Spike arrays for small displacement force measurement
A device and method for measuring the force generated by an expanding micro-actuator structure whose displacement is typically in the sub-micron range. Measurement of forces that occur at small displacements falls beyond the range of traditional load cell technology whose transducers require a minimum travel to record force changes. The force measurement of this invention uses spike arrays (nanometer tipped microstructure constructed of hard materials) together with a softer blank film that is imprinted by the array of spikes. The force may be determined by inverting the nano-indentation problem where the hardness (H) of the material is related to the applied force (F) of the nano-indenter by measuring the imprinted divot area (A) using the equation H=F/A. Alternatively, the force may be determined by comparing the imprinted pattern with known, standardized samples.
1. An apparatus for measuring a force generated by an expanding micro-actuator structure, the apparatus comprising an array of spike-like structures and a layer, the spike-like structures having pointed ends assembled to engage the layer, the pointed ends of the spike-like structures having a hardness greater than a hardness of the layer; and the expanding micro-actuator structure arranged to expand in a presence of a gas, wherein said expansion pushes the spike-like structures toward the layer and causes the pointed ends of the spike-like structure to form impressions in the layer.
2. The apparatus of claim 1 wherein the gas is essentially comprised of hydrogen.
3. The apparatus of claim 1 wherein the layer comprises gold or material having a hardness less than that of gold.
4. The apparatus of claim 3 wherein the layer is disposed on a substrate of a material having a hardness greater than that of gold.
5. The apparatus of claim 4 wherein the pointed ends of the array of spike-like structures comprise a material selected from the group consisting of Ti and Pd and alloys, mixtures and/or layers thereof.
6. The apparatus of claim 1 wherein the expanding micro-actuator structure comprises a thin film or microstructure array of material that absorbs said gas.
7. The apparatus of claim 1 in combination with a chamber, wherein the expanding micro-actuator structure, the array of spike-like structures and the layer form a clamped stack; wherein the chamber is sized to receive the clamped stack and said gas, wherein the clamped stack is disposed in said chamber and exposed to said gas within said chamber.
8. The apparatus of claim 1 wherein the expanding micro-actuator structure is segmented into individual spaced-apart pads or individual spaced-apart elements.
9. The apparatus of claim 8 wherein individual spaced-apart pads or elements comprise a two-dimensional array of individual spaced-apart pads and wherein the array of spike-like structures also comprises a two dimensional array, and wherein each spike-like structure has a separate individual spaced-apart pad disposed therewith.
10. A method of measuring a force developed by a gas absorbing micro-actuator structure in response to a presence of an environmental factor, the method comprising:
disposing a gas absorbing micro-actuator structure together with an array of spike-like structures and a layer in a chamber, the spike-like structures having pointed ends assembled to engage the layer, such that an expansion of said gas absorbing micro-actuator structure pushes the spike-like structures toward the layer and causes the pointed ends of the spike-like structure to form impressions in the laver; the pointed ends of the spike-like structures having a hardness that is greater than a hardness of the layer;
exposing the gas absorbing micro-actuator structure to said environmental factor in said chamber, such that the gas absorbing micro-actuator structure expands in the presence of said environmental factor thereby causing said impressions to occur in said layer, and measuring a size or dimension of said impressions to calculate said force and/or comparing a size or dimension of said impressions against known imprinted test layers to determine said force.
11. The method of claim 10 wherein the gas absorbing micro-actuator structure, the array of spike-like structures and the layer form a clamped stack; and wherein after exposure to said environmental factor, the clamped stack is removed from the chamber and disassembled and wherein the step of measuring a size or dimension of said impressions is performed by an appropriate technique to measure an impression area and from this measurement the force can be derived or a comparison is made to imprinted test films made using calibrated forces.
12. The method of claim 10 wherein the gas is essentially comprised of hydrogen.
13. The method of claim 10 wherein the layer comprises gold or a material having a hardness less than that of gold.
14. The method of claim 13 wherein the layer is disposed on a substrate of a material having a hardness greater than that of gold.
15. The method of claim 14 wherein the pointed ends of the array of spike-like structures comprise a material selected from the group consisting of Ti and Pd and alloys, mixtures and/or layers thereof.
16. The method of claim 10 wherein the gas absorbing micro-actuator structure comprises a thin film or microstructure array of material that absorbs said gas.
17. The apparatus of claim 1 wherein the spike-like structures are spikes.
18. The apparatus of claim 1 wherein the layer is a film.
19. The method of claim 10 wherein the spike-like structures are spikes.
20. The method of claim 10 wherein the layer is a film.