IP Library › Granted Patent US 12,264,978
Granted Patent B2
US 12,264,978 · App. 17/601,239 · Granted Apr 1, 2025

Device and arrangement for measuring load on a test object, in particular a chassis component

Inventors: Christoph Schanz (Frickenhausen, DE); Philipp Cörlin (Unterensingen, DE); Philippe Klemm (Unterensingen, DE)
Assignee: Trafag AG
G01L1/127G01L1/26G01M17/007
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,264,978
App. No.
17/601,239
Granted
Apr 1, 2025
Kind
B2
Abstract

The invention relates to a load measurement device ( 12 ) for accurately measuring a load in a test object ( 14 ) such as, in particular, a chassis component, comprising a magnetic field generating device ( 18 ), a first magnetic field detecting device ( 20 ), a second magnetic field detecting device ( 22 ), and a measurement environment parameter acquisition device ( 80 ) for acquiring at least one measurement environment parameter in the test object ( 14 ), wherein an evaluation device ( 42 ) is configured to generate a measurement signal obtained on the basis of outputs of the first and second magnetic field detection devices ( 20, 22 ) in dependence on the at least one measurement environment parameter detected by the measurement environment parameter acquisition device ( 80 ).

Claims (34)

1. A load measurement device ( 12 ) for measuring a load in a test object ( 14 ), comprising:

a sensor head;

a magnetic field generating device ( 18 ) for generating a magnetic field in the test object ( 14 ), the magnetic field generating device ( 18 ) comprising a magnetic field generating coil (Lg) arranged on the sensor head and a current source for supplying the magnetic field generating coil (Lg) with a periodically alternating current;

a first magnetic field detecting device ( 20 ) for detecting a first magnetic field parameter which changes on the basis of a load in the test object ( 14 ) and for generating a first magnetic field parameter signal which changes periodically on the basis of the periodically generated magnetic field, said first magnetic field detecting device ( 20 ) comprising at least one first magnetic field sensor ( 26 - 1 ) arranged on the sensor head ( 10 );

a second magnetic field detecting device ( 22 ) for detecting a second magnetic field parameter which changes on the basis of a load in the test object ( 14 ) and for generating a second magnetic field parameter signal which changes periodically on the basis of the periodically generated magnetic field, said second magnetic field detecting device ( 22 ) comprising at least one second magnetic field sensor ( 26 - 2 ) arranged on the sensor head ( 10 );

an evaluation device ( 42 ) for generating a measurement signal from the first and the second magnetic field parameter signal; and

a measurement environment parameter acquisition device ( 80 ) for acquiring at least one measurement environment parameter in the test object ( 14 ),

said evaluation device ( 42 ) being configured to generate the measurement signal corrected based on said at least one measurement environment parameter acquired by the measurement environment parameter acquisition device ( 80 ),

characterized in that the measurement environment parameter acquisition device ( 80 ) comprises:

an acceleration sensor ( 82 ) for detecting an acceleration applied to the sensor head ( 10 ) and/or to the test object ( 14 ).

2. The load measurement device according to claim 1 , characterized in that the evaluation device ( 42 ) is configured to:

detect shocks or dynamic loads from outside on the basis of the acceleration detected by the acceleration sensor ( 82 ) and to correct the measurement signal on the basis of that.

3. The load measurement device according to claim 1 , characterized in that the measurement environment parameter acquisition device ( 80 ) comprises:

at least one magnetic sensor ( 86 ) for detecting a static magnetic field or a magnetic field that changes at a lower frequency compared to the periodically generated magnetic field, and/or

at least one temperature sensor ( 84 ) for detecting the temperature of the test object,

wherein the evaluation device ( 42 ) is configured to:

detect a change in ambient magnetic fields on the basis of a magnetic sensor signal of the magnetic sensor ( 86 ) and to correct the measurement signal on the basis of this change in the ambient magnetic fields; and/or

correct the measurement signal on the basis of the temperature of the test object ( 14 ) measured by the temperature sensor ( 84 ).

4. The load measurement device according to any of the preceding claims , characterized in that a first pair (A 1 , B 1 ) of a first magnetic field sensor ( 26 - 1 ) and second magnetic field sensor ( 26 - 2 ), and a second pair (A 2 , B 2 ) of a second magnetic field sensor ( 26 - 1 ) and a second magnetic field sensor ( 26 - 2 ) are provided, the first and the second magnetic field sensors ( 26 - 1 , 26 - 2 ) being provided in an X-shaped arrangement in such a manner that the first magnetic field sensors ( 26 - 1 ) are opposite each other and the second magnetic field sensors ( 26 - 2 ) are opposite each other, wherein each of the magnetic field sensors ( 26 - 1 , 26 - 2 ) is associated with an analog-digital converter ( 44 a , 44 b , 44 c , 44 d ) so that a first to fourth digital magnetic field detection signal are supplied to the evaluation device ( 42 ), wherein the evaluation device ( 42 ) is configured to produce therefrom a first measurement signal and a different second measurement signal.

5. The load measurement device according to claim 4 , characterized in that the evaluation device ( 42 ) is configured to evaluate the first pair (A 1 , B 1 ) and the second pair (A 2 , B 2 ) separately to produce the first and the second measurement signal.

6. The load measurement device according to claim 5 , characterized in that the evaluation device ( 42 ) is configured to evaluate the first pair by measuring a difference of the signals of its magnetic field sensors ( 26 - 1 , 26 - 2 ) and by measuring the signal of the first magnetic field sensor ( 26 - 1 ) of the first pair and to evaluate the second pair by measuring a difference of the signals of its magnetic field sensors ( 26 - 1 , 26 - 2 ) and by measuring the signal of the first magnetic field sensor ( 26 - 1 ) of the second pair.

