IP Library › Granted Patent US 12,225,775
Granted Patent B2
US 12,225,775 · App. 17/531,984 · Granted Feb 11, 2025

Array substrate and fabrication method thereof, display panel

Inventors: Qiuhua Meng (Beijing, CN); Ming Liu (Beijing, CN)
Assignee: BOE TECHNOLOGY GROUP CO., LTD.
H10K59/122H10K50/818H10K50/828H10K50/86H10K50/865H10K59/38H10K71/00H10K59/1201H10K2102/3026
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,225,775
App. No.
17/531,984
Granted
Feb 11, 2025
Kind
B2
Abstract

Provided are an array substrate, a fabrication method thereof, and a display panel. The array substrate includes a substrate; a reflective electrode layer on the substrate; a pixel defining layer on a side of the reflective electrode layer away from the substrate; an anti-reflection layer between the reflective electrode layer and the pixel defining layer, and configured to absorb light from outside, an orthographic projection of the anti-reflection layer on the substrate being within an overlapping portion between the orthographic projection of the reflective electrode layer on the substrate and the orthographic projection of the pixel defining layer on the substrate; and a black matrix on a side of the pixel defining layer away from the substrate, an orthographic projection of at least a portion of the anti-reflection layer on the substrate not overlapping with an orthographic projection of the black matrix on the substrate.

Claims (43)

1. An array substrate, comprising:

a substrate;

a reflective electrode layer on the substrate;

a pixel defining layer on a side of the reflective electrode layer away from the substrate, wherein an orthographic projection of the reflective electrode layer on the substrate overlaps with an orthographic projection of the pixel defining layer on the substrate;

an anti-reflection layer between the reflective electrode layer and the pixel defining layer, and configured to absorb light from outside, wherein an orthographic projection of the anti-reflection layer on the substrate is within an overlapping portion between the orthographic projection of the reflective electrode layer on the substrate and the orthographic projection of the pixel defining layer on the substrate;

a black matrix on a side of the pixel defining layer away from the substrate, wherein an orthographic projection of at least a portion of the anti-reflection layer on the substrate does not overlap with an orthographic projection of the black matrix on the substrate; and

a first protective layer on the side of the reflective electrode layer away from the substrate, wherein the first protective layer and the anti-reflection layer are formed from a same black metal oxide layer, and a light transmittance of a portion of the black metal oxide layer serving as the first protective layer is greater than a light transmittance of a portion of the black metal oxide layer serving as the anti-reflection layer.

2. The array substrate of claim 1 , wherein the orthographic projection of the anti-reflection layer on the substrate adjoins the orthographic projection of the black matrix on the substrate.

3. The array substrate of claim 1 , wherein the orthographic projection of the anti-reflection layer on the substrate partially overlaps with the orthographic projection of the black matrix on the substrate.

4. The array substrate of claim 1 , wherein an orthographic projection of at least one edge of the anti-reflection layer on the substrate coincides with an orthographic projection of an edge of the pixel defining layer on the substrate.

5. The array substrate of claim 1 , wherein a material of the anti-reflection layer comprises a black metal oxide.

6. The array substrate of claim 5 , wherein the black metal oxide is tungsten oxide (WO x ) or molybdenum oxide (MoO x ).

7. The array substrate of claim 5 , wherein a material of the reflective electrode layer comprises any one of silver or aluminum.

8. The array substrate of claim 1 , further comprising a display structure and a color filter layer on a side of the display structure away from the substrate, wherein

the display structure comprises:

the reflective electrode layer;

a light emitting layer on a side of the reflective electrode layer and the pixel defining layer away from the substrate; and

a transparent electrode layer on a side of the light emitting layer away from the substrate, and

the color filter layer comprises:

the black matrix; and

a color filter in an area defined by the black matrix.

9. The array substrate of claim 8 , wherein the first protective layer is between the reflective electrode layer and the light emitting layer.

10. The array substrate of claim 1 , further comprising: a second protective layer between the reflective electrode layer and the substrate.

