Vector network analyzer with digital interface
A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.
1. A measuring device, comprising:
a vector network analyzer, which comprises:
a first measuring port connected to a processor;
an optical interface connected to the first measuring port via a first coupler, wherein the optical interface is adapted to be connected to an optical input or output of a device under test (DUT);
a second measuring port connected to the processor, and adapted to be connected to a radio frequency (RF) input or output of the DUT; and
wherein the processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port; and
wherein the optical interface is connected to the optical input of the DUT, and the second measuring port is connected to the RF output of the DUT,
wherein the first measuring port is adapted to generate a first analog measuring signal and to provide the first analog measuring signal to the optical interface via the first coupler,
wherein the optical interface ( 431 ) is adapted to generate an optical measuring signal based on the first analog measuring signal, and to provide the optical measuring signal to the optical input of the DUT,
wherein the second measuring port is adapted to receive a second analog measuring signal generated by the DUT based on the optical measuring signal and output by the RF output of the DUT, and
wherein the processor is adapted to determine the S-parameters of the DUT based on the first analog measuring signal and the second analog measuring signal.
2. The measuring device according to claim 1 , wherein the vector network analyzer further comprises:
a first measuring port connector adapted to connect the RF input or output of the DUT to the second measuring port; and
an optical interface connector adapted to connect the optical input or output of the DUT to the optical interface.
3. The measuring device according to claim 2 , wherein the first coupler is adapted to selectively connect the first measuring port to the optical interface or to a second measuring port connector.
4. The measuring device according to claim 1 , wherein the vector network analyzer further comprises:
a third measuring port connected to the second measuring port ( 42 ) and to the processor; and
a digital interface connected to the third measuring port via a second coupler, wherein the digital interface is adapted to be connected to a digital input or output of the DUT.
5. The measuring device according to claim 4 , wherein the second coupler is adapted to selectively connect the third measuring port to the digital interface or to a third measuring port connector.