IP Library Granted Patent US 12,247,299
Granted Patent B2
US 12,247,299 · App. 18/139,559 · Granted Mar 11, 2025

Treatment liquid for semiconductor with ruthenium and method of producing the same

Inventors: Tomoaki Sato (Yamaguchi, JP); Yuki Kikkawa (Yamaguchi, JP); Takafumi Shimoda (Yamaguchi, JP); Takayuki Negishi (Yamaguchi, JP)
Assignee: TOKUYAMA CORPORATION
C23F1/40H01L21/30604
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Quick Facts
Patent No.
US 12,247,299
App. No.
18/139,559
Granted
Mar 11, 2025
Kind
B2
Abstract

Provided is a treatment liquid for a semiconductor with ruthenium, containing a hypobromite ion. Also provided is a treatment liquid for a semiconductor with ruthenium, containing at least a bromine-containing compound, an oxidizing agent, a basic compound, and water which are added and mixed, wherein the liquid has the bromine-containing compound added in an amount of 0.01 mass % or more and less than 2 mass % as a bromine element content with respect to the total mass of the liquid, has the oxidizing agent added in an amount of 0.1 mass % or more and 10 mass % or less with respect to the total mass, and has a pH of 8 or more and 14 or less. Further provided is a method of producing a treatment liquid for a semiconductor with ruthenium, including a step of mixing a bromine-containing compound with a solution containing a hypochlorous acid compound and a basic compound.

Claims (8)

1. A treatment liquid for a semiconductor with ruthenium, comprising a hypobromite ion, wherein the hypobromite ion content is 0.001 mol/L or more and 0.20 mol/L or less,

wherein the treatment liquid has a pH of 12 or more and 14 or less, and

wherein the ruthenium is a ruthenium metal.

2. The treatment liquid for a semiconductor according to claim 1 , wherein the treatment liquid for a semiconductor further comprises an oxidizing agent, and the oxidation-reduction potential of the oxidizing agent exceeds the oxidation-reduction potential of the hypobromite ion/Br − system.

3. The treatment liquid for a semiconductor according to claim 2 , wherein the oxidizing agent contained in the treatment liquid for a semiconductor is a hypochlorite ion or ozone.

4. The treatment liquid for a semiconductor according to claim 1 , further comprising a tetraalkylammonium ion.

5. The treatment liquid for a semiconductor according to claim 1 , wherein the proportion of the hypobromite ion in 1 mol of bromine element contained in the treatment liquid for a semiconductor is more than 0.5 mol.

6. The treatment liquid for a semiconductor according to claim 2 , wherein the proportion of the hypobromite ion in 1 mol of bromine element contained in the treatment liquid for a semiconductor is more than 0.5 mol.

Priority Claims (4)
JP 2019-176727 · Sep 27, 2019 · national
JP 2019-193081 · Oct 23, 2019 · national
JP 2019-211875 · Nov 22, 2019 · national
JP 2020-045869 · Mar 16, 2020 · national
Continuity (2)
Division 17261387
Related Publication 20230257887A1 · Aug 17, 2023
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