IP Library › Granted Patent US 12,231,150
Granted Patent B2
US 12,231,150 · App. 17/998,965 · Granted Feb 18, 2025

Method for testing an analog-to-digital converter unit having delta-sigma modulation

Inventor: Rudolf Ritter (Esslingen, DE)
Assignee: ROBERT BOSCH GMBH
H03M3/378H03M3/458
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,231,150
App. No.
17/998,965
Granted
Feb 18, 2025
Kind
B2
Abstract

A method for testing an analog-to-digital converter unit, which is equipped to convert an analog input signal into a digital output signal with the aid of delta-sigma modulation. The method includes: generating an analog input signal; applying a predefined interference signal to the analog input signal and storing the resulting digital output signal as test result; determining that a fault is present if a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, has a deviation from a predefined target transfer function that is greater than a predefined reference value, a fault signal being output if a fault is determined.

Claims (28)

1. A method for testing an analog-to-digital converter unit, which is configured to convert an analog input signal into a digital output signal using delta-sigma modulation, the method comprising:

generating an analog input signal;

applying a predefined interference signal to the analog input signal and storing a resulting digital output signal as a test result; and

determining that a fault is present based on a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, having a deviation from a predefined target transfer function that is greater than a predefined reference value, a fault signal being output when a fault is determined;

wherein the analog-to-digital converter unit has a loop filter and a quantizer as parts of the delta-sigma modulation, the predefined interference signal being applied between the loop filter and the quantizer.

2. The method as recited in claim 1 , wherein the interference signal is an offset signal and/or a sinusoidal signal and/or a pseudorandom noise.

3. A method for testing an analog-to-digital converter unit, which is configured to convert an analog input signal into a digital output signal using delta-sigma modulation, the method comprising:

generating an analog input signal;

applying a predefined interference signal to the analog input signal and storing a resulting digital output signal as a test result; and

determining that a fault is present based on a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, having a deviation from a predefined target transfer function that is greater than a predefined reference value, a fault signal being output when a fault is determined;

wherein after the predefined interference signal is applied, a negated predefined interference signal is applied to the analog input signal and a resulting digital output signal is stored as additional test result, a presence of the fault being determined based on a difference between the test result and additional test result being greater than a predefined reference value.

4. The method as recited in claim 3 , wherein an identical input signal is provided for ascertaining the test result and the additional test result.

5. An analog-to-digital converter unit, comprising:

a delta-sigma modulator configured to convert an analog input signal into a digital output signal using delta-sigma modulation; and

a self-test module configured to perform the following:

generating an analog input signal,

applying a predefined interference signal to the analog input signal and store a resulting digital output signal as a test result, and

determining that a fault is present if a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, has a deviation from a predefined target transfer function which is greater than a predefined reference value, the self-test module being configured to output a fault signal if a fault is determined;

wherein the delta-sigma modulator has a loop filter and a quantizer, the predefined interference signal being applied via a coupling point between the loop filter and the quantizer.

6. The analog-to-digital converter unit as recited in claim 5 , wherein the self-test module is configured to supply, as the interference signal, an offset signal and/or a sinusoidal signal and/or a pseudorandom noise.

7. An analog-to-digital converter unit, comprising:

a delta-sigma modulator configured to convert an analog input signal into a digital output signal using delta-sigma modulation; and

a self-test module configured to perform the following:

generating an analog input signal,

applying a predefined interference signal to the analog input signal and store a resulting digital output signal as a test result, and

determining that a fault is present if a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, has a deviation from a predefined target transfer function which is greater than a predefined reference value, the self-test module being configured to output a fault signal if a fault is determined;

wherein the self-test module is configured to, after the predefined interference signal has been applied, apply a negated predefined interference signal to the analog input signal and store a resulting digital output signal as an additional test result, a presence of the fault being determined if a difference between the test result and additional test result is greater than a predefined reference value.

8. The analog-to-digital converter unit as recited in claim 7 , wherein the self-test module is configured to generate an identical input signal during ascertainment of the test result and the additional test result.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 15, 2023
From: RITTER, RUDOLF
To: ROBERT BOSCH GMBH
Reel/Frame 062986/0162 →
Priority Claims (1)
DE 10 2020 209 852.2 · Aug 5, 2020 · national
Continuity (1)
Related Publication 20230198545A1 · Jun 22, 2023
References Cited (22)
US 6313774B1 · Zarubinsky · 2001 [cited by examiner]
US 6334219B1 · Hill · 2001 [cited by examiner]
US 6414615B1 · Cheng · 2002 [cited by examiner]
US 6557131B1 · Arabi · 2003 [cited by examiner]
US 7196645B2 · Bock · 2007 [cited by examiner]
US 8166362B2 · Meagher · 2012 [cited by examiner]
US 9531402B1 · Kim · 2016 [cited by examiner]
US 9780803B1 · Bal · 2017 [cited by examiner]
US 10014875B1 · Zanikopoulos · 2018 [cited by examiner]
US 11606099B1 · Raju · 2023 [cited by examiner]
US 20030184459A1 · Engl · 2003 [cited by examiner]
US 20060077081A1 · Bock · 2006 [cited by examiner]
US 20070139240A1 · Mitteregger · 2007 [cited by examiner]
US 20070216557A1 · Ebner · 2007 [cited by examiner]
US 20140009185A1 · Tsuda · 2014 [cited by examiner]
US 20150123675A1 · Martini · 2015 [cited by examiner]
US 20160359499A1 · Bandyopadhyay · 2016 [cited by examiner]
US 20190386673A1 · Schrattenecker · 2019 [cited by examiner]
US 20210305996A1 · Kinyua · 2021 [cited by examiner]
US 20220247426A1 · Ritter · 2022 [cited by examiner]
International Search Report for PCT/DE2021/100675, Issued Jan. 21, 2022. [cited by applicant]
De Venuto et al., “Testing High Resolution ΣΔADC's by Using the Quantizer Input as Test Access,” Microelectronics Journal, Mackintosh Publications Ltd. Luton, GB, vol. 36, No. 9, 2005, pp. 810-819. <https://www.academia… [cited by applicant]