IP Library › Granted Patent US 12,385,786
Granted Patent B2
US 12,385,786 · App. 17/241,420 · Granted Aug 12, 2025

Apparatuses, systems, and methods for thermal imaging

Inventors: Robert Timothy Kester (Friendswood, TX); Patrick Charles O'Driscoll (Houston, TX); Steve Patrick Gautieri (Gladstone, MO); Gary Timothy Noe, II (Houston, TX); Venus J. Dantas (Arlington Heights, IL); Carlos A. Claveria (Buffalo Grove, IL); Ronald J. Martin (Nicholson, GA); Michael Jon Freeman (Cambridge, CA); Ryan Patrick Mallery (Houston, TX)
Assignee: REBELLION PHOTONICS, INC.
G01J5/0003H04N23/11G01J2005/0077G01J5/485
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,385,786
App. No.
17/241,420
Granted
Aug 12, 2025
Kind
B2
Abstract

Thermal imaging systems are provided. An example thermal imaging system includes an infrared (IR) imager that acquires IR image data of a field of view of the IR imager. The thermal imaging system further includes video analysis circuitry operably coupled to the IR imager. The video analysis circuitry receives first temperature data of a first field reference within the field of view of the IR imager, receives second temperature data of a second field reference within the field of view of the IR imager, and receives IR image data from the IR imager. The video analysis circuitry calibrates the IR imager based upon the first temperature data, the second temperature data, and the IR image data. The thermal imaging system may further include a temperature control chamber enclosing the IR imager and configured to thermally isolate the IR imager and temperature sensors thermally coupled to the IR imager.

Claims (36)

1. A thermal imaging system comprising:

an infrared (IR) imager configured to acquire IR image data of a field of view of the IR imager; and

video analysis circuitry operably coupled to the IR imager, wherein the video analysis circuitry is configured to:

receive first temperature data indicating a first calibrated temperature of a first field reference within the field of view of the IR imager;

receive second temperature data indicating a second calibrated temperature of a second field reference within the field of view of the IR imager;

receive the IR image data from the IR imager; and

calibrate the IR imager by:

calculating a first temperature difference between the first calibrated temperature of the first field reference and a first temperature value of the first field reference according to a first portion of the IR image data that is associated with the first field reference, and

calculating a second temperature difference between the second calibrated temperature of the second field reference and a second temperature value of the second field reference according to a second portion of the IR image data that is associated with the second field reference.

2. The thermal imaging system according to claim 1 , wherein the video analysis circuitry is further configured to determine an uncertainty of the IR imager based upon at least one of the first temperature difference or the second temperature difference.

3. The thermal imaging system according to claim 1 , further comprising one or more temperature control elements thermally coupled to the IR imager, wherein the one or more temperature control elements are configured to modify an operating temperature of the IR imager based upon an uncertainty of the IR imager determined by the video analysis circuitry.

4. The thermal imaging system of claim 3 , wherein the one or more temperature control elements are configured to modify the operating temperature of the IR imager to reduce the first temperature difference and the second temperature difference.

5. The thermal imaging system according to claim 1 , wherein the video analysis circuitry is configured to:

detect an absence of either the first field reference or the second field reference within the field of view of the IR imager; and

generate a user notification requesting repositioning of the IR imager.

6. The thermal imaging system of claim 1 , wherein the first field reference and the second field reference are housed in separate calibration elements that are positioned at different locations within the field of view of the IR imager and arranged separately from the IR imager.

7. The thermal imaging system of claim 1 , wherein the video analysis circuitry is further configured to:

determine, based on the first temperature difference, that the first temperature value does not match the first calibrated temperature; and

in response to determining that the first temperature value does not match the first calibrated temperature, generate a user notification requesting repositioning of the IR imager.

8. A thermal imaging system comprising:

an infrared (IR) imager configured to acquire IR image data of a field of view of the IR imager;

a first field reference positioned within the field of view of the IR imager, wherein the first field reference is calibrated to a first temperature;

a second field reference positioned within the field of view of the IR imager, wherein the second field reference is calibrated to a second temperature;

video analysis circuitry operably coupled to the IR imager, wherein the video analysis circuitry is configured to:

receive first temperature data indicating the first temperature of the first field reference;

receive second temperature data indicating the second temperature of the second field reference;

receive the IR image data from the IR imager; and

calibrate the IR imager by:

calculating a first temperature difference between the first temperature of the first field reference and a first temperature value of the first field reference according to a first portion of the IR image data that is associated with the first field reference and

calculating a second temperature difference between the second temperature of the second field reference and a second temperature value of the second field reference according to a second portion of the IR image data that is associated with the second field reference.

