IP Library › Granted Patent US 12,393,046
Granted Patent B2
US 12,393,046 · App. 17/764,057 · Granted Aug 19, 2025

Metrology systems, coherence scrambler illumination sources and methods thereof

Inventors: Irwan Dani Setija (Utrecht, NL); Arie Jeffrey Den Boef (Waalre, NL); Mohamed Swillam (Wilton, CT); Arjan Johannes Anton Beukman (Son en Breugel, NL)
Assignees: ASML Netherlands B.V.; ASML Holding N.V.
G02B27/48G02F1/2955G03F7/70616
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Quick Facts
Patent No.
US 12,393,046
App. No.
17/764,057
Granted
Aug 19, 2025
Kind
B2
Abstract

A system includes a radiation source and a phased array. The phased array includes optical elements, waveguides and phase modulators. The phased array generates a beam of radiation. The optical elements radiate radiation waves. The waveguides guide radiation from the radiation source to the optical elements. The phase modulators adjust phases of the radiation waves such that the radiation waves accumulate to form the beam. An amount of incoherence of the beam is based on randomization of the phases.

Claims (29)

1. A system comprising:

a radiation source;

a multimode optical element configured to output a beam of radiation;

a phased array configured to generate a directed beam of radiation, the phased array comprising:

optical elements configured to radiate radiation waves;

waveguides configured to guide radiation from the radiation source to the optical elements; and

phase modulators configured to adjust phases of radiation in the waveguides such that the radiation waves accumulate to form the directed beam of radiation that impinges on an input surface of the multimode optical element, wherein an amount of incoherence of the beam of radiation is based on adjustments of a location of impingement of the directed beam on the input surface.

2. The system of claim 1 , further comprising a controller configured to control the phase modulators to control the adjustments of the location of impingement.

3. The system of claim 1 , wherein the phase modulators are further configured to adjust the phases at a frequency of approximately 100 kHz or greater.

4. The system of claim 1 , wherein the system further comprises a photonic integrated circuit.

5. A metrology system comprising:

a radiation source;

a phased array configured to generate a beam of radiation to illuminate a target, the phased array comprising:

optical elements configured to radiate radiation waves,

waveguides configured to guide radiation from the radiation source to the optical elements, and

phase modulators configured to adjust phases of the radiation waves such that the radiation waves accumulate to form the beam of radiation, wherein an amount of incoherence of the beam of radiation is based on randomization of the phases; and

a detector configured to receive radiation scattered by the target and to generate a measurement signal based on the received radiation.

6. The system of claim 5 , further comprising a controller configured to control the phase modulators to control the randomization so as to adjust the amount of incoherence.

7. The system of claim 5 , wherein the phased array is configured to adjust the amount of incoherence without moving the optical elements.

8. The system of claim 5 , wherein the phased array further comprises a photonic integrated circuit.

9. The system of claim 5 , wherein each of the phase modulators comprises an electro-optic phase modulator.

10. The system of claim 5 , wherein each of the phase modulators comprises a thermo-optic modulator or a piezo-optic modulator.

11. The system of claim 5 , wherein the radiation source is configured to generate broadband wavelengths or two or more narrowband wavelengths.

12. The system of claim 11 , wherein:

the radiation source comprises source elements; and

each of the source elements is configured to generate a subset of the broadband wavelengths or the two or more narrowband wavelengths.

13. The system of claim 5 , further comprising a spectral filter configured to select a wavelength from the radiation source to enter the phased array, wherein the beam of radiation has the wavelength.

14. The system of claim 5 , wherein the phase modulators are further configured to adjust the phases at a frequency of approximately 100 kHz or greater.

15. The system of claim 5 , wherein the phase modulators are further configured to adjust the phases at a frequency of approximately 1 GHz or greater.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2023
From: SWILLAM, MOHAMED
To: ASML HOLDING N.V.
Reel/Frame 064354/0276 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2023
From: SETIJA, IRWAN DANI; DEN BOEF, ARIE JEFFREY; BEUKMAN, ARJAN JOHANNES ANTON
To: ASML NETHERLANDS B.V.
Reel/Frame 064356/0143 →
Continuity (2)
Provisional Application 62907049 · Sep 27, 2019
Related Publication 20220342228A1 · Oct 27, 2022
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Cited By (1)
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