IP Library Granted Patent US 12,304,875
Granted Patent B2
US 12,304,875 · App. 18/118,294 · Granted May 20, 2025

Plasma-resistant member

Inventors: Junichi Iwasawa (Fukuoka-ken, JP); Toshihiro Aoshima (Fukuoka-ken, JP)
Assignee: Toto Ltd.
C04B41/87C04B35/505C04B35/62222C04B41/009C04B41/5045C23C4/12C23C16/4404C23C24/04H01L21/6833H01L21/68757C04B2235/3217C04B2235/3225C04B2235/781C04B2235/785C04B2235/963C04B2237/066C04B2237/343C04B2237/592Y02T50/60
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Quick Facts
Patent No.
US 12,304,875
App. No.
18/118,294
Granted
May 20, 2025
Kind
B2
Abstract

According to an aspect of the invention, there is provided a plasma-resistant member including: a base member; and a layer structural component formed at a surface of the base member, the layer structural component including an yttria polycrystalline body and being plasma resistant, the layer structural component including a first uneven structure, and a second uneven structure formed to be superimposed onto the first uneven structure, the second uneven structure having an unevenness finer than an unevenness of the first uneven structure.

Claims (16)

1. A plasma-resistant member, comprising:

a base member; and

a layer structural component formed at a surface of the base member, the layer structural component including an yttria polycrystalline body and being plasma resistant,

the layer structural component including

a first uneven structure, and

a second uneven structure formed to be superimposed onto the first uneven structure, the second uneven structure having an unevenness finer than an unevenness of the first uneven structure,

the second uneven structure has an unevenness in an entire surface of the layer structural component, a size of crystal particles of the unevenness being fine, and a diameter of the average crystal particle being not more than 50 nm.

2. The plasma-resistant member according to claim 1 , wherein

the first uneven structure has voids in a portion of a surface of the layer structural component, the voids being where groups of crystal particles detached.

3. The plasma-resistant member according to claim 1 , wherein the first uneven structure and the second uneven structure are formed by performing chemical processing.

4. The plasma-resistant member according to claim 1 , wherein the layer structural component has a sparse and dense structure of the yttria polycrystalline body, sparse portions of the sparse and dense structure include a first layer at the surface of the layer structural component and a second layer at deeper position than the first layer in thickness direction, the second layer is smaller than the first layer,

and a density of the sparse portions being lower than a density of the dense portion.

5. The plasma-resistant member according to claim 1 , wherein the layer structural component has a sparse and dense structure of the yttria polycrystalline body, the sparse and dense structure includes sparse portions distributed three-dimensionally inside a dense portion, and a density of the sparse portions being lower than a density of the dense portion.

6. The plasma-resistant member according to claim 1 , wherein the layer structural component is formed by aerosol deposition.

7. The plasma-resistant member according to claim 1 , wherein the base member consists of ceramic material.

8. The plasma-resistant member according to claim 1 , wherein the first uneven structure has a waviness on the order of several hundred nm and the second uneven structure has a waviness on the order of several tens of nm.

Priority Claims (2)
JP 2012-287511 · Dec 28, 2012 · national
JP 2013-205278 · Sep 30, 2013 · national
Continuity (3)
Division 16246852 · Jan 14, 2019
Continuation 14651503
Related Publication 20230227375A1 · Jul 20, 2023
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Cited By (1)
US 12,738,460