9. The thermal imaging system according to claim 8 , wherein the video analysis circuitry is further configured to determine an uncertainty of the IR imager based upon at least one of the first temperature difference or the second temperature difference.

10. The thermal imaging system according to claim 8 , further comprising one or more temperature control elements thermally coupled to the IR imager, wherein the one or more temperature control elements are configured to modify an operating temperature of the IR imager based upon an uncertainty of the IR imager determined by the video analysis circuitry.

11. The thermal imaging system according to claim 8 , wherein the video analysis circuitry is configured to:

detect an absence of either the first field reference or the second field reference within the field of view of the IR imager; and

generate a user notification requesting repositioning of the IR imager.

12. The thermal imaging system of claim 8 , wherein the first field reference and the second field reference are housed in separate calibration elements that are positioned at different locations within the field of view of the IR imager and arranged separately from the IR imager.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2023
From: KESTER, ROBERT TIMOTHY; NOE, GARY TIMOTHY, II; O'DRISCOLL, PATRICK CHARLES; GAUTIERI, STEVE PATRICK; DANTAS, VENUS J.; CLAVERIA, CARLOS A.; MARTIN, RONALD J.; FREEMAN, MICHAEL JON; MALLERY, RYAN PATRICK
To: REBELLION PHOTONICS, INC.
Reel/Frame 064432/0398 →
Continuity (3)
Provisional Application 63042809 · Jun 23, 2020
Provisional Application 63019929 · May 4, 2020
Related Publication 20210344851A1 · Nov 4, 2021
References Cited (79)
US 6259352B1 · Yulkowski et al. · 2001 [cited by applicant]
US 7340293B2 · McQuilkin · 2008 [cited by applicant]
US 7693679B1 · Warnke · 2010 [cited by examiner]
US 8274050B2 · Grimberg · 2012 [cited by examiner]
US 9258495B2 · Zeng et al. · 2016 [cited by applicant]
US 9324222B2 · Buckley et al. · 2016 [cited by applicant]
US 9886640B1 · Chen et al. · 2018 [cited by applicant]
US 10375327B2 · Kester · 2019 [cited by applicant]
US 11044423B2 · Kester · 2021 [cited by applicant]
US 11170894B1 · Kocher et al. · 2021 [cited by applicant]
US 20030086591A1 · Simon · 2003 [cited by applicant]
US 20030102435A1 · Myers et al. · 2003 [cited by applicant]
US 20040254472A1 · McQuilkin · 2004 [cited by examiner]
US 20050286606A1 · Ignatowicz · 2005 [cited by examiner]
US 20060043296A1 · Mian · 2006 [cited by examiner]
US 20060206724A1 · Schaufele et al. · 2006 [cited by applicant]
US 20060232675A1 · Chamberlain et al. · 2006 [cited by applicant]
US 20070122038A1 · Gorian · 2007 [cited by examiner]
US 20070153871A1 · Fraden · 2007 [cited by applicant]
US 20120018638A1 · Patel · 2012 [cited by examiner]
US 20120194342A1 · Reinpoldt · 2012 [cited by applicant]
US 20120211648A1 · Linsacum · 2012 [cited by examiner]
US 20130223472A1 · Maston · 2013 [cited by applicant]
US 20140149065A1 · Pompei et al. · 2014 [cited by applicant]
US 20140267763A1 · Neal · 2014 [cited by examiner]
US 20140307076A1 · Deutsch · 2014 [cited by applicant]
US 20150049941A1 · Hall · 2015 [cited by examiner]
US 20150094914A1 · Abreu · 2015 [cited by examiner]
US 20150204556A1 · Kusukame · 2015 [cited by examiner]
US 20160132652A1 · Chapman et al. · 2016 [cited by applicant]
US 20160140817A1 · Beagley · 2016 [cited by examiner]
US 20160150976A1 · Fang et al. · 2016 [cited by applicant]
US 20160377381A1 · Lyren · 2016 [cited by applicant]
