Integrated circuit device
An integrated circuit device includes a fin-type active region disposed on a substrate and extending in a first horizontal direction, a gate line disposed on the fin-type active region and extending in a second horizontal direction intersecting the first horizontal direction, the gate line including, a connection protrusion portion including a protrusion top surface at a first vertical level from the substrate, and a main gate portion including a recess top surface extending in the second horizontal direction from the connection protrusion portion, the recess top surface being at a second vertical level lower than the first vertical level, a gate contact disposed on the gate line and connected to the connection protrusion portion, a source/drain region disposed on the fin-type active region and disposed adjacent to the gate line, and a source/drain contact disposed on the source/drain region.
1. An integrated circuit device, comprising:
a fin-type active region disposed on a substrate and extending in a first horizontal direction;
a plurality of nanosheets facing a fin top surface of the fin-type active region and disposed apart from the fin top surface in a vertical direction, the plurality of nanosheets having different vertical distances from the fin top surface;
a gate line disposed on the fin-type active region and extending in a second horizontal direction intersecting the first horizontal direction, the gate line comprising:
a connection protrusion portion comprising a protrusion top surface at a first vertical level from the substrate, and
a plurality of sub gate portions at least partially overlapping the plurality of nanosheets in the vertical direction, the plurality of sub gate portions comprising an uppermost sub gate portion having a recess top surface extending at a second vertical level closer to the substrate than the first vertical level, and a lower sub gate portion closer to the substrate than the uppermost sub gate portion and interposed between two adjacent nanosheets from among the plurality of nanosheets;
a gate contact disposed on the gate line and coupled to the connection protrusion portion; and
a capping insulation pattern at least partially covering the recess top surface over the plurality of nanosheets,
wherein a first vertical thickness of a first portion of the uppermost sub gate portion, which at least partially overlaps the capping insulation pattern in the vertical direction, is smaller than a second vertical thickness of the lower sub gate portion.
2. The integrated circuit device of claim 1 , wherein a first width of the capping insulation pattern in the first horizontal direction is smaller than a second width of each of the plurality of sub gate portions in the first horizontal direction.
3. The integrated circuit device of claim 1 , wherein the capping insulation pattern contacts the recess top surface of the uppermost sub gate portion.
4. The integrated circuit device of claim 1 , wherein the uppermost sub gate portion has a second portion at least partially covering a sidewall of the capping insulation pattern,
wherein the second portion is coupled to the first portion of the capping insulation pattern as one body, and
wherein the first vertical thickness of the first portion of the uppermost sub gate portion is smaller than a third vertical thickness of the second portion of the uppermost sub gate portion.
5. The integrated circuit device of claim 1 , wherein the gate line further comprises a main gate portion coupled to the plurality of sub gate portions as one body, and
wherein the main gate portion comprises the connection protrusion portion.
6. The integrated circuit device of claim 1 , further comprising:
a source/drain region disposed on the fin-type active region and disposed adjacent to the gate line; and
a semiconductor oxide piece interposed between the source/drain region and the capping insulation pattern at a position at least partially overlapping the plurality of nanosheets in the vertical direction.
7. The integrated circuit device of claim 1 , wherein the connection protrusion portion comprises a protrusion sidewall comprising a lateral recess recessed in the first horizontal direction at a position at least partially overlapping the plurality of nanosheets in the vertical direction.
8. An integrated circuit device, comprising:
a pair of fin-type active regions disposed on a substrate, the pair of fin-type active regions extending in a first horizontal direction;
a pair of nanosheet stacks on the pair of fin-type active regions, each of the pair of nanosheet stacks being disposed apart from a fin top surface of one of the pair of fin-type active regions in a vertical direction and comprising a plurality of nanosheets having different vertical distances from the fin top surface;
a gate line disposed on the pair of fin-type active regions and extending in a second horizontal direction intersecting the first horizontal direction, the gate line comprising:
a connection protrusion portion comprising a protrusion top surface at a first vertical level from the substrate,
a main gate portion comprising a first recess top surface on at least one of the pair of fin-type active regions, the first recess top surface extending in the second horizontal direction from the connection protrusion portion and being at a second vertical level closer to the substrate than the first vertical level, and
a plurality of sub gate portions, each of the plurality of sub gate portions being coupled to the main gate portion as one body and at least partially overlapping the plurality of nanosheets of at least one of the pair of nanosheet stacks in the vertical direction, the plurality of sub gate portions comprising an uppermost sub gate portion having a second recess top surface extending from the first recess top surface at the second vertical level, and a lower sub gate portion closer to the substrate than the uppermost sub gate portion and interposed between two adjacent nanosheets from among the plurality of nanosheets;
a gate contact disposed on the gate line and coupled to the connection protrusion portion; and
a capping insulation pattern at least partially covering the second recess top surface over the plurality of nanosheets,
wherein a first vertical thickness of a first portion of the uppermost sub gate portion, which at least partially overlaps the capping insulation pattern in the vertical direction, is smaller than a second vertical thickness of the lower sub gate portion.
