IP Library › Granted Patent US 12,390,765
Granted Patent B2
US 12,390,765 · App. 17/766,388 · Granted Aug 19, 2025

System and method for identifying, selecting and purifying particles

Inventors: Brooke A. Brown (Bloomington, IN); David E. Clemmer (Bloomington, IN); Martin F. Jarrold (Bloomington, IN)
Assignee: THE TRUSTEES OF INDIANA UNIVERSITY
B01D59/46H01J3/40H01J49/26
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Quick Facts
Patent No.
US 12,390,765
App. No.
17/766,388
Granted
Aug 19, 2025
Kind
B2
Abstract

A method for purifying particles generates charged particles from a sample, measures at least at least one of masses, charge magnitudes and mobilities of the generated charged particles, and selectively passes to a particle collection target each of the measured charged particles having at least one of (a) a measured mass equal to a selected mass or within a selected range of particle masses, (b) a measured charge magnitude equal to a selected charge magnitude or within a selected range of charge magnitudes, (c) a mass-to-charge ratio equal to a selected mass-to-charge ratio or within a selected range of mass-to-charge ratios, and (d) a measured mobility equal to a selected mobility or within a selected range of mobilities. In some embodiments, the collected particles may be harvested and amplified.

Claims (39)

1. A particle purification device, comprising:

an ion generator configured to generate charged particles from a sample,

an ion processing region configured to receive the charged particles generated by the ion generator and to measure at least one of masses and charge magnitudes of the generated charged particles,

a particle collection target having a collection surface,

means for selectively passing charged particles exiting the ion processing region to the particle collection target,

a processor, and

a memory having instructions stored therein executable by the processor to cause the processor to control the means for selectively passing charged particles to pass to the collection surface of the particle collection target for collection thereon each of the measured charged particles having at least one of (a) a measured mass equal to a selected mass or within a selected range of particle masses, (b) a measured charge magnitude equal to a selected charge magnitude or within a selected range of charge magnitudes, and (c) a mass-to-charge ratio equal to a selected mass-to-charge ratio or within a selected range of mass-to-charge ratios.

2. The particle purification device of claim 1 , wherein the instructions stored in the memory further include instructions executable by the processor to cause the processor to control the means for selectively passing charge particles to otherwise block passage to the particle collection target the measured charged particles.

3. The particle purification device of claim 1 , wherein the ion processing region comprises a charge detection mass spectrometer configured to receive the charged particles generated by the ion generator and to measure the masses and charge magnitudes of the generated charged particles.

4. The particle purification device of claim 3 , wherein the means for selectively passing charged particles exiting the ion processing region to the particle collection target comprises a charged particle deflection or steering device controllable by the processor to selectively pass charged particles therethrough to the particle collection target.

5. The particle purification device of claim 3 , wherein the means for selectively passing charged particles exiting the ion processing region to the particle collection target comprises a charge detector of the charge detection mass spectrometer, the charge detector controllable by the processor to selectively pass charged particles therethrough to the particle collection target.

6. The particle purification device of claim 1 , further comprising an ion trap disposed between the particle collection target and the means for selectively passing charged particles exiting the ion processing region to the particle collection target,

and wherein the instructions stored in the memory further include instructions executable by the processor to cause the processor to control the ion trap to selectively trap therein charged particles exiting the means for selectively passing charged particles exiting the ion processing region to the particle collection target, and to control the ion trap to release charged particles trapped therein and accelerate the charged particles toward the particle collection target.

7. The particle purification device of claim 1 , wherein the ion processing region comprises one of a mass analyzer, a mass spectrometer and a mass-to-charge ratio filter configured to pass therethrough charged particles of a selected mass-to-charge ratio or having a mass-to-charge ratio within a selected range of mass-to-charge ratios followed by a charge detector array configured to measure charge magnitudes of charged particles exiting the mass analyzer, a mass spectrometer and a mass-to-charge ratio filter.

8. The particle purification device of claim 7 , wherein the means for selectively passing charged particles exiting the ion processing region to the particle collection target comprises a charged particle deflection or steering device controllable by the processor to selectively pass charged particles therethrough to the particle collection target.

9. The particle purification device of claim 7 , further comprising an ion trap disposed between the particle collection target and the means for selectively passing charged particles exiting the ion processing region to the particle collection target,

and wherein the instructions stored in the memory further include instructions executable by the processor to cause the processor to control the ion trap to selectively trap therein charged particles exiting the means for selectively passing charged particles exiting the ion processing region to the particle collection target, and to control the ion trap to release charged particles trapped therein and accelerate the charged particles toward the particle collection target.

10. A method for purifying particles, comprising:

generating charged particles from a sample,

measuring at least at least one of masses, charge magnitudes and mobilities of the generated charged particles, and

selectively passing to a collection surface of a particle collection target for collection on the collection surface each of the measured charged particles having at least one of (a) a measured mass equal to a selected mass or within a selected range of particle masses, (b) a measured charge magnitude equal to a selected charge magnitude or within a selected range of charge magnitudes, (c) a mass-to-charge ratio equal to a selected mass-to-charge ratio or within a selected range of mass-to-charge ratios, and (d) a measured mobility equal to a selected mobility or within a selected range of mobilities.

11. The method of claim 10 , further comprising collecting on the collection surface of the particle collection target the measured charged particles selectively passed thereto.

12. The method of claim 11 , further comprising harvesting the charged particles collected on the collection surface of the particle collection target.

13. The method of claim 12 , further comprising amplifying the harvested charged particles.

14. A method for measuring exosomes in a sample preparation, the method comprising:

generating ions from the sample preparation,

measuring mass and charge of at least some of the generated ions using a charge detection mass spectrometer, and

identifying from the measured masses of the at least some of the generated ions a subset of the measured ions that are exosome ions.

15. The method of claim 14 , further comprising enriching the sample preparation for the exosomes prior to measuring the mass and charge of the at least some of the generated ions.

16. The method of claim 15 , further comprising processing the measured masses and charges of the at least some of the generated ions using a statistical model to determine at least two separate sub-families of the generated ions.

17. The method of claim 14 , further comprising collecting at least a portion of the subset of the measured ions that are exosome ions.

18. The method of claim 17 , further comprising purifying the collected at least a portion of the subset of the measured ions that are exosome ions.

19. The particle purification device of claim 1 , wherein the sample includes exosomes,

and wherein the instructions stored in the memory further include instructions executable by the processor to determine from the measured masses of at least some of the generated charged particles a subset of the generated charged particles having masses identifying the corresponding generated charged particles as exosome ions,

and wherein the instructions stored in the memory further include instructions executable by the processor to control the means for selectively passing charged particles to pass the exosome ions to the particle collection target.

20. The method of claim 10 , wherein generating charged particles from a sample comprises generating charged particles from a sample containing exosomes,

and wherein measuring comprises measuring at least the masses of the charged particles,

and wherein the method further comprises identifying from the measured masses of the at least some of the generated charged particles a subset of the generated charged particles that are exosome ions,

and wherein selectively passing comprises passing the exosome ions to the particle collection target.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 8, 2022
From: CLEMMER, DAVID E; JARROLD, MARTIN F.; BROWN, BROOKE
To: THE TRUSTEES OF INDIANA UNIVERSITY
Reel/Frame 059538/0467 →
Continuity (4)
Provisional Application 62913460 · Oct 10, 2019
Provisional Application 62949559 · Dec 18, 2019
Provisional Application 62972403 · Feb 10, 2020
Related Publication 20240050895A1 · Feb 15, 2024
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