Methods and mechanisms for generating a data collection plan for a semiconductor manufacturing system
A method includes initiating a connection with a semiconductor manufacturing system. The method further includes generating a set of tool data items associated with the semiconductor manufacturing system. The method further includes providing a graphical user interface (GUI) presenting the set of tool data items associated with the semiconductor manufacturing system and receiving and via the GUI, user input selecting one or more of the tool data items. The method further includes adding configuration data associated with one or more of the tool data items to a data collection plan. The method further includes validating the configuration data by locating, in the manufacturing system, a configuration data file associated with the configuration data. The method further includes executing one or more data collection operations based on the data collection plan.
1. A method, comprising:
initiating, by a processor, a connection with a semiconductor manufacturing system;
generating a set of tool data items associated with the semiconductor manufacturing system;
providing a graphical user interface (GUI) presenting the set of tool data items associated with the semiconductor manufacturing system;
receiving, via the GUI, user input selecting one or more tool data items from the set of tool data items;
adding configuration data associated with the one or more tool data items to a data collection plan;
validating the configuration data to generate a modified data collection plan by:
locating, in the semiconductor manufacturing system, corresponding identification data indicative of whether a respective component of the semiconductor manufacturing system associated with respective configuration data is at least one of included in the semiconductor manufacturing system or is functional in the semiconductor manufacturing system; and
removing, from the data collection plan, a subset of the configuration data for which corresponding identification data was not located; and
executing one or more data collection operations at the semiconductor manufacturing system based on the modified data collection plan.
2. The method of claim 1 , wherein the initiating the connection is based on at least one of a manufacturing system name, a serial number, an identification number, location data, an internet protocol (IP) address, a host name, a port number, a manufacturing system type, or a communication file.
3. The method of claim 1 , wherein each tool data item of the set of tool data items is associated with at least one of a processing chamber, a load lock, or a robot apparatus, of the semiconductor manufacturing system.
4. The method of claim 1 , wherein the set of tool data items is generated using a template associated with a type of process tool included in the semiconductor manufacturing system.
5. The method of claim 1 , further comprising:
modifying one or more parameters of a tool data item of the set of tool data items, wherein the one or more parameters are indicative of a type of data to be collected from a component associated with the tool data item of the set of tool data items.
6. The method of claim 1 , further comprising:
retrieving the configuration data from the semiconductor manufacturing system.
7. The method of claim 1 , further comprising:
retrieving gas-lines configuration data, from the semiconductor manufacturing system, for one or more gas-lines used by the semiconductor manufacturing system; and
adding the gas-lines configuration data to the data collection plan.
8. The method of claim 1 , wherein the configuration data comprises at least one of sensor configuration data, event configuration data, alarm configuration data, or software configuration data.
9. The method of claim 1 , further comprising:
applying a filter to filter a subset of the configuration data from the data collection plan.
10. The method of claim 1 , wherein the validating comprises requesting the semiconductor manufacturing system to confirm that corresponding identification data of respective configuration data is included in the semiconductor manufacturing system.
11. The method of claim 1 , further comprising:
applying a trained machine-learning model to data obtained by the one or more data collection operations; and
performing a corrective action based on an output generated by the trained machine-learning model.
12. The method of claim 1 , further comprising:
obtaining sensor data via the one or more data collection operations; and
training a machine-learning model using the obtained sensor data.
13. A system, comprising:
a memory; and
a processing device operatively coupled with the memory, to perform operations comprising:
initiating a connection with a semiconductor manufacturing system;
generating a set of tool data items associated with the semiconductor manufacturing system;
providing a graphical user interface (GUI) presenting the set of tool data items associated with the semiconductor manufacturing system;
receiving, via the GUI, user input selecting one or more tool data items from the set of tool data items;
adding configuration data associated with the one or more tool data items to a data collection plan;
validating the configuration data to generate a modified data collection plan by:
locating, in the semiconductor manufacturing system, corresponding identification data indicative of whether a respective component of the semiconductor manufacturing system associated with respective configuration data is at least one of included in the semiconductor manufacturing system or is functional in the semiconductor manufacturing system; and
removing, from the data collection plan, a subset of the configuration data for which corresponding identification data was not located; and
executing one or more data collection operations at the semiconductor manufacturing system based on the modified data collection plan.
14. The system of claim 13 , wherein the initiating the connection is based on at least one of a manufacturing system name, a serial number, an identification number, location data, an internet protocol (IP) address, a host name, a port number, a manufacturing system type, or a communication file.
15. The system of claim 13 , wherein each tool data item of the set of tool data items is associated with at least one of a processing chamber, a load lock, or a robot apparatus, of the semiconductor manufacturing system.
16. The system of claim 13 , wherein the set of tool data items is generated using a template associated with a type of process tool included in the semiconductor manufacturing system.
17. The system of claim 13 , wherein the processing device is to perform operations further comprising:
modifying one or more parameters of a tool data item of the set of tool data items, wherein the one or more parameters are indicative of type of data to be collected from a component associated with the tool data item of the set of tool data items.
18. The system of claim 13 , wherein the processing device is to perform operations further comprising:
retrieving the configuration data from the semiconductor manufacturing system.
19. The system of claim 13 , wherein the processing device is to perform operations further comprising:
retrieving gas-lines configuration data, from the semiconductor manufacturing system, for one or more gas-lines used by the semiconductor manufacturing system; and
adding the gas-lines configuration data to the data collection plan.
20. The system of claim 13 , wherein the configuration data comprises at least one of sensor configuration data, event configuration data, alarm configuration data, or software configuration data.
21. The system of claim 13 , wherein the processing device is to perform operations further comprising:
applying a filter to filter the configuration data from the data collection plan.
22. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
initiating a connection with a semiconductor manufacturing system;
generating a set of tool data items associated with the manufacturing system;
providing a graphical user interface (GUI) presenting the set of tool data items associated with the semiconductor manufacturing system;
receiving, via the GUI, user input selecting one or more tool data items from the set of tool data items;
adding configuration data associated with the one or more tool data items to a data collection plan;
validating the configuration data to generate a modified data collection plan by:
locating, in the semiconductor manufacturing system, corresponding identification data indicative of whether a respective component of the semiconductor manufacturing system associated with respective configuration data is at least one of included in the semiconductor manufacturing system or is functional in the semiconductor manufacturing system; and
removing, from the data collection plan, a subset of the configuration data for which corresponding identification data was not located; and
executing one or more data collection operations at the semiconductor manufacturing system based on the modified data collection plan.