7. The load measurement device according to claim 1 , characterized in that the sensor head ( 10 ) comprises a shield ( 60 ) against electromagnetic interference in the environment.

8. A load measurement arrangement ( 16 ), comprising a test object ( 14 ) and the load measurement device ( 12 ) according to claim 1 for non-contact load measurement in the test object ( 14 ).

9. The load measurement arrangement according to claim 8 , characterized in that several sensor heads ( 10 ) are disposed in diametrically opposed positions on the test object and/or annularly around the test object.

10. The load measurement arrangement according to claim 8 or 9 , characterized in that the test object has a cavity at least one measuring area, the at least one sensor head being arranged in said cavity, surrounded by the test object.

11. The load measurement device according to claim 1 , wherein the measurement environment parameter acquisition device ( 80 ) further comprises:

a temperature sensor ( 84 ) for detecting a temperature difference between the test object and the sensor head.

12. The load measurement device according to claim 11 , wherein the evaluation device ( 42 ) is configured to correct the measurement signal on the basis of the temperature difference between the test object ( 14 ) and the sensor head ( 10 ) or a sensor housing measured by the temperature sensor ( 84 ).

13. The load measurement device according to claim 1 , wherein the measurement environment parameter acquisition device ( 80 ) further comprises:

a current sensor ( 88 ) for detecting the amperage of the current flowing in the magnetic field generating coil (Lg), wherein the evaluation unit is configured to detect a change in the inductance of the magnetic field generating coil (Lg) on the basis of a change in the amperage measured by the current sensor ( 88 ) and/or a change in the permeability of the test object ( 14 ) and to correct the measurement signal on the basis of the change in the amperage measured by the current sensor ( 88 );

and/or an inductance sensor ( 90 ) for detecting the inductance of the magnetic field generating coil (Lg).

14. The load measurement device according to claim 13 , characterized in that the evaluation device ( 42 ) is configured to:

correct the measurement signal on the basis of a change in the inductance of the magnetic field generating coil (Lg) measured by the inductance sensor ( 90 ); and/or

detect a change in the permeability of the test object ( 14 ) on the basis of a change in the inductance of the magnetic field generating coil (Lg) measured by the inductance sensor ( 90 ) and to correct the measurement signal on the basis of this change.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2022
From: SCHANZ, CHRISTOPH; CÖRLIN, PHLLIPP; KLEMM, PHILIPPE
To: TRAFAG AG
Reel/Frame 059336/0184 →
Priority Claims (1)
DE 10 2019 108 898.4 · Apr 4, 2019 · national
Continuity (1)
Related Publication 20220170802A1 · Jun 2, 2022
References Cited (44)
US 3011340A · Dahle · 1961 [cited by applicant]
US 3311818A · Quittner · 1967 [cited by applicant]
US 3903739A · Kolavcic · 1975 [cited by examiner]
US 4135391A · Dahle · 1979 [cited by applicant]
US 5542304A · Sasada · 1996 [cited by examiner]
US 6487925B2 · Fischer · 2002 [cited by examiner]
US 8058865B2 · May · 2011 [cited by examiner]
US 9234811B2 · Brummel · 2016 [cited by examiner]
US 9347845B2 · Gießibl · 2016 [cited by examiner]
US 9618408B2 · Lu · 2017 [cited by examiner]
US 9645022B2 · Brummel · 2017 [cited by examiner]
US 9671214B2 · Ausserlechner · 2017 [cited by examiner]
US 10006932B2 · White · 2018 [cited by examiner]
US 10247627B2 · May · 2019 [cited by examiner]
US 10359324B2 · Sipilä · 2019 [cited by examiner]
US 10415997B2 · Huber Lindenberger · 2019 [cited by examiner]
US 10444096B2 · May · 2019 [cited by examiner]
US 10473536B2 · Lu · 2019 [cited by examiner]
US 10663363B2 · Lu · 2020 [cited by examiner]
US 10782116B2 · Ausserlechner · 2020 [cited by examiner]
US 10955493B2 · Sharma · 2021 [cited by examiner]
US 10962433B2 · Schanz · 2021 [cited by examiner]
US 11022508B2 · Doelling · 2021 [cited by examiner]
US 11099086B2 · Lu · 2021 [cited by examiner]
US 11402237B2 · Buchenau · 2022 [cited by examiner]
US 11422048B2 · Schanz · 2022 [cited by examiner]
US 11585708B2 · Schanz · 2023 [cited by examiner]
US 11592280B2 · Margner et al. · 2023 [cited by examiner]
US 11821804B2 · Ettenauer · 2023 [cited by examiner]
US 20140165737A1 · Brummel · 2014 [cited by examiner]
US 20170211996A1 · Lu · 2017 [cited by examiner]
US 20180245994A1 · May · 2018 [cited by examiner]
US 20180266897A1 · May · 2018 [cited by examiner]
US 20190187008A1 · Schanz · 2019 [cited by examiner]
US 20190219458A1 · May · 2019 [cited by examiner]
US 20190323907A1 · Lu · 2019 [cited by examiner]
US 20200158538A1 · Buchenau · 2020 [cited by examiner]
US 20230258684A1 · Huber · 2023 [cited by examiner]
DE 3031997A1 · 1982 [cited by applicant]
DE 102017111055B3 · 2018 [cited by applicant]
EP 0384042A2 · 1990 [cited by applicant]
EP 2833109A1 · 2015 [cited by examiner]
EP 3051265A1 · 2016 [cited by applicant]
Hinz and Voigt, “Magnetoelastic Sensors,” Sensors: A Comprehensive Survey, vol. 5, VCH Verlagsgesellschaft mbH VCH Publishers Inc., 1989. [cited by applicant]