9. The integrated circuit device of claim 8 , wherein the uppermost sub gate portion comprises a recess accommodating a portion of the capping insulation pattern, and
wherein the capping insulation pattern comprises a pair of sidewalls, each of the pair of sidewalls being in contact with the uppermost sub gate portion within the recess.
10. The integrated circuit device of claim 8 , wherein the uppermost sub gate portion has a variable vertical thickness along the first horizontal direction.
11. The integrated circuit device of claim 8 , wherein a first width of the capping insulation pattern in the first horizontal direction is smaller than a second width of each of the plurality of sub gate portions in the first horizontal direction.
12. The integrated circuit device of claim 8 , wherein the capping insulation pattern contacts the second recess top surface of the uppermost sub gate portion.
13. The integrated circuit device of claim 8 , further comprising:
a pair of source/drain regions disposed on at least one of the pair of fin-type active regions, the gate line extending between the pair of source/drain regions; and
at least one semiconductor oxide piece interposed between the capping insulation pattern and at least one of the pair of source/drain regions, the at least one semiconductor oxide piece being at a position at least partially overlapping the plurality of nanosheets in the vertical direction.
14. The integrated circuit device of claim 8 , wherein the connection protrusion portion comprises a pair of sidewalls in the first horizontal direction, and
wherein at least one sidewall of the pair of sidewalls comprises a lateral recess recessed in the first horizontal direction at a position at least partially overlapping at least one of the pair of nanosheet stacks in the vertical direction.
15. An integrated circuit device, comprising:
a pair of fin-type active regions disposed on a substrate, the pair of fin-type active regions extending in a first horizontal direction;
a pair of nanosheet stacks on the pair of fin-type active regions, each of the pair of nanosheet stacks being disposed apart from a fin top surface of one of the pair of fin-type active regions in a vertical direction and comprising a plurality of nanosheets having different vertical distances from the fin top surface;
a gate line disposed on the pair of fin-type active regions and extending in a second horizontal direction intersecting the first horizontal direction, the gate line comprising:
a connection protrusion portion comprising a protrusion top surface at a first vertical level from the substrate,
a main gate portion comprising a first recess top surface on at least one of the pair of fin-type active regions, the first recess top surface extending in the second horizontal direction from the connection protrusion portion and being at a second vertical level closer to the substrate than the first vertical level, and
a plurality of sub gate portions each coupled to the main gate portion as one body and at least partially overlapping the plurality of nanosheets of one of the pair of nanosheet stacks in the vertical direction, the plurality of sub gate portions comprising an uppermost sub gate portion having a second recess top surface extending from the first recess top surface at the second vertical level, and a lower sub gate portion closer to the substrate than the uppermost sub gate portion and interposed between two adjacent nanosheets from among the plurality of nanosheets;
a plurality of source/drain regions disposed on each of the pair of fin-type active regions, each of the plurality of source/drain regions being coupled to one of the pair of nanosheet stacks;
a gate contact disposed on the gate line and coupled to the connection protrusion portion;
a capping insulation pattern at least partially covering the second recess top surface over the plurality of nanosheets of each of the pair of nanosheet stacks; and
at least one semiconductor oxide piece interposed between the capping insulation pattern and at least one of the plurality of source/drain regions, the at least one semiconductor oxide piece being at a position at least partially overlapping the plurality of nanosheets of at least one of the pair of nanosheet stacks in the vertical direction,
wherein a first vertical thickness of a first portion of the uppermost sub gate portion, which at least partially overlaps the capping insulation pattern in the vertical direction, is smaller than a second vertical thickness of the lower sub gate portion, and
wherein a first width of the capping insulation pattern in the first horizontal direction is smaller than a second width of each of the plurality of sub gate portions in the first horizontal direction.
16. The integrated circuit device of claim 15 , wherein the substrate comprises:
a device region; and
an inter-device isolation region defining the device region,
wherein the main gate portion extends in the second horizontal direction in the device region and the inter-device isolation region, and
wherein the connection protrusion portion and the gate contact are disposed in the inter-device isolation region.
17. The integrated circuit device of claim 15 , wherein the substrate comprises:
a first device region; and
a second device region disposed apart from the first device region,
wherein the first recess top surface and the second recess top surface are disposed in at least one of the first device region and the second device region.
18. The integrated circuit device of claim 15 , wherein the gate contact passes through the capping insulation pattern in the vertical direction to contact the protrusion top surface of the connection protrusion portion.
19. The integrated circuit device of claim 15 , wherein the uppermost sub gate portion comprises a recess accommodating a portion of the capping insulation pattern, and
wherein the capping insulation pattern comprises a pair of sidewalls, each of the pair of sidewalls being in contact with the uppermost sub gate portion within the recess.
20. The integrated circuit device of claim 15 , wherein the uppermost sub gate portion has a variable vertical thickness along the first horizontal direction.