Electronic device and electronic system for generating an operation voltage
An electronic device may include: a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of a reference code during a test period; and a voltage control code generation circuit configured to perform an addition operation or subtraction operation on a logic bit set of a voltage control code to set the voltage level of an operation voltage on the basis of the first and second control pulses.
1. An electronic device comprising:
a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of a reference code during a test period; and
a voltage control code generation circuit configured to perform at least one of an addition operation and a subtraction operation on a logic bit set of a voltage control code to set a voltage level of an operation voltage on the basis of the first and second control pulses,
wherein the control pulse generation circuit generates an oscillating code by counting an oscillating signal generated during the test period, and selectively generates one of the first and second control pulses according to a comparison result between the oscillating code and the reference code.
2. The electronic device of claim 1 , wherein the control pulse generation circuit receives the reference code corresponding to a target level of the operation voltage externally from the electronic device.
3. The electronic device of claim 1 , further comprising a reference code storage circuit configured to store the reference code corresponding to a target level of the operation voltage, and output the reference code during the test period,
wherein the control pulse generation circuit receives the reference code from the reference code storage circuit.
4. The electronic device of claim 1 , wherein the control pulse generation circuit comprises:
an oscillating signal generation circuit configured to generate an oscillating signal on the basis of a test period signal;
an oscillating code generation circuit configured to generate an oscillating code by counting the oscillating signal;
a comparison signal generation circuit configured to generate a comparison signal according to a comparison result between the oscillating code and the reference code; and
a pulse selection circuit configured to selectively generate one of the first and second control pulses on the basis of the comparison signal and a test end pulse.
5. The electronic device of claim 4 , wherein the oscillating signal generation circuit receives the test period signal which is enabled during the test period.
6. The electronic device of claim 4 , wherein the pulse selection circuit generates the first control pulse from the test end pulse when a logic bit set of the oscillating code is larger than a logic bit set of the reference code, and generates the second control pulse from the test end pulse when a logic bit set of the oscillating code is smaller than or equal to the logic bit set of the reference code.
7. The electronic device of claim 4 , wherein the pulse selection circuit receives the test end pulse which is generated at a point of time that the test period is ended.
8. The electronic device of claim 1 , wherein the voltage control code generation circuit comprises an adder,
wherein the adder is configured to generate an addition voltage control code by performing addition on the logic bit set of the voltage control code when the first control pulse is generated.
9. The electronic device of claim 8 , wherein the voltage control code generation circuit further comprises a subtractor,
wherein the subtractor is configured to generate a subtraction voltage control code by performing subtraction on the logic bit set of the voltage control code when the second control pulse is generated.
10. The electronic device of claim 9 , wherein the voltage control code generation circuit further comprises a code selector,
wherein the code selector is configured to select the addition voltage control code as the voltage control code on the basis of the first control pulse, and to select the subtraction voltage control code as the voltage control code on the basis of the second control pulse.
11. The electronic device of claim 1 , further comprising a rupture control circuit configured to perform a rupture operation of storing the voltage control code in a code storage circuit.
12. The electronic device of claim 11 , wherein the rupture control circuit comprises:
a rupture command receiver configured to generate a rupture address and a rupture enable signal on the basis of a rupture command;
a rupture driver configured to drive the voltage control code to generate a rupture voltage control code on the basis of the rupture enable signal, and apply the rupture voltage control code in order to store the voltage control code in the code storage circuit; and
a cell access control circuit configured to access at least one storage region of storage regions included in the code storage circuit, based on the rupture address.
13. The electronic device of claim 1 , further comprising an operation voltage generation circuit configured to generate the operation voltage on the basis of the voltage control code.
14. An electronic system comprising:
a control device configured to generate a command and a reference code; and
an electronic device configured to generate a test command for a test on the basis of the command, and perform at least one of an addition operation and a subtraction operation on a logic bit set of a voltage control code to set a voltage level of an operation voltage on the basis of the reference code during a test period in which the test is performed,
wherein the electronic device comprises a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of the reference code during the test period, and
wherein the control pulse generation circuit generates an oscillating code by counting an oscillating signal generated during the test period, and selectively generates one of the first and second control pulses according to a comparison result between the oscillating code and the reference code.
15. The electronic system of claim 14 , wherein the electronic device further comprises:
a voltage control code generation circuit configured to control the logic bit set of the voltage control code on the basis of the first and second control pulses.
16. The electronic system of claim 15 , wherein the voltage control code generation circuit comprises:
an adder configured to generate an addition voltage control code by performing addition on the logic bit set of the voltage control code when the first control pulse is generated;
a subtractor configured to generate a subtraction voltage control code by performing subtraction on the logic bit set of the voltage control code when the second control pulse is generated; and
a code selector configured to output, as the voltage control code, one of the addition voltage control code and the subtraction voltage control code on the basis of the first and second control pulses.
17. The electronic system of claim 15 , wherein the electronic device further comprises:
a rupture control circuit configured to perform a rupture operation of storing the voltage control code in a code storage circuit; and
an operation voltage generation circuit configured to generate the operation voltage on the basis of the voltage control code.
18. An electronic system comprising:
a control device configured to generate a command; and
an electronic device configured to generate a test command for a test on the basis of the command, store a reference code in the electronic device, and perform at least one of an addition operation and a subtraction operation on a logic bit set of a voltage control code to set a voltage level of an operation voltage on the basis of the reference code during a test period in which the test is performed,
wherein the electronic device comprises a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of the reference code during the test period, and
wherein the control pulse generation circuit generates an oscillating code by counting an oscillating signal generated during the test period, and selectively generates one of the first and second control pulses according to a comparison result between the oscillating code and the reference code.