US 20170017852A1 · Su et al. · 2017 [cited by applicant]
US 20170093939A1 · Bar-Mashiah et al. · 2017 [cited by applicant]
US 20170133053A1 · Kardashov et al. · 2017 [cited by applicant]
US 20170186160A1 · Satish et al. · 2017 [cited by applicant]
US 20180063900A1 · Minvielle · 2018 [cited by examiner]
US 20180116579A1 · Omi · 2018 [cited by applicant]
US 20180191967A1 · Kester · 2018 [cited by examiner]
US 20190110047A1 · De Muynck · 2019 [cited by applicant]
US 20190125011A1 · Eisenbrey et al. · 2019 [cited by applicant]
US 20190162439A1 · Tsuda et al. · 2019 [cited by applicant]
US 20190179286A1 · Horseman et al. · 2019 [cited by applicant]
US 20190205655A1 · Matsuoka et al. · 2019 [cited by applicant]
US 20190251380A1 · Park et al. · 2019 [cited by applicant]
US 20190273875A1 · Kester et al. · 2019 [cited by applicant]
US 20200026830A1 · Alameh et al. · 2020 [cited by applicant]
US 20200200608A1 · Williams · 2020 [cited by examiner]
US 20200253483A1 · Chase · 2020 [cited by examiner]
US 20210212576A1 · Macneish et al. · 2021 [cited by applicant]
US 20210287469A1 · Ryhorchuk et al. · 2021 [cited by applicant]
US 20210304537A1 · Reed et al. · 2021 [cited by applicant]
US 20210407092A1 · Kaiser et al. · 2021 [cited by applicant]
US 20220012469A1 · Kucharski et al. · 2022 [cited by applicant]
US 20220099368A1 · Varnes · 2022 [cited by examiner]
US 20220277490A1 · Kishino et al. · 2022 [cited by applicant]
US 20230134325A1 · Bevan · 2023 [cited by applicant]
CN 107036715A · 2017 [cited by applicant]
EP 1646310A2 · 2006 [cited by applicant]
EP 2632150A2 · 2013 [cited by applicant]
JP 2008146301A · 2008 [cited by applicant]
JP 2011067371A · 2011 [cited by applicant]
JP 2020005180A · 2020 [cited by applicant]
JP 2020062198A · 2020 [cited by applicant]
WO 2018075964A1 · 2018 [cited by applicant]
U.S. Appl. No. 17/241,478, “Apparatuses, Systems, and Methods for Thermal Imaging”, Unpublished (filing date Apr. 27, 2021), (Thomas Isberg, Inventor) (Rebellion Photonics, Inc., Assignee). [cited by applicant]
Viento GT/GT-Split Thermography Camera With GIG-E Interface, [datasheet, online], [retreived from the Internet Sep. 10, 2021] <URL: https://sierraolympic.com/wp-content/uploads/2020/07/SOTI_Viento-GT_SellSheet_3-1-17.pd… [cited by applicant]
International Search Report and Written Opinion Mailed on Feb. 1, 2022 for WO Application No. PCT/US21/030474, 6 pages. [cited by applicant]
Non-Final Rejection Mailed on May 11, 2023 for U.S. Appl. No. 17/241,478, 17 page(s). [cited by applicant]
Requirement for Restriction/Election received for U.S. Appl. No. 17/241,478, mailed on Sep. 2, 2022, 6 pages. [cited by applicant]
Final Rejection Mailed on Nov. 15, 2023 for U.S. Appl. No. 17/241,478, 20 page(s). [cited by applicant]
Supplementary Partial European Search Report Mailed on Apr. 18, 2024 for EP Application No. 21825923, 11 page(s). [cited by applicant]
Advisory Action (PTOL-303) Mailed on Mar. 7, 2024 for U.S. Appl. No. 17/241,478, 3 page(s). [cited by applicant]
Non-Final Rejection Mailed on Apr. 23, 2024 for U.S. Appl. No. 17/241,478, 17 page(s). [cited by applicant]
Extended European Search Report Mailed on Jul. 19, 2024 for EP Application No. 21825923, 12 page(s). [cited by applicant]
Advisory Action (PTOL-303) Mailed on Jan. 13, 2025 for U.S. Appl. No. 17/241,478, 2 page(s). [cited by applicant]
Final Rejection Mailed on Oct. 31, 2024 for U.S. Appl. No. 17/241,478, 19 page(s). [cited by applicant]
Notice of Allowance and Fees Due (PTOL-85) Mailed on Mar. 3, 2025 for U.S. Appl. No. 17/241,478, 8 page (s). [cited by applicant]