IP Library Granted Patent US 12,260,790
Granted Patent B2
US 12,260,790 · App. 17/942,775 · Granted Mar 25, 2025

Display panel and display apparatus having the same

Inventors: Changjoon Lee (Suwon-si, KR); Seongho Son (Suwon-si, KR); Jongsung Lee (Suwon-si, KR); Jinyoung Kim (Suwon-si, KR); Youngki Jung (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G09G3/006G06F3/1446G09G3/32G09G2300/026G09G2300/0426G09G2330/04G09G2330/12
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Quick Facts
Patent No.
US 12,260,790
App. No.
17/942,775
Granted
Mar 25, 2025
Kind
B2
Abstract

A display panel in which a resistance structure is provided on a test pattern to prevent a circuit of the display panel from being damaged by static electricity introduced into the test pattern, and a display apparatus having the same are provided. The display panel includes: a substrate; a plurality of pixel circuits provided on the substrate and configured to drive a plurality of inorganic light emitting devices; a test line provided on the substrate and extending from an edge of the substrate; an insulating layer provided on the test line; and a resistance structure provided on the test line, the resistance structure including: at least two vertical interconnect accesses (vias) passing through the insulating layer, and a resistance layer provided on the insulating layer and extending between the at least two vias, wherein the at least two vias connect the test line and the resistance layer to each other, and the test line is discontinuous at an area between the at least two vias, and wherein the resistance layer is configured to receive, through one of the at least two vias, a current applied to the test line.

Claims (49)

1. A display panel comprising:

a substrate;

a plurality of pixel circuits provided on the substrate and, each of the plurality of pixel circuits being configured to drive a respective inorganic light emitting device among a plurality of inorganic light emitting devices;

a test line formed on a first layer of the substrate and extending from an edge of the substrate;

a signal line formed on a second layer of the substrate and connected to the plurality of pixel circuits, the second layer being different from the first layer;

an insulating layer provided on the test line; and

a resistance structure provided on the test line, the resistance structure comprising:

at least two vertical interconnect accesses (vias) passing through the insulating layer; and

a resistance layer provided on the insulating layer and extending between the at least two vias,

wherein the at least two vias connect the test line and the resistance layer to each other, and the test line is discontinuous at an area between the at least two vias,

wherein the resistance layer is configured to receive, through one of the at least two vias, a current applied to the test line,

wherein the insulating layer is formed on a test line layer in which the test line is formed, and the resistance layer is formed on the insulating layer,

wherein the test line has an exposed end at the edge of the substrate,

wherein the plurality of pixel circuits comprises a first pixel circuit configured to drive a first inorganic light emitting device among the plurality of inorganic light emitting devices, and a second pixel circuit configured to drive a second inorganic light emitting device among the plurality of inorganic light emitting devices,

wherein the first pixel circuit is adjacent to the second pixel circuit in a first direction,

wherein the signal line is extended from the first pixel circuit to the second pixel circuit in the first direction,

wherein the test line is extended between the first pixel circuit and the second pixel circuit in a second direction perpendicular to the first direction such that the test line intersects with the signal line, and

wherein the resistance structure is provided between the exposed end of the test line and a point at which the test line and the signal line cross each other.

2. The display panel of claim 1 , wherein the resistance layer comprises a material having a resistance higher than a resistance of a material of the test line.

3. The display panel of claim 2 , wherein the resistance layer comprises a resistance section corresponding to an area at which the test line is discontinued, and

the at least two vias are connected to opposite end portions of the resistance section.

4. The display panel of claim 3 , wherein the resistance structure is configured to open due to an electro static discharge (ESD) current applied to the test line and introduced from the test line into the resistance section through the one of the at least two vias.

5. The display panel of claim 2 , wherein the resistance layer comprises at least one of polysilicon, silicon oxide, silicon nitride, silicon oxynitride, aluminum oxide, aluminum nitride, titanium oxide, or titanium nitride.

6. The display panel of claim 1 , wherein the exposed end of the test line is a cut surface corresponding to the edge of the substrate.

7. A display apparatus comprising:

a substrate;

a plurality of inorganic light emitting devices provided on the substrate;

a plurality of pixel circuits provided on the substrate, each configured to drive a respective inorganic light emitting device among the plurality of inorganic light emitting devices;

a test line formed on a first layer of the substrate and extending from an edge of the substrate;

a signal line formed on a second layer of the substrate and connected to the plurality of pixel circuits, the second layer being different from the first layer;

an insulating layer provided on the test line; and

a resistance structure provided on the test line, the resistance structure comprising:

at least two vertical interconnect accesses (vias) passing through the insulating layer; and

a resistance layer provided on the insulating layer and extending between the at least two vias,

wherein the at least two vias connect the test line and the resistance layer to each other, and the test line is discontinuous at an area between the at least two vias,

wherein the resistance layer is configured to receive, through one of the at least two vias, a current applied to the test line,

wherein the insulating layer is formed on a test line layer in which the test line is formed, and the resistance layer is formed on the insulating layer,

wherein the test line has an exposed end at the edge of the substrate,

wherein the plurality of pixel circuits comprises a first pixel circuit configured to drive a first inorganic light emitting device among the plurality of inorganic light emitting devices, and a second pixel circuit configured to drive a second inorganic light emitting device among the plurality of inorganic light emitting devices,

wherein the first pixel circuit is adjacent to the second pixel circuit in a first direction,

wherein the signal line is extended from the first pixel circuit to the second pixel circuit in the first direction,

wherein the test line is extended between the first pixel circuit and the second pixel circuit in a second direction perpendicular to the first direction such that the test line intersects with the signal line, and

wherein the resistance structure is provided between the exposed end of the test line and a point at which the test line and the signal line cross each other.

8. The display apparatus of claim 7 , wherein the resistance layer comprises a material having a resistance higher than a resistance of a material of the test line.

9. The display apparatus of claim 8 , wherein the resistance layer comprises a resistance section corresponding to an area at which the test line is discontinued, and

the at least two vias are connected to opposite end portions of the resistance section.

10. The display apparatus of claim 9 , wherein the resistance structure is configured to open due to an electro static discharge (ESD) current applied to the test line and introduced from the test line into the resistance section through the one of the at least two vias.

11. The display apparatus of claim 8 , wherein the resistance layer comprises at least one of polysilicon, silicon oxide, silicon nitride, silicon oxynitride, aluminum oxide, aluminum nitride, titanium oxide, or titanium nitride.

12. The display apparatus of claim 7 , wherein the exposed end of the test line is a cut surface corresponding to the edge of the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2022
From: LEE, CHANGJOON; SON, SEONGHO; LEE, JONGSUNG; KIM, JINYOUNG; JUNG, YOUNGKI
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 061064/0325 →
Priority Claims (1)
KR 10-2021-0175171 · Dec 8, 2021 · national
Continuity (2)
Continuation PCTKR2022013366 · Sep 6, 2022
Related Publication 20230177986A1 · Jun 8, 2023
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