Electronic device and manufacturing method and inspection method thereof using transmittance of dielectric
An electronic device includes a conductive layer, a first dielectric layer, and a second dielectric layer, in which the second dielectric layer is disposed on the first dielectric layer, the conductive layer is disposed between the first dielectric layer and the second dielectric layer, the first dielectric layer has a first transmittance for a light, the second dielectric layer has a second transmittance for the light, and the first transmittance is different from the second transmittance.
1. An electronic device, comprising:
a connector comprising a conductive layer, a first dielectric layer, and a second dielectric layer, wherein the second dielectric layer is disposed on the first dielectric layer, the conductive layer is disposed between the first dielectric layer and the second dielectric layer, the first dielectric layer has a first transmittance for a light, the second dielectric layer has a second transmittance for the light, and the first transmittance is different from the second transmittance.
2. The electronic device according to claim 1 , wherein the second transmittance is greater than the first transmittance.
3. The electronic device according to claim 1 , wherein a difference between the second transmittance and the first transmittance is greater than or equal to 10%.
4. The electronic device according to claim 1 , wherein the light is white light.
5. The electronic device according to claim 1 , wherein one of the first dielectric layer and the second dielectric layer comprises one of a green filter material, a yellow filter material, a blue filter material, and a red filter material, and another one of the first dielectric layer and the second dielectric layer comprises another one of the green filter material, the yellow filter material, the blue filter material, and the red filter material.
6. The electronic device according to claim 1 , wherein the first dielectric layer and the second dielectric layer comprise a yellow filter material, a green filter material, a red filter material or a black filter material.
7. The electronic device according to claim 1 , wherein the first dielectric layer comprises at least one through hole, and the conductive layer comprises at least one conductive block extend from a top of the first dielectric layer into the at least one through hole.
8. The electronic device according to claim 7 , wherein the conductive layer further comprises a dummy block electrically insulated from the at least one conductive block.
9. The electronic device according to claim 7 , wherein the connector comprises another conductive layer disposed under the first dielectric layer, and the another conductive layer comprises at least one lower pad electrically connected to the at least one conductive block.
10. A manufacturing method of an electronic device, comprising:
providing a carrier; and
forming a connector on the carrier, wherein the connector comprises a first dielectric layer and a second dielectric layer, the second dielectric layer is disposed on the first dielectric layer, the second dielectric layer is farther away from the carrier than the first dielectric layer,
wherein the first dielectric layer has a first transmittance for a light, the second dielectric layer has a second transmittance for the light, and the first transmittance is different from the second transmittance.
11. The manufacturing method of the electronic device according to claim 10 , wherein the second transmittance is greater than the first transmittance.
12. The manufacturing method of the electronic device according to claim 10 , wherein a difference between the second transmittance and the first transmittance is greater than or equal to 10%.
13. An inspection method of an electronic device, comprising:
providing a carrier;
forming a connector on the carrier, wherein the connector comprises a first dielectric layer and a second dielectric layer, the second dielectric layer is disposed on the first dielectric layer, the second dielectric layer is farther away from the carrier than the first dielectric layer; and
providing a light source for inspecting the connector, wherein the light source generates a first light penetrating through the second dielectric layer to form a second light, the first dielectric layer has a first transmittance for the second light, the second dielectric layer has a second transmittance for the second light, and the first transmittance is different from the second transmittance.
14. The inspection method of the electronic device according to claim 13 , wherein the second transmittance is greater than the first transmittance.
15. The inspection method of the electronic device according to claim 13 , wherein a difference between the second transmittance and the first transmittance is greater than or equal to 10%.
16. The inspection method of the electronic device according to claim 13 , wherein the first dielectric layer and the second dielectric layer comprise a yellow filter material, a green filter material, a red filter material or a black filter material.
17. The inspection method of the electronic device according to claim 13 , wherein the connector further comprises a conductive layer, the conductive layer comprises at least one conductive block, and the second dielectric layer comprises at least one first through hole exposing the at least one conductive block.
18. The inspection method of the electronic device according to claim 17 , wherein the first dielectric layer comprises at least one second through hole, and the at least one conductive block extend from a top of the first dielectric layer into the at least one second through hole.
19. The inspection method of the electronic device according to claim 17 , wherein the connector comprises another conductive layer disposed under the first dielectric layer, and the another conductive layer comprises at least one lower pad electrically connected to the at least one conductive block.