11. The array substrate of claim 10 , wherein the second protective layer is made of indium tin oxide.

12. The array substrate of claim 1 , further comprising: a third protective layer between the reflective electrode layer and the anti-reflection layer, wherein the orthographic projection of the reflective electrode layer on the substrate is within an orthographic projection of the third protective layer on the substrate.

13. A display panel, comprising the array substrate of claim 1 .

14. A method for fabricating an array substrate, comprising:

forming a reflective electrode layer on a substrate;

forming an anti-reflection layer and a pixel defining layer on a side of the reflective electrode layer away from the substrate, wherein the anti-reflection layer is configured to absorb light from outside and is formed between the reflective electrode layer and the pixel defining layer; an orthographic projection of the reflective electrode layer on the substrate overlaps with an orthographic projection of the pixel defining layer on the substrate; an orthographic projection of the anti-reflection layer on the substrate is within an overlapping portion between the orthographic projection of the reflective electrode layer on the substrate and the orthographic projection of the pixel defining layer on the substrate; and

forming a black matrix on a side of the pixel defining layer away from the substrate, wherein an orthographic projection of at least a portion of the anti-reflection layer on the substrate does not overlap with an orthographic projection of the black matrix on the substrate,

wherein the method further comprises forming a first protective layer on the side of the reflective electrode layer away from the substrate, wherein the first protective layer and the anti-reflection layer are formed from a same black metal oxide layer, and a light transmittance of a portion of the black metal oxide layer serving as the first protective layer is greater than a light transmittance of a portion of the black metal oxide layer serving as the anti-reflection layer.

15. The method of claim 14 , wherein forming the anti-reflection layer and the pixel defining layer on the side of the reflective electrode layer away from the substrate comprises:

forming an anti-reflection material layer on the side of the reflective electrode layer away from the substrate;

forming the pixel defining layer on a side of the anti-reflection material layer away from the substrate; and

processing the anti-reflection material layer by using the pixel defining layer as a mask to form the anti-reflection layer.

16. The method of claim 15 , wherein processing the anti-reflection material layer by using the pixel defining layer as the mask to form the anti-reflection layer comprises:

etching the anti-reflection material layer by using the pixel defining layer as the mask to remove a portion of the anti-reflection material layer exposed by the pixel defining layer.

17. The method of claim 15 , wherein processing the anti-reflection material layer by using the pixel defining layer as the mask to form the anti-reflection layer comprises:

modifying the anti-reflection material layer by using the pixel defining layer as the mask to make a portion of the anti-reflection material layer exposed by the pixel defining layer become light-transmissive.

18. The method of claim 14 , wherein a material of the anti-reflection layer comprises a black metal oxide.

19. The method of claim 14 , further comprising:

forming a light emitting layer on a side of the reflective electrode layer and the pixel defining layer away from the substrate; and

forming a transparent electrode layer on a side of the light emitting layer away from the substrate, wherein a light transmittance of the transparent electrode layer ranges from 40% to 60%.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2021
From: MENG, QIUHUA; LIU, MING
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 058177/0889 →
Priority Claims (1)
CN 202110251698.4 · Mar 8, 2021 · national
Continuity (1)
Related Publication 20220285466A1 · Sep 8, 2022
References Cited (10)
US 20030227021A1 · Yamazaki · 2003 [cited by examiner]
US 20070267973A1 · Suh · 2007 [cited by examiner]
US 20100285630A1 · Lee · 2010 [cited by applicant]
US 20210343811A1 · Kim · 2021 [cited by examiner]
CN 108493230A · 2018 [cited by applicant]
KR 20060001749A · 2006 [cited by applicant]
WO WO2013047622A1 · 2013 [cited by examiner]
WO WO2020020224A1 · 2020 [cited by examiner]
China Patent Office, CN202110251698.4 First Office Action issued on Apr. 8, 2022. [cited by applicant]
China Patent Office, CN202110251698.4 Second Office Action issued on Sep. 7, 2022. [cited by applicant]