, perform a de-emphasis operation on the data I/O pad and allow de-emphasis drivability to be controlled according to a selection code and the emphasis signals; and

a selection circuit configured to output one of a fixing code and the impedance calibration code as the selection code according to a selection signal,

wherein the first driver and the second driver are coupled to the data I/O pad directly.

9. The semiconductor apparatus of claim 8 , wherein the first driver includes:

a pull-up driver configured to drive the data I/O pad according to a first data signal of the input signal and allow the data drivability to be controlled according to a first impedance calibration code of the impedance calibration code; and

a pull-down driver configured to drive the data I/O pad according to a second data signal of the input signal and allow the data drivability to be controlled according to a second impedance calibration code of the impedance calibration code.

10. The semiconductor apparatus of claim 8 , wherein the second driver includes:

a pull-up driver configured to perform the de-emphasis operation according to a first emphasis signal of the emphasis signals and allow the de- emphasis drivability to be controlled according to all code bits or partial code bits of a first selection code of the selection code; and

a pull-down driver configured to perform the de-emphasis operation according to a second emphasis signal of the emphasis signals and allow the de-emphasis drivability to be controlled according to all code bits or partial code bits of a second selection code of the selection code.

11. The semiconductor apparatus of claim 8 , wherein the second driver includes:

a plurality of pull-up driving circuits configured to commonly receive a first emphasis signal of the emphasis signals and receive all code bits or partial code bits of a first selection code of the selection code bit by bit, respectively; and

a plurality of pull-down driving circuits configured to commonly receive a second emphasis signal of the emphasis signals and receive all code bits or partial code bits of a second selection code of the selection code bit by bit, respectively.

12. The semiconductor apparatus of claim 9 , wherein the second driver includes:

a pull-up driver configured to perform the de-emphasis operation by raising a voltage level of the data I/O pad when the pull-down driver of the first driver drives the data I/O pad as a low level; and

a pull-down driver configured to perform the de-emphasis operation by lowering the voltage level of the data I/O pad when the pull-up driver of the first driver drives the data I/O pad as a high level.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2023
From: HWANG, KYU DONG; KIM, BO RAM; KWON, DAE HAN
To: SK HYNIX INC.
Reel/Frame 063938/0626 →
Priority Claims (1)
KR 10-2021-0037586 · Mar 23, 2021 · national
Continuity (2)
Division 17361018 · Jun 28, 2021
Related Publication 20230326496A1 · Oct 12, 2023
References Cited (4)
US 7573288B2 · Ayyapureddi et al. · 2009 [cited by applicant]
US 9998121B2 · Choi · 2018 [cited by applicant]
US 20130076395A1 · Kim · 2013 [cited by applicant]
US 20180123593A1 · Choi · 2018 [cited by examiner]