Memory device configured to reduce degradation of adjacent word lines and operating method thereof
An operating method of a memory device includes: acquiring an address of a first bad word line, the first bad word line included in a plurality of word lines of the memory device; detecting whether word lines adjacent to the first bad word line are bad based on the address of the first bad word line, the word lines adjacent to the first bad word line included in the plurality of word lines; designating a first word line among the word lines adjacent to the first bad word line as a prohibited word line, the first word line being detected as a second bad word line; and sending first data via a second word line among the word lines adjacent to the first bad word line, the second word line being detected as a normal word line.
1. An operating method of a memory device, comprising:
acquiring an address of a first bad word line, the first bad word line included in a plurality of word lines of the memory device;
detecting whether word lines adjacent to the first bad word line are bad based on the address of the first bad word line, the word lines adjacent to the first bad word line included in the plurality of word lines;
designating a first word line among the word lines adjacent to the first bad word line as a prohibited word line, the first word line being detected as a second bad word line; and
sending first data via a second word line detected as a normal word line among the word lines adjacent to the first bad word line using a first voltage that is lower than a second voltage used to program normal word lines, the normal word lines being one or more of the plurality of word lines excluding the word lines adjacent to the first bad word line.
2. The operating method of the memory device of claim 1 , further comprising:
designating the second word line as a read-only word line.
3. The operating method of the memory device of claim 1 , wherein
the word lines adjacent to the first bad word line include n upper word lines and n lower word lines, the upper word lines being above the first bad word line, the lower word lines being below the first bad word line, and
n is an integer greater than 0.
4. The operating method of the memory device of claim 1 , wherein the designating the first word line as the prohibited word line comprises:
sending dummy data via the first word line, and designating the first word line as a prohibited word line.
5. The operating method of the memory device of claim 4 , wherein
the sending the dummy data via the first word line and designating the first word line as the prohibited word line comprises sending the dummy data via the first word line in a single level cell (SLC) mode.
6. The operating method of the memory device of claim 1 , further comprising:
sending dummy data via the first bad word line in an SLC mode.
7. The operating method of the memory device of claim 1 , wherein the sending the first data via the second word line comprises:
sending the first data via the second word line using a first number of bits per cell which is less than a second number of bits per cell used for a first normal word line among the plurality of word lines.
8. The operating method of the memory device of claim 1 , further comprising:
sending second data via one of the normal word lines excluding the word lines adjacent to the first bad word line using the second voltage.
9. The operating method of the memory device of claim 8 , wherein the sending the second data using the second voltage comprises:
sending the second data in a mode corresponding to a cell type of the memory device, wherein
the cell type is one of a multi-level cell (MLC) type, a triple level cell (TLC) type, or a quad level cell (QLC) type, and
the mode is one of a MLC mode, a TLC mode, or a QLC mode.
10. The operating method of the memory device of claim 1 , wherein the detecting whether the word lines adjacent to the first bad word line are bad comprises:
detecting whether a bridge occurs between each of the word lines adjacent to the first bad word line and a channel.
11. The operating method of the memory device of claim 1 , wherein the detecting whether the word lines adjacent to the first bad word line are bad comprises:
measuring a leakage current at each of the word lines adjacent to the first bad word line; and
determining a word line adjacent to the first bad word line among the word lines adjacent to the first bad word line to be bad when the leakage current exceeds a reference value.
12. The operating method of the memory device of claim 1 , wherein the plurality of word lines further comprise a third bad word line, and the operating method of the memory device further comprises:
designating n word lines between the first bad word line and the third bad word line as prohibited word lines,
wherein n is an integer greater than 0.
13. The operating method of the memory device of claim 1 , further comprising:
erasing a block including the plurality of word lines before the acquiring of the address of the first bad word line in the plurality of word lines.
14. An operating method of a memory device comprising:
acquiring an address of a first bad word line in a block;
sending first data via the first bad word line;
sending second data via a word line adjacent to the first bad word line; and
designating the first bad word line as a prohibited word line; and
designating the word line adjacent to the first bad word line as a read-only word line.
15. The operating method of the memory device of claim 14 , wherein
the sending the first data via the first bad word line comprises sending the first data via the first bad word line in a first mode,
the sending the second data via the word line adjacent to the first bad word line comprises sending the second data via the word line adjacent to the first bad word line in a second mode, and
the first mode and the second mode use a first number of bits per cell, the first number of bits per cell being less than a second number of bits per cell used in a first normal word line, the first normal word line not being the word line adjacent to the first bad word line.
16. The operating method of the memory device of claim 14 , wherein
the sending the first data via the first bad word line comprises sending the first data via the first bad word line in a single level cell (SLC) mode.
17. The operating method of the memory device of claim 14 , wherein the sending the second data via the word line adjacent to the first bad word line comprises:
sending the second data via the word line adjacent to the first bad word line in a single level cell (SLC) mode or a multi-level cell (MLC) mode.
18. A memory system comprising:
a memory device including a plurality of memory cells respectively connected to a plurality of word lines; and
a memory controller configured to
acquire an address of a first bad word line in the plurality of word lines,
detect whether word lines adjacent to the first bad word line are bad based on the address of the first bad word line, the word lines adjacent to the first bad word line included in the plurality of word lines,
designate a first word line among the word lines adjacent to the first bad word line as a prohibited word line, the first word line being among the word lines adjacent to the first bad word line, the first word line being detected as a second bad word line, and
record first data in a second word line detected as a normal word line among the word lines adjacent to the first bad word line using a first voltage that is lower than a second voltage used to program normal word lines, the normal word lines being one or more of the plurality of word lines excluding the word lines adjacent to the first bad word line.
19. The memory system of claim 18 , wherein
the memory controller is further configured to record dummy data in the first word line in a single level cell (SLC) mode, and designate the first word line as a prohibited word line.
20. The memory system of claim 18 , wherein
the memory controller is further configured to record data in one of the normal word lines excluding the word lines adjacent to the first bad word line using the second voltage.