Imaging device, manufacturing method thereof, and electronic device
An imaging device suitable for detecting infrared light is provided. The imaging device includes a first layer, a second layer, a third layer, and a fourth layer, which are stacked in this order. The first layer includes an infrared-light-transmitting filter. The second layer includes single crystal silicon. The third layer includes a device-formation layer. The fourth layer includes a support substrate. The second layer includes a photoelectric-conversion device whose light-absorption layer is the single crystal silicon. The third layer includes a transistor which includes a metal oxide in its channel formation region. The photoelectric-conversion device and the transistor are electrically connected. The photoelectric-conversion device receives light which has passed through the infrared-light-transmitting filter.
1. An imaging device comprising:
a first layer;
a second layer below the first layer;
a third layer below the second layer;
a fourth layer below the third layer,
wherein the first layer, the second layer, the third layer, and the fourth layer comprise a region where the first layer, the second layer, the third layer, and the fourth layer overlap with each other,
wherein the first layer comprises an optical-filter layer,
wherein the second layer comprises single crystal silicon,
wherein the third layer comprises a device-formation layer,
wherein the fourth layer comprises a support substrate,
wherein the second layer comprises a photoelectric-conversion device whose light-absorption layer is the single crystal silicon,
wherein the photoelectric-conversion device is configured to receive light having passed through the optical-filter layer,
wherein the device-formation layer comprises a first transistor, a second transistor, a third transistor, a fourth transistor, and a capacitor,
wherein one electrode of the photoelectric-conversion device is electrically connected to one of a source and a drain of the first transistor,
wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,
wherein the one of the source and the drain of the second transistor is electrically connected to one electrode of the capacitor,
wherein the one electrode of the capacitor is electrically connected to a gate of the third transistor,
wherein one of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the fourth transistor,
wherein the device-formation layer comprises a first oxide semiconductor layer and a second oxide semiconductor layer,
wherein the first oxide semiconductor layer comprises a channel formation region of the first transistor, and
wherein the second oxide semiconductor layer comprises a channel formation region of the third transistor and a channel formation region of the fourth transistor.
2. The imaging device according to claim 1 ,
wherein each of the first oxide semiconductor layer and the second oxide semiconductor layer comprises In, Zn, and M, and
wherein M is selected from Al, Ti, Ga, Ge, Sn, Y, Zr, La, Ce, Nd, or Hf.
3. An electronic device comprising:
the imaging device according to claim 1 ; and
a light source.
4. An imaging device comprising:
a first layer;
a second layer below the first layer;
a third layer below the second layer; and
a fourth layer below the third layer,
wherein the first layer, the second layer, the third layer, and the fourth layer overlap with each other,
wherein the first layer comprises an optical-filter layer,
wherein the second layer comprises a photoelectric-conversion device comprising single crystal silicon in a light-absorption layer,
wherein the third layer comprises a circuit,
wherein the fourth layer comprises a support substrate,
wherein the circuit comprises a first transistor, a second transistor, a third transistor, a fourth transistor, and a capacitor,
wherein one electrode of the photoelectric-conversion device is electrically connected to one of a source and a drain of the first transistor,
wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,
wherein the one of the source and the drain of the second transistor is electrically connected to one electrode of the capacitor,
wherein the one electrode of the capacitor is electrically connected to a gate of the third transistor,
wherein one of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the fourth transistor,
wherein the circuit comprises a first oxide semiconductor layer and a second oxide semiconductor layer,
wherein the first oxide semiconductor layer comprises a channel formation region of the first transistor,
wherein the second oxide semiconductor layer comprises a channel formation region of the third transistor and a channel formation region of the fourth transistor, and
wherein the optical-filter layer is configured to block visible light and to transmit infrared light.
5. The imaging device according to claim 4 ,
wherein each of the first oxide semiconductor layer and the second oxide semiconductor layer comprises In, Zn, and M, and
wherein M is selected from Al, Ti, Ga, Ge, Sn, Y, Zr, La, Ce, Nd, or Hf.
6. An electronic device comprising:
the imaging device according to claim 4 ; and
a light source.