Multiplexing of an active sensor detector using structured illumination
The disclosure provides a structured illumination imaging system that utilizes an image sensor (e.g., an active pixel sensor) in an active plane of a patterned sample to increase image resolution. The imaged sample may be patterned and/or aligned over an image sensor such that each light sensor (e.g., pixel) of the image sensor has a respective plurality of features formed and/or mounted above it. In response to illumination, each of the features may emit fluorescent light that is collected by a pixel of the image sensor. During imaging, each pixel of the image sensor may be spatially multiplexed using structured illumination such that only a subset (e.g., one or two) of the features aligned over the pixel are illuminated with structured light during an image read.
1. A system, comprising:
a light emitter to emit a light;
a flow cover operatively coupled to a detector surface;
a flow channel defined between the flow cover and the detector surface, the flow channel having a height extending between an under surface of the flow cover and the detector surface, wherein the height is between about 50 μm and about 400 μm; and
a detection device, comprising:
an image sensor comprising a plurality of active area pixels and first and second alignment rows or columns of alignment pixels, wherein only one alignment feature is patterned over each of the alignment pixels in the first and second alignment rows or columns of alignment pixels;
a plurality of sets of at least two patterned features, wherein each of the patterned features comprises a reaction site containing one or more nucleic acid molecules, wherein each of the plurality of sets of at least two patterned features is aligned over a respective one of the plurality of active area pixels;
the detector surface; and
an optical assembly to project a first set of a first plurality of fringes on a plane of the detection device shaped so that a fringe width of the first plurality of fringes is at least about the same or greater than a dimension of one of the at least two patterned features and is less than a pitch of the respective one of the plurality of active area pixels, the optical assembly comprising:
one or more diffraction gratings to diffract the light emitted by the light emitter to the optical assembly to form the first set of the first plurality of fringes, and
one or more optical phase modulators to phase shift the first set of the first plurality of fringes between a first phase and a second phase,
wherein, when the first set of the first plurality of fringes are in the first phase, the first set of the first plurality of fringes illuminates a first set of at least one of the patterned features of the at least two patterned features aligned over the respective one of the plurality of active area pixels,
wherein, when the first set of the first plurality of fringes are in the second phase, the first set of the first plurality of fringes illuminates a second set of at least one of the patterned features of the at least two patterned features aligned over the respective one of the plurality of active area pixels,
wherein the first set of at least one of the patterned features is not overlapping with the second set of at least one of the patterned features,
wherein the at least two patterned features is formed over a single light guide of the respective one of the plurality of active area pixels,
wherein the first and second alignment rows or columns of alignment pixels are to spatially align the first set of the first plurality of fringes with one of the at least two patterned features aligned over the respective one of the plurality of active area pixels,
and wherein the image sensor is an active pixel image sensor.
2. The system of claim 1 , wherein the image sensor is a complementary metal-oxide-semiconductor (CMOS) image sensor.
3. The system of claim 1 , wherein the one or more diffraction gratings are configured to form a second set of a second plurality of fringes orthogonally oriented relative to the first set of the first plurality of fringes, the optical assembly to project the second set of the second plurality of fringes on the plane of the detection device, the one or more optical phase modulators to phase shift the second set of the second plurality of fringes between a third phase and a fourth phase,
wherein, when the second set of the second plurality of fringes is in the third phase, the second set of the second plurality of fringes illuminates a third set of at least one of the patterned features of the at least two patterned features aligned over the respective one of the plurality of active area pixels, and
wherein, when the second set of the second plurality of fringes is in the fourth phase, the second set of the second plurality of fringes illuminates a fourth set of at least one the patterned features of the at least two patterned features aligned over the respective one of the plurality of active area pixels, and
wherein the third set of at least one of the patterned features is not overlapping with the fourth set of at least one of the patterned features.
4. The system of claim 3 , wherein the one or more diffraction gratings to diffract the light emitted by the light emitter comprises a horizontal transmissive diffraction grating to form the first set of the first plurality of fringes and a vertical transmissive diffraction grating to form the second set of the second plurality of fringes.
5. The system of claim 3 , wherein the at least two patterned features are four patterned features positioned over a respective one of the plurality of active area pixels, wherein the four patterned features are arranged in a square grid over the respective one of the plurality of active area pixels.
6. The system of claim 3 , wherein the at least two patterned features are three patterned features positioned over a respective one of the plurality of active area pixels, wherein the three patterned features are arranged in an L-shape over the respective one of the plurality of active area pixels.
7. The system of claim 1 , wherein each of the plurality of active area pixels is a rectangular pixel, wherein the at least two patterned features of the detection device are aligned over the respective one of the plurality of active area pixels in a linear array.
8. The system of claim 1 , wherein each of the plurality of active area pixels is a square pixel, wherein the at least two patterned features comprises two features having an aspect ratio of about 2:1.
9. The system of claim 1 , wherein each of the plurality of active area pixels is a square pixel, wherein the at least two patterned features comprises three features having an aspect ratio of about 3:1.
10. The system of claim 1 , wherein:
the pitch of the respective one of the plurality of active area pixels is 1 micron; or
the pitch of the respective one of the plurality of active area pixels is about 2 microns.
11. The system of claim 1 , wherein each of the plurality of active area pixels is a light sensor having a detection area of about 1 μm 2 to about 2 μm 2 .